Abstract: A method for adaptively providing parametric limits to identify defective die quantizes the die into a plurality of groups according to statistical distributions, such as intrinsic speed in one embodiment. For each quantization level, an intrinsic distribution of the parameter is derived. Adaptive screening limits are then set as a function of the intrinsic distribution. Dies are then screened according to their parametric values with respect to the adaptive limits.

Abstract: A method for determining an effective fatal defect count based on defects in a plurality of inspected integrated circuits includes acquiring defect information related to defects in the integrated circuits, and assigning defect weight values to each of the defects based on the defect information. The defect weight values are in N number of defect weight value ranges, including a lowest and a highest defect weight value range. For each integrated circuit, a heaviest defect is determined, where the heaviest defect is the defect on each integrated circuit having a highest defect weight value. For each of the N number of defect weight value ranges, a total number T(n) of the heaviest defects having a defect weight value within a defect weight value range n is determined, where n equals one to N.

Abstract: A computerized system for analyzing information associated with a process unit. A database contains historical information relating to previously compiled information. A secure input receives criteria from a restricted source. A computer mathematically determines a limit based upon the criteria. An open input receives the information associated with the process unit from multiple test locations. A compiler selectively adds to the database of historical information the information. The computer also selects at least a portion of the information based upon selection criteria. In addition, the computer manipulates the selected information based upon manipulation criteria. The manipulated information is compared against the limit. An output indicates a first disposition of the process unit when the manipulated information violates the limit. The output indicates a second disposition of the process unit when the manipulated information does not violate the limit.