Patents by Inventor Marcus Dyba

Marcus Dyba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120236398
    Abstract: The aim of the invention is an optical device for a scanning microscope, said device enabling the focusing of a light beam largely independent of wavelengths; and thus high-resolution microscopy, in particular STED microscopy, in a wider wavelength spectrum is facilitated. At least two phase filters lie on a support. Advantageously, the support is a filter wheel or a filter slider which can be introduced into the beam path of the light beam, said beam path preferably being the beam path of the stimulating light beam in an STED microscope. Several phase filters preferablylie on the support in the shape of a matrix. The support is designed as a glass substrate on which each phase filter is applied. To achieve said aim, another position is additionally found on the support for adjustment purposes, wherein the wavefront of the light is not influenced when it passes through said position, that is, the position is an empty position on which no phase filter is found.
    Type: Application
    Filed: June 1, 2012
    Publication date: September 20, 2012
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Hilmar GUGEL, Arnold GISKE, Marcus DYBA, Roland SEIFERT, Bernd WIDZGOWSKI
  • Patent number: 7999935
    Abstract: The invention proposes a method for imaging at least one microscopic property of a sample and an apparatus with which the proposed method can be carried out. In the method, at least one coherent illumination light with at least one illumination wavelength is produced by means of at least one light source. The illumination light is imaged onto at least one region on or within the sample. Detection light emitted by the sample is split at least partially into incoherent detection light and into coherent detection light by means of at least on physically separating beam splitter. The coherent detection light is at least partially separated from the coherent illumination light by at least one beam-splitter element. The coherent detection light is detected. The proposed method can be used in particular for investigating the sample by means of coherent anti-Stokes-Raman scattering.
    Type: Grant
    Filed: August 31, 2007
    Date of Patent: August 16, 2011
    Assignee: Leica Microsystems CMS GmbH
    Inventor: Marcus Dyba
  • Patent number: 7903247
    Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.
    Type: Grant
    Filed: August 19, 2009
    Date of Patent: March 8, 2011
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Marcus Dyba, Hilmar Gugel
  • Patent number: 7830506
    Abstract: A method for high spatial resolution examination of a sample, the sample to be examined including a substance that can be repeatedly converted from a first state into a second state, the first and the second states differing from one another in at least one optical property. The method includes: a) bringing the substance into the first state by means of a switching signal in a sample region to be recorded, b)inducing the second state by means of an optical signal, spatially delimited subregions being specifically excluded within the sample region to be recorded, c) reading out the remaining first states, and d) steps a) to c) are repeated, the optical signal being displaced upon each repetition in order to scan the sample, wherein the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.
    Type: Grant
    Filed: January 16, 2007
    Date of Patent: November 9, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Hilmar Gugel, Marcus Dyba, Volker Seyfried
  • Publication number: 20100122588
    Abstract: A method and a device for providing a predeterminable concentration of at least one component in a microscopic sample liquid medium are described. The device includes a feeding device for the at least one component. Measurement data are determined, measuring a predeterminable parameter using a microscopic method. The concentration of the at least one component is adjusted or controlled via the feeding device based on the basis of measurement data.
    Type: Application
    Filed: November 12, 2009
    Publication date: May 20, 2010
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Jochen Sieber, Marcus Dyba, Volker Seyfried
  • Patent number: 7679741
    Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).
    Type: Grant
    Filed: January 16, 2007
    Date of Patent: March 16, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Marcus Dyba, Hilmar Gugel
  • Patent number: 7646481
    Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.
    Type: Grant
    Filed: January 16, 2007
    Date of Patent: January 12, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Marcus Dyba, Hilmar Gugel
  • Publication number: 20090323058
    Abstract: The invention proposes a method for imaging at least one microscopic property of a sample and an apparatus with which the proposed method can be carried out. In the method, at least one coherent illumination light with at least one illumination wavelength is produced by means of at least one light source. The illumination light is imaged onto at least one region on or within the sampled. Detection light emitted by the sample is split at least partially into incoherent detection light and into coherent detection light by means of at least on physically separating beam splitter. The coherent detection light is at least partially separated from the coherent illumination light by at least one beam-splitter element. The coherent detection light is detected. The proposed method can be used in particular for investigating the sample by means of coherent anti-Stokes-Raman scattering.
