Patents by Inventor Louis St-Onge

Louis St-Onge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6873419
    Abstract: Laser ablation combined with spectrometric analysis is a good tool for determining the composition of heterogeneous materials. By measuring the depth of an ablation crater at a target of a heterogeneous material, it is possible to generate a compositional profile as a function of the depth. It is also possible to generate a 3 dimensional profile by depth profiling of a plurality of craters. The depth measurement is conducted in situ and in real time so that the evolution of composition as a function of the depth can be measured. An interferometric technique with a short coherence length light is one of the preferred embodiments for measuring the depth in situ and in real time.
    Type: Grant
    Filed: November 16, 2001
    Date of Patent: March 29, 2005
    Assignee: National Research Council of Canada
    Inventors: Vincent Detalle, Marc Dufour, Jean-Pierre Monchalin, Mohamad Sabsabi, Louis St-Onge
  • Patent number: 6661511
    Abstract: A sample of heterogeneous material is analyzed by directing a mixed-wavelength laser pulse at the sample to produce a plasma. The mixed wavelength pulse contains both shorter and longer wavelength components. The composition of the material is determined from the emission spectrum of the plasma.
    Type: Grant
    Filed: January 16, 2002
    Date of Patent: December 9, 2003
    Assignee: National Research Council of Canada
    Inventors: Vincent Detalle, Louis St-Onge, Mohamad Sabsabi
  • Publication number: 20030095266
    Abstract: Laser ablation combined with spectrometric analysis is a good tool for determining the composition of heterogeneous materials. By measuring the depth of an ablation crater at a target of a heterogeneous material, it is possible to generate a compositional profile as a function of the depth. It is also possible to generate a 3 dimensional profile by depth profiling of a plurality of craters. The depth measurement is conducted in situ and in real time so that the evolution of composition as a fucntion of the depth can be measured. An interferometric technique with a short coherence length light is one of the preferred embodiments for measuring the depth in situ and in real time.
    Type: Application
    Filed: November 16, 2001
    Publication date: May 22, 2003
    Inventors: Vincent Detalle, Marc Dufour, Jean-Pierre Monchalin, Mohamad Sabsabi, Louis St-Onge
  • Publication number: 20020093653
    Abstract: A sample of heterogeneous material is analyzed by directing a mixed-wavelength laser pulse at the sample to produce a plasma. The mixed wavelength pulse contains both shorter and longer wavelength components. The composition of the material is determined from the emission spectrum of the plasma.
    Type: Application
    Filed: January 16, 2002
    Publication date: July 18, 2002
    Inventors: Vincent Detalle, Louis St-Onge, Mohamad Sabsabi
  • Patent number: 6008897
    Abstract: A method and apparatus is disclosed for enhanced laser-induced plasma spectroscopic analysis of unknown heterogeneous materials. The apparatus has high power pulsed lasers with their beams focused on the material, typically two colinear lasers providing two pulses in the ultraviolet and in the near infrared spectral area. The first laser pulse vaporizes a small volume at the surface of the material and produces a plasma which is subsequently enhanced by the second laser pulse. The optical emission of the plasma is analyzed with a colinear optical spectrometer. The pulsed spectrum is detected by a gated photodiode array detector or by an array of photomultipliers each individually positioned to detect a line emission representative of a given element present in the material. The combination of the two laser pulses, appropriately synchronized, provides a plasma emission that is significantly stronger than a single laser pulse of the combined energy of the two pulses.
    Type: Grant
    Filed: January 19, 1999
    Date of Patent: December 28, 1999
    Assignee: National Research Council of Canada
    Inventors: Mohamad Sabsabi, Paolo Cielo, Louis St-Onge
  • Patent number: 5106478
    Abstract: An improved electrode cleaning system for an electrochemical sensor is disclosed. The improved electrode cleaning system includes a flexible wiper blade which is biased against a flat wiping surface formed by electrodes having a flat detection surface and a collar placed around the electrodes to prevent particulates from depositing between the electrodes. The collar is secured to the sensor by a recessed screw which also serves as a common electrical ground. The flexible blade preferably has two wiping portions for alternately wiping the electrodes and the common ground screw.
    Type: Grant
    Filed: December 6, 1990
    Date of Patent: April 21, 1992
    Inventors: Wolf Musow, Norman D. Gilmartin, Steve Pedro, Louis St. Onge