Patents by Inventor Marco Tilgner

Marco Tilgner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6661839
    Abstract: There are provided methods each of which is for efficiently compressing a test pattern to be applied to an IC for testing. The number of data changes &phgr; and a data entropy H of a pattern for each pin of an IC are obtained and then the test pattern is divided and the divided patterns are distributed to a block for &phgr; that is equal to or less than a threshold value &phgr;M (&phgr;<&phgr;M), a block for &phgr;>&phgr;M and for H that is equal to or less than a threshold value HM (H<HM), and a block for H>HM (411). The block for &phgr;<&phgr;M is compressed by a run length compressing method, the block for &phgr;>&phgr;M and H<HM is compressed by the run length compressing method after application of Burrows wheeler transform, and the block for H>HM is compressed by an LZ compressing method.
    Type: Grant
    Filed: November 20, 1998
    Date of Patent: December 9, 2003
    Assignee: Advantest Corporation
    Inventors: Masahiro Ishida, Takahiro Yamaguchi, Marco Tilgner