Patents by Inventor Louie Que Hermosura

Louie Que Hermosura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Efficient method of retesting integrated circuits
    Patent number: 9684034
    Abstract: Efficient production testing of integrated circuits (ICs). A first production test is implemented on a group of ICs and failures among the test group are assessed. Specifically, the results of the first test are analyzed such that ICs having a recoverable fail and ICs having a non-recoverable fail are differentiated. The ICs are integrated based on the analyzed results and a second production test is implemented. The second production test tests the ICs responsive to the segregation, such that the second production test is limited only to ICs with a recoverable fail. The next succeeding production test will then use the new test program in the second production test with the handler bin designated as having ICs not to be re-tested.
    Type: Grant
    Filed: June 24, 2016
    Date of Patent: June 20, 2017
    Assignee: International Business Machines Corporation
    Inventors: Teck Seng Eng, Michael Russell Uy Gonzales, Louie Que Hermosura
  • Efficient method of retesting integrated circuits
    Patent number: 9625524
    Abstract: Efficient production testing of integrated circuits. A first production test is implemented on a group of integrated circuits and failures among the test group are assessed. Specifically, the results of the first test are analyzed such that integrated circuits having a recoverable fail and integrated circuits having a non-recoverable fail are differentiated. The integrated circuits are integrated based on the analyzed results and a second production test is implemented. The second production test tests the integrated circuits responsive to the segregation, such that the second production test is limited only to integrated circuits with a recoverable fail. The next succeeding production test will then use the new test program in the second production test with the handler bin designated as having integrated circuits not to be re-tested.
    Type: Grant
    Filed: August 27, 2015
    Date of Patent: April 18, 2017
    Assignee: International Business Machines Corporation
    Inventors: Teck Seng Eng, Michael Russell Uy Gonzales, Louie Que Hermosura
  • Efficient method of retesting integrated circuits
    Patent number: 9494650
    Abstract: Efficient production testing of integrated circuits. A first production test is implemented on a group of integrated circuits and failures among the test group are assessed. Specifically, the results of the first test are analyzed such that integrated circuits having a recoverable fail and integrated circuits having a non-recoverable fail are differentiated. The integrated circuits are integrated based on the analyzed results and a second production test is implemented. The second production test tests the integrated circuits responsive to the segregation, such that the second production test is limited only to integrated circuits with a recoverable fail. The next succeeding production test will then use the new test program in the second production test with the handler bin designated as having integrated circuits not to be re-tested.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: November 15, 2016
    Assignee: International Business Machines Corporation
    Inventors: Teck Seng Eng, Michael Russell Uy Gonzales, Louie Que Hermosura
  • EFFICIENT METHOD OF RETESTING INTEGRATED CIRCUITS
    Publication number: 20160320444
    Abstract: Efficient production testing of integrated circuits (ICs). A first production test is implemented on a group of ICs and failures among the test group are assessed. Specifically, the results of the first test are analyzed such that ICs having a recoverable fail and ICs having a non-recoverable fail are differentiated. The ICs are integrated based on the analyzed results and a second production test is implemented. The second production test tests the ICs responsive to the segregation, such that the second production test is limited only to ICs with a recoverable fail. The next succeeding production test will then use the new test program in the second production test with the handler bin designated as having ICs not to be re-tested.
    Type: Application
    Filed: June 24, 2016
    Publication date: November 3, 2016
    Applicant: International Business Machines Corporation
    Inventors: Teck Seng Eng, Michael Russell Uy Gonzales, Louie Que Hermosura
  • EFFICIENT METHOD OF RETESTING INTEGRATED CIRCUITS
    Publication number: 20150369862
    Abstract: Efficient production testing of integrated circuits. A first production test is implemented on a group of integrated circuits and failures among the test group are assessed. Specifically, the results of the first test are analyzed such that integrated circuits having a recoverable fail and integrated circuits having a non-recoverable fail are differentiated. The integrated circuits are integrated based on the analyzed results and a second production test is implemented. The second production test tests the integrated circuits responsive to the segregation, such that the second production test is limited only to integrated circuits with a recoverable fail. The next succeeding production test will then use the new test program in the second production test with the handler bin designated as having integrated circuits not to be re-tested.
    Type: Application
    Filed: August 27, 2015
    Publication date: December 24, 2015
    Applicant: International Business Machines Corporation
    Inventors: Teck Seng Eng, Michael Russell Uy Gonzales, Louie Que Hermosura