Abstract: A method includes passing a lot through a production process and evaluating a statistical quality of the production process. Additionally, the method includes calculating an advanced process control (APC) recipe parameter adjustment (RPA) distribution value and determining if sampling is indicated. Furthermore, the method includes, if sampling is indicated, performing a measurement process of the lot.

Abstract: A method of sampling semiconductor wafers includes passing a lot of semiconductor wafers into a semiconductor processing tool, processing a first portion of the lot in one process chamber of the semiconductor processing tool and a second portion of the lot in another process chamber of the semiconductor processing tool to produce processed semiconductor wafers, and initiating a wafer sampling engine to select at least one of the processed semiconductor wafers for sampling. The wafer sampling engine computes a long term process capability index for the processing tool and a short term process performance index for at least one of the processing tool and process chamber, identifies at least one desired sampling measurement type, selects the at least one of the processed semiconductor wafers for sampling, and collects the desired measurement types from the at least one of the processed semiconductor wafers selected for sampling.

Abstract: A method includes passing a lot through a production process and evaluating a statistical quality of the production process. Additionally, the method includes calculating an advanced process control (APC) recipe parameter adjustment (RPA) distribution value and determining if sampling is indicated. Furthermore, the method includes, if sampling is indicated, performing a measurement process of the lot.

Abstract: A method of performing measurement sampling in a production process includes passing a lot through a manufacturing process, employing a set of combinational logistics to determine if sampling is indicated and, if sampling is indicated, establishing a sampling decision. The method further requires querying a set of lot sampling rules to evaluate the sampling decision, evaluating a statistical quality of the process if no lot sampling rules exist, and automatically determining whether the lot passing through the production process requires sampling based on the combinational logistics, statistical quality and lot sampling rules.

Abstract: Methods, systems, and media for masquerade attack detection by monitoring computer user behavior are provided. In accordance with some embodiments, a method for detecting masquerade attacks is provided, the method comprising: monitoring a first plurality of user actions and access of decoy information in a computing environment; generating a user intent model for a category that includes at least one of the first plurality of user actions; monitoring a second plurality of user actions; comparing the second plurality of user actions with the user intent model by determining deviation from the generated user intent model; identifying whether the second plurality of user actions is a masquerade attack based at least in part on the comparison; and generating an alert in response to identifying that the second plurality of user actions is the masquerade attack and in response to determining that the second plurality of user actions includes accessing the decoy information in the computing environment.

Abstract: Methods, systems, and media for providing trap-based defenses are provided. In accordance with some embodiments, a method for providing trap-based defenses is provided, the method comprising: generating decoy information based at least in part on actual information in a computing environment, wherein the decoy information is generated to comply with one or more document properties; embedding a beacon into the decoy information; and inserting the decoy information with the embedded beacon into the computing environment, wherein the embedded beacon provides a first indication that the decoy information has been accessed by an attacker and wherein the embedded beacon provides a second indication that differentiates between the decoy information and the actual information.

Abstract: A method includes passing a lot through a production process and evaluating a statistical quality of the production process. Additionally, the method includes calculating an advanced process control (APC) recipe parameter adjustment (RPA) distribution value and determining if sampling is indicated. Furthermore, the method includes, if sampling is indicated, performing a measurement process of the lot.

Abstract: A method of performing measurement sampling in a production process includes passing a lot through a manufacturing process, employing a set of combinational logistics to determine if sampling is indicated and, if sampling is indicated, establishing a sampling decision. The method further requires querying a set of lot sampling rules to evaluate the sampling decision, evaluating a statistical quality of the process if no lot sampling rules exist, and automatically determining whether the lot passing through the production process requires sampling based on the combinational logistics, statistical quality and lot sampling rules.