Abstract: A test fixture is provided for testing the resistance associated with contamination material on the surface of electrical contacts mounted to a printed circuit board. A probe used to engage the contacts consists of first and second conductive probe segments which form a sandwich about a layer of insulating material. A current source provides a constant alternating current which is applied across the first and second probe segments. Circuitry is provided for amplifying the alternating current voltage developed across the first and second probe segments in response to the constant current. Circuitry is provided for rectifying the amplified alternating current voltage to provide a direct current voltage which is proportional to the measured resistance of the contact engaged by the probe. Data corresponding to the bulk and contact resistance associated with the clean contact is stored in memory of a computer.

Abstract: A test fixture is provided for testing the resistance associated contamination material on the surface of electrical contacts mounted to a printed circuit board. An elongated probe is provided which has an axis perpendicular to X and Y planes. A mechanism is provided for maintaining the probe in a precise perpendicular orientation to the X and Y planes while permitting movement of the probe along its axis in the Z plane to engage an aligned contact. A predetermined bias force is exerted by the probe along its axis while engaging the contact to be tested.

Abstract: A test fixture is provided for testing electrical characteristics associated with a printed circuit board (PCB). Spaced-apart solenoids each have an extendible arm aligned along an axis defined by a connector assembly on the PCB to be tested. The arms are located to have sufficient travel to engage the side of the connector assembly. A mechanism is provided which detects which of the arms engage the connector assembly. Arm engagement data is stored in memory of a PC for type of connector assembly to be tested by the apparatus. A mechanism is provided for determining if a correct test program has been selected by a user for testing a particular connector assembly based on whether the arm engagement data matches the arms that engage the connector assembly.