Abstract: A test device for measuring a phase noise of a test signal includes a delayer configured to delay the test signal to provide a delayed test signal, a first combiner, a second combiner, and a phase noise determinator. The first combiner is configured to combine a first signal with the delayed test signal to provide a first combiner output signal. The first signal is based on the test signal or a signal identical to the test signal. The second combiner is configured to combine a second signal with the delayed test signal, wherein the second signal is phase-shifted with respect to the first signal to provide a second combiner output signal. The second signal is based on the test signal. The phase noise determinator is configured to provide phase noise information that depends on the first combiner output signal and the second combiner output signal.

Abstract: Systems and methods for measuring a phase noise of a test signal. A test system includes a recursive delayer, a combiner and a phase noise determinator. The recursive delayer is configured to provide a recursively delayed signal on the basis of the test signal. The combiner is configured to combine a first signal with a second signal to provide a combiner output signal. The first signal is generated based on the test signal and the second signal is generated based on the recursively delayed signal. The phase noise determinator is used to determine phase noise information based on the combiner output signal.

Abstract: Embodiments of the invention provide an apparatus for measuring a phase noise of a test signal. The apparatus comprises a recursive delayer, a combiner and a phase noise determinator. The recursive delayer is configured to provide a delayed signal on the basis of the test signal. The combiner is configured to combine a first signal with a second signal to provide a combiner output signal. The first signal is based on the test signal or a signal identical to the test signal. The second signal is based on the delayed signal or a signal identical to the delayed signal. The phase noise determinator is configured to provide a phase noise information that depends on the combiner output signal.

Abstract: A test device for measuring a phase noise of a test signal includes a delayer configured to delay the test signal to provide a delayed test signal, a first combiner, a second combiner, and a phase noise determinator. The first combiner is configured to combine a first signal with the delayed test signal to provide a first combiner output signal. The first signal is based on the test signal or a signal identical to the test signal. The second combiner is configured to combine a second signal with the delayed test signal, wherein the second signal is phase-shifted with respect to the first signal to provide a second combiner output signal. The second signal is based on the test signal. The phase noise determinator is configured to provide phase noise information that depends on the first combiner output signal and the second combiner output signal.