Abstract: The present invention provides a method of digitally generating, via the use of a computer, data indicative of a synthesized appearance of a simulated material having physically plausible appearance attributes. The method includes determining a set of data indicative of the synthesized appearance of the simulated material based at least in part on data associated with the physically tangible source material and at least in part on data of measured attributes of the physically tangible reference material.

Abstract: The present invention provides a method of digitally generating, via the use of a computer, data indicative of a synthesized appearance of a simulated material having physically plausible appearance attributes. The method includes determining a set of data indicative of the synthesized appearance of the simulated material based at least in part on data associated with the physically tangible source material and at least in part on data of measured attributes of the physically tangible reference material.

Abstract: Apparatus, systems and methods are provided for simulating a material. In particular, the disclosed apparatus, systems and methods involve modeling deformation characteristics of a material and generating a virtual representation of a physical interaction with the material based on the modeled deformation characteristics of the material and data representative of the physical interaction.

Abstract: Apparatus, systems and methods are provided for simulating a material. In particular, the disclosed apparatus, systems and methods involve modeling deformation characteristics of a material and generating a virtual representation of a physical interaction with the material based on the modeled deformation characteristics of the material and data representative of the physical interaction.

Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions. A method of calculating xDNA, the vector sum of the observed reflectance intensity over a plurality of wavelengths and angles. Methods of using the calculated xDNA for formulating recipes for a surfaces colors.

Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions. A method of calculating xDNA, the vector sum of the observed reflectance intensity over a plurality of wavelengths and angles. Methods of using the calculated xDNA for formulating recipes for a surfaces colors.