Patents by Inventor Maciej P. Zerkowski

Maciej P. Zerkowski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9240043
    Abstract: A method is described for the reproducible quantification of biomarker expression, including biomarker expression in a tissue sample. Methods and systems are described whereby reproducible scores for biomarker expression are obtained independent of instrument, its location, or operator.
    Type: Grant
    Filed: September 15, 2009
    Date of Patent: January 19, 2016
    Assignee: NOVARTIS AG
    Inventors: Jason Christiansen, Robert Pinard, Mark Gustavson, Brian Bourke, Gregory R. Tedeschi, Dylan M. Reilly, Maciej P. Zerkowski, Christine Williams, Dongxiao Wang
  • Patent number: 9080978
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Grant
    Filed: April 22, 2013
    Date of Patent: July 14, 2015
    Assignee: Novartis AG
    Inventors: Jason Christiansen, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Patent number: 8427635
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Grant
    Filed: January 27, 2012
    Date of Patent: April 23, 2013
    Assignee: HistoRx, Inc.
    Inventors: Jason Christiansen, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Patent number: 8314931
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Grant
    Filed: August 12, 2011
    Date of Patent: November 20, 2012
    Assignee: HistoRx, Inc.
    Inventors: Jason Christiansen, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Publication number: 20120133930
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Application
    Filed: January 27, 2012
    Publication date: May 31, 2012
    Inventors: Jason CHRISTIANSEN, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Patent number: 8120768
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Grant
    Filed: January 20, 2011
    Date of Patent: February 21, 2012
    Assignee: HistoRx, Inc.
    Inventors: Jason Christiansen, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Publication number: 20110299070
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Application
    Filed: August 12, 2011
    Publication date: December 8, 2011
    Inventors: Jason CHRISTIANSEN, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Patent number: 8027030
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Grant
    Filed: January 24, 2011
    Date of Patent: September 27, 2011
    Assignee: HistoRx, Inc.
    Inventors: Jason Christiansen, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Publication number: 20110116087
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Application
    Filed: January 24, 2011
    Publication date: May 19, 2011
    Inventors: Jason CHRISTIANSEN, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Publication number: 20110116086
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Application
    Filed: January 20, 2011
    Publication date: May 19, 2011
    Inventors: Jason CHRISTIANSEN, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Patent number: 7907271
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Grant
    Filed: June 13, 2008
    Date of Patent: March 15, 2011
    Assignee: HistoRx, Inc.
    Inventors: Jason Christiansen, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
  • Publication number: 20100136549
    Abstract: A method is described for the reproducible quantification of biomarker expression, including biomarker expression in a tissue sample. Methods and systems are described whereby reproducible scores for biomarker expression are obtained independent of instrument, its location, or operator.
    Type: Application
    Filed: September 15, 2009
    Publication date: June 3, 2010
    Inventors: Jason Christiansen, Robert Pinard, Mark Gustavson, Brian Bourke, Gregory R. Tedeschi, Dylan M. Reilly, Maciej P. Zerkowski, Christine (Jones) Williams, Dongxiao Wang
  • Publication number: 20080309929
    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
    Type: Application
    Filed: June 13, 2008
    Publication date: December 18, 2008
    Inventors: Jason Christiansen, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi