Patents by Inventor Ludan YANG

Ludan YANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Addressable test chip test system
    Patent number: 11959964
    Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.
    Type: Grant
    Filed: June 2, 2023
    Date of Patent: April 16, 2024
    Assignee: SEMITRONIX CORPORATION
    Inventors: Jiabai Cheng, Wei Chen, Ludan Yang, Fan Lan
  • ADDRESSABLE TEST CHIP TEST SYSTEM
    Publication number: 20230324458
    Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.
    Type: Application
    Filed: June 2, 2023
    Publication date: October 12, 2023
    Applicant: SEMITRONIX CORPORATION
    Inventors: Jiabai CHENG, Wei CHEN, Ludan YANG, Fan LAN