Patents by Inventor Mahmoud Shahram

Mahmoud Shahram has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for facilitating variation-aware parasitic extraction
    Patent number: 7587691
    Abstract: One embodiment of the present invention provides a system for determining an electrical property for an interconnect layer. During operation, the system receives interconnect technology data which includes nominal parameter values for a first interconnect layer, and parameter-variation values which represent variations in the nominal parameter values due to random process variations. Next, the system receives an interconnect template which describes the geometry of a portion of a second interconnect layer. The system then determines electrical property data for the interconnect template using the interconnect technology data. The electrical property data can include a nominal electrical property value, and sensitivity values which represent the sensitivities of the nominal electrical property value to variations in the nominal parameter values. Next, the system stores the electrical property data and the interconnect technology data in a storage.
    Type: Grant
    Filed: November 14, 2006
    Date of Patent: September 8, 2009
    Assignee: Synopsys, Inc.
    Inventors: Edhi Sutjahjo, Kishore Singhal, Byungwook Kim, Goetz Leonhardt, Beifang Qiu, Sergey Krasnovsky, Baribrata Biswas, Alex Gyure, Mahmoud Shahram
  • Method and apparatus for detecting and analyzing the propagation of noise through an integrated circuit
    Patent number: 7263676
    Abstract: One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.
    Type: Grant
    Filed: April 9, 2003
    Date of Patent: August 28, 2007
    Assignee: Synopsys, Inc.
    Inventors: Alexander Gyure, Jindrich Zejda, Peivand Fallah-Tehrani, Wenyuan Wang, Chi-Chong Lo, Seyed Alireza Kasnavi, Mahmoud Shahram, Yansheng Luo, William Chiu-Ting Shu
  • Method and apparatus for facilitating variation-aware parasitic extraction
    Publication number: 20070124707
    Abstract: One embodiment of the present invention provides a system for determining an electrical property for an interconnect layer. During operation, the system receives interconnect technology data which includes nominal parameter values for a first interconnect layer, and parameter-variation values which represent variations in the nominal parameter values due to random process variations. Next, the system receives an interconnect template which describes the geometry of a portion of a second interconnect layer. The system then determines electrical property data for the interconnect template using the interconnect technology data. The electrical property data can include a nominal electrical property value, and sensitivity values which represent the sensitivities of the nominal electrical property value to variations in the nominal parameter values. Next, the system stores the electrical property data and the interconnect technology data in a storage.
    Type: Application
    Filed: November 14, 2006
    Publication date: May 31, 2007
    Inventors: Edhi Sutjahjo, Kishorc Singhal, Byungwook Kim, Goetz Leonhardt, Beifang Qiu, Sergey Krasnovsky, Baribrata Biswas, Alex Gyure, Mahmoud Shahram
  • Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit
    Patent number: 7007252
    Abstract: One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.
    Type: Grant
    Filed: April 9, 2003
    Date of Patent: February 28, 2006
    Assignee: Synopsys, Inc.
    Inventors: Alexander Gyure, Jindrich Zejda, Peivand Fallah-Tehrani, Wenyuan Wang, Chi-Chong Lo, Mahmoud Shahram, Yansheng Luo, William Chiu-Ting Shu, Seyed Alireza Kasnavi
  • Method and apparatus for detecting and analyzing the propagation of noise through an integrated circuit
    Publication number: 20040205682
    Abstract: One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.
    Type: Application
    Filed: April 9, 2003
    Publication date: October 14, 2004
    Inventors: Alexander Gyure, Jindrich Zejda, Peivand Fallah-Tehrani, Wenyuan Wang, Chi-Chong Lo, Seyed Alireza Kasnavi, Mahmoud Shahram, Yansheng Luo, William Chiu-Ting Shu
  • Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit
    Publication number: 20040205680
    Abstract: One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.
    Type: Application
    Filed: April 9, 2003
    Publication date: October 14, 2004
    Applicant: Entire Interest
    Inventors: Alexander Gyure, Jindrich Zejda, Peivand Fallah-Tehrani, Wenyuan Wang, Chi-Chong Lo, Mahmoud Shahram, Yansheng Luo, William Chiu-Ting Shu, SEYED ALIREZA KASNAVI