Patents by Inventor Makio Tokunaga

Makio Tokunaga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Specimen temperature adjusting apparatus
    Patent number: 7233438
    Abstract: A specimen temperature adjusting apparatus includes a specimen stage that the observation specimen is to be placed on and a temperature adjustment element that is attached to the specimen stage. The specimen stage has a groove surrounding a portion where the observation specimen is to be placed. The temperature adjustment element is located in the groove of the specimen stage.
    Type: Grant
    Filed: December 27, 2005
    Date of Patent: June 19, 2007
    Assignees: Research Organization of Information & Systems, Olympus Corporation
    Inventors: Makio Tokunaga, Yoshihiro Ue, Motohiko Suzuki
  • Microscope apparatus having an objective displacement detection system
    Patent number: 7130116
    Abstract: The microscope apparatus has an objective lens, a sample base on which an observation sample is placed, a sensor target mounted on the tip portion of the objective lens, and a non-contact sensor mounted on the sample base. The non-contact sensor detects the distance to the sensor target. The microscope further has a motor that moves the objective lens along the optical axis and the controller that controls the motor to keep the relative distance between the tip portion of the objective lens 5 and the sample base constant while the control switch is ON.
    Type: Grant
    Filed: May 13, 2005
    Date of Patent: October 31, 2006
    Assignees: Research Organization of Information and Systems, Olympus Corporation
    Inventors: Makio Tokunaga, Yoshihiro Ue
  • Specimen temperature adjusting apparatus
    Publication number: 20060102850
    Abstract: A specimen temperature adjusting apparatus includes a specimen stage that the observation specimen is to be placed on and a temperature adjustment element that is attached to the specimen stage. The specimen stage has a groove surrounding a portion where the observation specimen is to be placed. The temperature adjustment element is located in the groove of the specimen stage.
    Type: Application
    Filed: December 27, 2005
    Publication date: May 18, 2006
    Applicants: Research Organization of Information and Systems, Olympus Corporation
    Inventors: Makio Tokunaga, Yoshihiro Ue, Motohiko Suzuki
  • Microscope apparatus
    Publication number: 20050207004
    Abstract: The microscope apparatus has an objective lens, a sample base on which an observation sample is placed, a sensor target mounted on the tip portion of the objective lens, and a non-contact sensor mounted on the sample base. The non-contact sensor detects the distance to the sensor target. The microscope further has a motor that moves the objective lens along the optical axis and the controller that controls the motor to keep the relative distance between the tip portion of the objective lens 5 and the sample base constant while the control switch is ON.
    Type: Application
    Filed: May 13, 2005
    Publication date: September 22, 2005
    Applicants: Research Organization of Information and Systems, Olympus Corporation
    Inventors: Makio Tokunaga, Yoshihiro Ue