Patents by Inventor Makoto Okawauchi
Makoto Okawauchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8169608Abstract: An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.Type: GrantFiled: November 29, 2011Date of Patent: May 1, 2012Assignee: Otsuka Electronics Co., Ltd.Inventors: Hiroyuki Sano, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
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Patent number: 8169607Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.Type: GrantFiled: October 4, 2009Date of Patent: May 1, 2012Assignee: Otsuka Electronics Co., Ltd.Inventors: Hiroyuki Sano, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
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Publication number: 20120075628Abstract: An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.Type: ApplicationFiled: November 29, 2011Publication date: March 29, 2012Applicant: Otsuka Electronics Co., Ltd.Inventors: Hiroyuki SANO, Makoto OKAWAUCHI, Kosei OSHIMA, Kazuaki OHKUBO, Tsutomu MIZUGUCHI, Shiro SHIMA
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Publication number: 20100091280Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.Type: ApplicationFiled: October 4, 2009Publication date: April 15, 2010Applicant: Otsuka Electronics Co., Ltd.Inventors: Hiroyuki SANO, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
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Patent number: 7528967Abstract: A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for focusing on the object to be measured and checking a position of measurement. The observation light is selected such that the observation light includes a component that can be reflected from the object to be measured. The measurement light and the observation light are thus applied independently to the object to be measured, through a common objective lens, and accordingly improvement of the precision in measurement of the optical characteristic and facilitation of focusing on the object to be measured are achieved simultaneously.Type: GrantFiled: May 15, 2008Date of Patent: May 5, 2009Assignee: Otsuka Electronics Co., Ltd.Inventors: Makoto Okawauchi, Tsutomu Mizuguchi, Shiro Kawaguchi
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Publication number: 20080285026Abstract: A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for focusing on the object to be measured and checking a position of measurement. The observation light is selected such that the observation light includes a component that can be reflected from the object to be measured. The measurement light and the observation light are thus applied independently to the object to be measured, through a common objective lens, and accordingly improvement of the precision in measurement of the optical characteristic and facilitation of focusing on the object to be measured are achieved simultaneously.Type: ApplicationFiled: May 15, 2008Publication date: November 20, 2008Applicant: Otsuka Electronics Co., Ltd.Inventors: Makoto OKAWAUCHI, Tsutomu Mizuguchi, Shiro Kawaguchi
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Patent number: 6879395Abstract: In a spectrum measuring instrument of the present invention, a detecting surface of a detector is a two-dimensional detecting surface and spectrum light coming out from a dispersing element and is irradiated to a region A on the detecting surface. Signal intensity at the regions on the detecting surface other than the region A where the spectrum light is irradiated, is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed.Type: GrantFiled: June 19, 2001Date of Patent: April 12, 2005Assignee: Otsuka Electronics Co., Ltd.Inventors: Kouichi Oka, Makoto Okawauchi
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Publication number: 20030107733Abstract: In a spectrum measuring instrument of the present invention, a detecting surface (13a) of a detector (13) is a two-dimensional detecting surface and spectrum light coming out from a spectroscope is irradiated to a region A on the detecting surface (13a). Signal intensity at the regions on the detecting surface (13a) other than the region A where the spectrum light is irradiated is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed (FIG. 4).Type: ApplicationFiled: December 23, 2002Publication date: June 12, 2003Inventors: Kouichi Oka, Makoto Okawauchi
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Patent number: 5183045Abstract: There is carried out an NMR measurement in which a receiver coil (7) for receiving an NMR free induction signal comes in contact with or in close vicinity to one side of tissue of a living body (1) immersed in a perfusion solution (4), while a portion or whole body of the receiver coil (7) is so held as not to come in contact with the perfusion solution (4). According to this measuring method, since a portion or whole body of the receiver coil (7) does not come in contact with the perfusion solution (4), the receiver coil (7) is hardly subject to the electromagnetic influence of changes in the perfusion solution (4). This prevents the free induction signal from being embedded in noise, assuring measurement with high sensitivity. Even for a large-size internal organ, only a signal from an area presenting a uniform magnetic field may be acquired, since the measurement is carried out with the receiver coil (7) coming in contact with or in close vicinity to one side of the internal organ.Type: GrantFiled: April 16, 1990Date of Patent: February 2, 1993Assignee: Otsuka Electronic Co., Ltd.Inventors: Susumu Takamura, Takashi Nakamura, Makoto Okawauchi, Harumi Toda, Ichiro Kanki, Minoru Yoshida, Toshiyuki Imoto, Naomi Negayama, Koichi Oka