Patents by Inventor Ludovic Lay
Ludovic Lay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11789931Abstract: Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.Type: GrantFiled: April 26, 2022Date of Patent: October 17, 2023Assignee: Palantir Technologies Inc.Inventors: Jason Ma, Allen Cai, Andrew Cooper, Arnaud Drizard, Benjamin Lee, Damien Cramard, Damian Rusak, Hind Kraytem, Jan Matas, Ludovic Lay, Myles Scolnick, Radu-Andrei Szasz, Stefan Negrus, Taylor Cathcart, Zhixian Shen
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Patent number: 11755454Abstract: Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects.Type: GrantFiled: May 24, 2022Date of Patent: September 12, 2023Assignee: Palantir Technologies Inc.Inventors: Arnaud Drizard, Christopher McFarland, Hind Kraytem, Jean Caillé, Ludovic Lay
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Patent number: 11645250Abstract: Data stored in large scale systems often includes significant amounts of data and metadata. The data and metadata provide valuable structures for efficient data organization and analysis. However, when the data or metadata is missing, the missing data or metadata can cause disruption in organization and analysis efforts. A system with interactive user interfaces for enrichment of missing data or metadata is described. The system provides various dynamic filters to detect and identify data items with missing data or metadata. The system also provides for intuitive and efficient navigation of data items for determination of the missing data or metadata. Via its user interfaces, the system enables users to supply, or enrich, the missing data or metadata. Additionally, the user interfaces enable users to dynamically change available data or metadata values used for enrichment. Also, the system generates enriched output data sets, which may facilitate analysis of processes and systems.Type: GrantFiled: June 6, 2019Date of Patent: May 9, 2023Assignee: Palantir Technologies Inc.Inventors: Hind Kraytem, Arnaud Drizard, Ludovic Lay, Jean Caillé
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Publication number: 20220292010Abstract: Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects.Type: ApplicationFiled: May 24, 2022Publication date: September 15, 2022Inventors: Arnaud Drizard, Christopher McFarland, Hind Kraytem, Jean Caillé, Ludovic Lay
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Publication number: 20220253431Abstract: Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.Type: ApplicationFiled: April 26, 2022Publication date: August 11, 2022Inventors: Jason Ma, Allen Cai, Andrew Cooper, Arnaud Drizard, Benjamin Lee, Damien Cramard, Damian Rusak, Hind Kraytem, Jan Matas, Ludovic Lay, Myles Scolnick, Radu-Andrei Szasz, Stefan Negrus, Taylor Cathcart, Zhixian Shen
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Patent number: 11341027Abstract: Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects.Type: GrantFiled: January 17, 2019Date of Patent: May 24, 2022Assignee: Palantir Technologies Inc.Inventors: Arnaud Drizard, Christopher McFarland, Hind Kraytem, Jean Caillé, Ludovic Lay
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Patent number: 11314721Abstract: Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.Type: GrantFiled: March 22, 2018Date of Patent: April 26, 2022Assignee: Palantir Technologies Inc.Inventors: Jason Ma, Allen Cai, Andrew Cooper, Arnaud Drizard, Benjamin Lee, Damien Cramard, Damian Rusak, Hind Kraytem, Jan Matas, Ludovic Lay, Myles Scolnick, Radu-Andrei Szasz, Stefan Negrus, Taylor Cathcart, Zhixian Shen
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Publication number: 20190286646Abstract: Data stored in large scale systems often includes significant amounts of data and metadata. The data and metadata provide valuable structures for efficient data organization and analysis. However, when the data or metadata is missing, the missing data or metadata can cause disruption in organization and analysis efforts. A system with interactive user interfaces for enrichment of missing data or metadata is described. The system provides various dynamic filters to detect and identify data items with missing data or metadata. The system also provides for intuitive and efficient navigation of data items for determination of the missing data or metadata. Via its user interfaces, the system enables users to supply, or enrich, the missing data or metadata. Additionally, the user interfaces enable users to dynamically change available data or metadata values used for enrichment. Also, the system generates enriched output data sets, which may facilitate analysis of processes and systems.Type: ApplicationFiled: June 6, 2019Publication date: September 19, 2019Inventors: Hind Kraytem, Arnaud Drizard, Ludovic Lay, Jean Caillé
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Patent number: 10360252Abstract: Data stored in large scale systems often includes significant amounts of data and metadata. The data and metadata provide valuable structures for efficient data organization and analysis. However, when the data or metadata is missing, the missing data or metadata can cause disruption in organization and analysis efforts. A system with interactive user interfaces for enrichment of missing data or metadata is described. The system provides various dynamic filters to detect and identify data items with missing data or metadata. The system also provides for intuitive and efficient navigation of data items for determination of the missing data or metadata. Via its user interfaces, the system enables users to supply, or enrich, the missing data or metadata. Additionally, the user interfaces enable users to dynamically change available data or metadata values used for enrichment. Also, the system generates enriched output data sets, which may facilitate analysis of processes and systems.Type: GrantFiled: March 2, 2018Date of Patent: July 23, 2019Assignee: PALANTIR TECHNOLOGIES INC.Inventors: Hind Kraytem, Arnaud Drizard, Ludovic Lay, Jean Caillé