Patents by Inventor Mamoru Sueyoshi

Mamoru Sueyoshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10032626
    Abstract: A semiconductor device manufacturing method includes: vertically arranging and storing a plurality of substrates in a processing container and forming a condition where at least an upper region or a lower region relative to a substrate disposing region where the plurality of substrates are arranged is blocked off by an adaptor; and while maintaining the condition, forming films on the plurality of substrates by performing a cycle including the following steps a predetermined number of times in a non-simultaneous manner: supplying source gas to the plurality of substrates in the processing container from the side of the substrate disposing region; discharging the source gas from the interior of the processing container via exhaust piping; supplying reaction gas to the plurality of substrates in the processing container from the side of the substrate disposing region; and discharging the reaction gas from the interior of the processing container via the exhaust piping.
    Type: Grant
    Filed: September 19, 2014
    Date of Patent: July 24, 2018
    Assignee: HITACHI KOKUSAI ELECTRIC INC.
    Inventors: Takaaki Noda, Shingo Nohara, Kosuke Takagi, Takeo Hanashima, Mamoru Sueyoshi, Kotaro Konno, Motoshi Sawada
  • Publication number: 20170287696
    Abstract: A semiconductor device manufacturing method includes: vertically arranging and storing a plurality of substrates in a processing container and forming a condition where at least an upper region or a lower region relative to a substrate disposing region where the plurality of substrates are arranged is blocked off by an adaptor; and while maintaining the condition, forming films on the plurality of substrates by performing a cycle including the following steps a predetermined number of times in a non-simultaneous manner: supplying source gas to the plurality of substrates in the processing container from the side of the substrate disposing region; discharging the source gas from the interior of the processing container via exhaust piping; supplying reaction gas to the plurality of substrates in the processing container from the side of the substrate disposing region; and discharging the reaction gas from the interior of the processing container via the exhaust piping.
    Type: Application
    Filed: September 19, 2014
    Publication date: October 5, 2017
    Applicant: Hitachi Kokusai Electric Inc.
    Inventors: Takaaki NODA, Shingo NOHARA, Kosuke TAKAGI, Takeo HANASHIMA, Mamoru SUEYOSHI, Kotaro KONNO, Motoshi SAWADA
  • Patent number: 7033937
    Abstract: An apparatus for use in manufacturing a semiconductor device allows one or more substrates treated substantially free of the metal particles released from the chamber wall and the high energy particles emitted from the plasma and also allows them to uniformly heated to a relatively high temperature. The apparatus comprises a reaction chamber wherein one or more substrates to be treated are disposed, a plasma source arranged outside of and in proximity to the reaction chamber, an active species supply port for providing active species generated by the plasma source to the reaction chamber and arranged at a side of the reaction chamber and an exhaust port provided at the opposite side to the active species supply port. The active species flows parallel to the surfaces of the substrates.
    Type: Grant
    Filed: January 14, 2003
    Date of Patent: April 25, 2006
    Assignee: Hitachi Kokusai Electric, Inc.
    Inventors: Kazuyuki Toyoda, Osamu Kasahara, Tsutomu Tanaka, Mamoru Sueyoshi, Nobuhito Shima, Masanori Sakai
  • Publication number: 20030124876
    Abstract: An apparatus for use in manufacturing a semiconductor device allows one or more substrates treated substantially free of the metal particles released from the chamber wall and the high energy particles emitted from the plasma and also allows them to uniformly heated to a relatively high temperature. The apparatus comprises a reaction chamber wherein one or more substrates to be treated are disposed, a plasma source arranged outside of and in proximity to the reaction chamber, an active species supply port for providing active species generated by the plasma source to the reaction chamber and arranged at a side of the reaction chamber and an exhaust port provided at the opposite side to the active species supply port. The active species flows parallel to the surfaces of the substrates.
    Type: Application
    Filed: January 14, 2003
    Publication date: July 3, 2003
    Inventors: Kazuyuki Toyoda, Osamu Kasahara, Tsutomu Tanaka, Mamoru Sueyoshi, Nobuhito Shima, Masanori Sakai
  • Patent number: 6576063
    Abstract: An apparatus for use in manufacturing a semiconductor device allows one or more substrates treated substantially free of the metal particles released from the chamber wall and the high energy particles emitted from the plasma and also allows them to uniformly heated to a relatively high temperature. The apparatus comprises a reaction chamber wherein one or more substrates to be treated are disposed, a plasma source arranged outside of and in proximity to the reaction chamber, an active species supply port for providing active species generated by the plasma source to the reaction chamber and arranged at a side of the reaction chamber and an exhaust port provided at the opposite side to the active species supply port. The active species flows parallel to the surfaces of the substrates.
    Type: Grant
    Filed: January 24, 2001
    Date of Patent: June 10, 2003
    Assignee: Hitachi Kokusai Electric, Inc.
    Inventors: Kazuyuki Toyoda, Osamu Kasahara, Tsutomu Tanaka, Mamoru Sueyoshi, Nobuhito Shima, Masanori Sakai
  • Publication number: 20010029112
    Abstract: An apparatus for use in manufacturing a semiconductor device allows one or more substrates treated substantially free of the metal particles released from the chamber wall and the high energy particles emitted from the plasma and also allows them to uniformly heated to a relatively high temperature. The apparatus comprises a reaction chamber wherein one or more substrates to be treated are disposed, a plasma source arranged outside of and in proximity to the reaction chamber, an active species supply port for providing active species generated by the plasma source to the reaction chamber and arranged at a side of the reaction chamber and an exhaust port provided at the opposite side to the active species supply port. The active species flows parallel to the surfaces of the substrates.
    Type: Application
    Filed: January 24, 2001
    Publication date: October 11, 2001
    Applicant: Hitachi Kokusai Electric Inc.
    Inventors: Kazuyuki Toyoda, Osamu Kasahara, Tsutomu Tanaka, Mamoru Sueyoshi, Nobuhito Shima, Masanori Sakai
  • Patent number: 6217663
    Abstract: A substrate processing apparatus comprises a hot-wall type processing chamber for processing a substrate, a heater capable of heating an interior of the processing chamber, a substrate holder capable of holding the substrate and processing the substrate in the processing chamber in a state where the substrate holder holds the substrate, and a mechanism, which is capable of allowing the substrate holder to hold the substrate and then transferring the substrate holder holding the substrate into the processing chamber, and/or which is capable of carrying out the substrate holder from the processing chamber in a state where the substrate holder holds the substrate, and then separating the substrate from the substrate holder.
    Type: Grant
    Filed: June 20, 1997
    Date of Patent: April 17, 2001
    Assignee: Kokusai Electric Co., Ltd.
    Inventors: Yasuhiro Inokuchi, Fumihide Ikeda, Michiko Nishiwaki, Masatoshi Takada, Mamoru Sueyoshi