Abstract: An apparatus system and method for an electronic component made with additive manufacturing processes and a foil substrate is provided. The electronic component may include one or more foil substrates and one or more elements. The elements may be produced by an additive manufacturing process. Moreover, the elements may be produced in the same plane or out of plain with one or more foil substrates. The elements may also be various structures, including, for example, connectors, electrical components (e.g., a resistor, a capacitor, a switch, and/or the like), and/or any other suitable electrical elements and/or structures.

Abstract: An illustrated example ionization device includes a pyroelectric electron accelerator that causes electrons to move away from the accelerator. A silicon target is positioned in a path of the electrons. X-ray radiation results from the electrons colliding with the target. In one example embodiment, the electrons moving between the accelerator and the target have energy up to 60 KeV and the target attenuates the energy so that the x-ray radiation has energy between 1 KeV and 3 KeV.

Abstract: An exemplary ionization window assembly includes a support layer having a thickness between a first side and a second side. There is at least one opening in the support layer extending between the first and second sides. The opening has a first width dimension near the first side of the support layer and a second, larger width dimension near the second side of the support layer. A window layer is supported on the second side of the support layer. The window layer extends across the opening to allow ionizing radiation to pass through the opening in a direction from the first side toward the second side.

Abstract: An example method of calibrating a detected intensity of gas components includes measuring an intensity of a reference gas, measuring an intensity of a calibration gas, and calibrating a measurement of an intensity of a test gas using at least a measurement of the intensity of the reference gas and at least a measurement of the intensity of the calibration gas.

Abstract: An example method of spectral calibration includes directing light from a light source though a gas, detecting an optical density of the light that has passed through the gas using a detector, and calibrating the detecting by adjusting an optical path length.

Abstract: An example method of detecting components of a gas includes detecting substantially all components of a gas using distinct infrared wavelengths within a portion of the infrared spectrum, the portion being less than the entire infrared spectrum.

Abstract: An exemplary detector includes a source of radiation. A detection chamber is configured to at least temporarily contain a fluid. At least some of the radiation ionizes at least some of the fluid. At least some of the radiation produces light in the detection chamber. An ionization sensor provides an output corresponding to an amount of fluid ionization in the detection chamber. A light sensor provides an output corresponding to an amount of the light detected by the light sensor.

Abstract: An exemplary ionization device includes a pyroelectric electron accelerator that causes electrons to move away from the accelerator. A silicon target is positioned in a path of the electrons. X-ray radiation results from the electrons colliding with the target.

Abstract: An exemplary ionization window assembly includes a support layer having a thickness between a first side and a second side. There is at least one opening in the support layer extending between the first and second sides. The opening has a first width dimension near the first side of the support layer and a second, larger width dimension near the second side of the support layer. A window layer is supported on the second side of the support layer. The window layer extends across the opening to allow ionizing radiation to pass through the opening in a direction from the first side toward the second side.