Abstract: A power semiconductor device includes a wide-bandgap semiconductor layer having an active region and a termination region that laterally surrounds the active region. The wide-bandgap semiconductor layer has a first recess that is recessed from the first main side in the termination region and surrounds the active region and a second recess that is recessed from the first main side in the active region and is filled with an insulating material. A depth of the second recess is the same as a depth of the first recess. A field plate on the first main side of the wide-bandgap semiconductor layer exposes a first portion of the wide-bandgap semiconductor layer in the termination region.

Abstract: In one embodiment, the power field-effect transistor (1) comprises: at least two source regions (21) at a top side (20) of a semiconductor body (2), a drain region (22) at a back side (23) of the semiconductor body (2), at least two charge barrier regions (24) in the semiconductor body (2) so that electrically between each one of the source regions (21) and the drain region (22) there is one of the charge barrier regions (24), and a gate electrode (3) located in a trench (4) in the semiconductor body (2), and the charge barrier regions (24) are located adjacent to the trench (4), wherein, next to the trench (4) and seen in a first plane (A) perpendicular with the top side (21) and a main elongation direction (L) of the trench (4), the top side (21) is formed only by the source regions (21).

Abstract: A silicon carbide power device, e.g., a vertical power MOSFET or an IGBT, includes a silicon carbide wafer. A first stressor and a second stressor are arranged in the silicon carbide wafer at a first main side. A first channel region, a first portion of a drift layer and a second channel region are laterally arranged between the first stressor and the second stressor in a second lateral direction parallel to the first main side and perpendicular to the first lateral direction. A stress can be introduced by the first stressor and the second stressor in the first channel region and in the second channel region.

Abstract: A silicon carbide power device, e.g., a vertical power MOSFET or an IGBT, includes a silicon carbide wafer. A first stressor and a second stressor are arranged in the silicon carbide wafer at a first main side. A first channel region, a first portion of a drift layer and a second channel region are laterally arranged between the first stressor and the second stressor in a second lateral direction parallel to the first main side and perpendicular to the first lateral direction. A stress can be introduced by the first stressor and the second stressor in the first channel region and in the second channel region.

Abstract: A power semiconductor device includes a wide-bandgap semiconductor layer having an active region and a termination region that laterally surrounds the active region. The wide-bandgap semiconductor layer has a first recess that is recessed from the first main side in the termination region and surrounds the active region and a second recess that is recessed from the first main side in the active region and is filled with an insulating material. A depth of the second recess is the same as a depth of the first recess. A field plate on the first main side of the wide-bandgap semiconductor layer exposes a first portion of the wide-bandgap semiconductor layer in the termination region.

Abstract: Conventionally, CdTe solar cells are grown in superstrate configuration where the light enters the photovoltaic device through a transparent substrate. Still, efficiencies of CdTe solar cells grown in substrate configuration have so far been considerably lower than those grown in superstrate configuration. This invention discloses a photovoltaic device (0) in substrate configuration and a process of making thereof with which efficiencies approaching those of superstrate devices can be reproducibly achieved. Furthermore, long term stability is expected to be better than in state of the art devices. This method is advantageous because the growth in substrate configuration offers several advantages like the growth on metal foils and a more precise control of the junction.