Abstract: Methods and systems for testing a display having an array of microdrivers arranged in multiple of rows and columns including setting a testing mode of a microdriver of the array of microdrivers using multiple pins of the microdriver that are used in scanning or operation modes of the microdriver. The microdriver is configured to light one or more connected micro light emitting diode pixels coupled to the microdriver during the testing mode. Testing also includes operating the microdriver in the testing mode and determining functionality of the one or more connected micro light emitting diode pixels or the microdriver based on the testing mode.

Abstract: The present techniques are capable of identifying and pinpointing defective microdrivers and/or row/column drivers either before or after any ?LEDs have been placed on the display. Using the architectures described herein, test data may be delivered in a parallel fashion to the drivers from support circuitry, such as a timing controller and/or a main board, and outputs based on the test data may be similarly delivered back to the support circuitry do determine which drivers are defective. This yields access to the output of every microdriver and row drier, thus enabling the identification of specific defective elements.

Abstract: A low temperature method and system configuration for depositing a doped silicon layer on a silicon substrate of a selected grade. The silicon substrate for functioning as a light absorber and the doped silicon layer for functioning as an emitter.