Patents by Inventor Lugi Tallone

Lugi Tallone has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of and device for measuring the refractive index of wafers of vitreous material
    Patent number: 5659393
    Abstract: A light beam is sent onto a wafer, at different angles of incidence, thus giving rise to fluctuations in the transmittance of the wafer, as the angle of incidence varies, because of interference due to multiple reflections of the beam inside the wafer. The transmittance of the wafer is measured as the angle of incidence varies. The angular positions of transmittance maxima and minima are determined with respect to a maximum or minimum corresponding to normal incidence. The refractive index is obtained from these positions and from the number of maxima and minima in the different angles.
    Type: Grant
    Filed: March 6, 1996
    Date of Patent: August 19, 1997
    Assignee: Cselt- Centro Studi E Laboratori Telecomunicazioni S.p.A.
    Inventor: Lugi Tallone