    Type: Application
    Filed: August 31, 2007
    Publication date: December 31, 2009
    Applicant: Leica Microsystems CMS GmbH
    Inventor: Marcus Dyba
  • Publication number: 20090303474
    Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.
    Type: Application
    Filed: August 19, 2009
    Publication date: December 10, 2009
    Inventors: Marcus Dyba, Hilmar Gugel
  • Patent number: 7619732
    Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined with regard to increasing resolution in any desired direction and with regard to an increased imaging rate by the fact that the optical signal (4) is simultaneously concentrated at a number of focal points, and the focal points are focused into various sites of the sample (1).
    Type: Grant
    Filed: January 16, 2007
    Date of Patent: November 17, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Hilmar Gugel, Marcus Dyba
  • Publication number: 20080316469
    Abstract: A device for beam adjustment in an optical beam path, having at least two mutually independent light sources (1, 2), in particular in a beam path (8, 9) of a preferably high or extremely high resolution microscope, the beams of the light sources (1, 2) requiring to be superposed in a common illumination beam path (10), is characterized in that a calibration sample (22) with the aid of which the pupil position and/or focal position of the beams can be checked can be brought into and taken out of the illumination beam path (10).
    Type: Application
    Filed: March 4, 2008
    Publication date: December 25, 2008
    Inventors: Holger Birk, Marcus Dyba, Hilmar Gugel, Volker Seyfried
  • Publication number: 20070268583
    Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.
    Type: Application
    Filed: January 16, 2007
    Publication date: November 22, 2007
    Inventors: Marcus Dyba, Hilmar Gugel
  • Publication number: 20070206278
    Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).
    Type: Application
    Filed: January 16, 2007
    Publication date: September 6, 2007
    Inventors: Marcus Dyba, Hilmar Gugel
  • Publication number: 20070206277
    Abstract: A method for high spatial resolution examination of samples, preferably by using a laser scanning fluorescence microscope, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the following steps: a) the substance is brought into the first state (Z1, A) by means of a switching signal (2) in a sample region (P) to be recorded, b) the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, c) the remaining first states (Z1, A1, A2, A3) are read out by means of a test signal (7), and d) steps a) to c) are repeated, the optical signal (4) being displaced upon each repetition in order to scan the sample (1), is defined in that the individual steps a) to d) are carried out in a sequence adapted
    Type: Application
    Filed: January 16, 2007
    Publication date: September 6, 2007
    Inventors: Hilmar Gugel, Marcus Dyba, Volker Seyfried
  • Publication number: 20070206276
    Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined with regard to increasing resolution in any desired direction and with regard to an increased imaging rate by the fact that the optical signal (4) is simultaneously concentrated at a number of focal points, and the focal points are focused into various sites of the sample (1).
    Type: Application
    Filed: January 16, 2007
    Publication date: September 6, 2007
    Inventors: Hilmar GUGEL, Marcus DYBA
  • Patent number: 7253893
    Abstract: A method of exciting an optical transition in a narrowly limited area of a material comprising the steps of focusing an excitation light beam whose wavelength is tuned to the optical transition to be excited into a focal area extending beyond a focal point; splitting up a de-excitation light beam which is at least somehow influencing the optical transition into at least two partial beams; focusing the at least two partial beams of the de-excitation light beam out of different directions onto the focal point to form a spatially extending interference pattern in the focal area; adjusting a relative phase of the at least two partial beams of the de-excitation light beam so that the interference pattern has an intensity minimum at the focal point and a plurality of intensity maxima on different sides of the focal point; and aberrating the wave fronts of the at least two partial beams of the de-excitation light beam so that the intensity maxima of the interference pattern on different sides of the focal point are
    Type: Grant
    Filed: May 7, 2004
    Date of Patent: August 7, 2007
    Assignee: Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
    Inventors: Stefan Hell, Marcus Dyba
  • Publication number: 20040207854
    Abstract: A method of exciting an optical transition in a narrowly limited area of a material comprising the steps of focusing an excitation light beam whose wavelength is tuned to the optical transition to be excited into a focal area extending beyond a focal point; splitting up a de-excitation light beam which is at least somehow influencing the optical transition into at least two partial beams; focusing the at least two partial beams of the de-excitation light beam out of different directions onto the focal point to form a spatially extending interference pattern in the focal area; adjusting a relative phase of the at least two partial beams of the de-excitation light beam so that the interference pattern has an intensity minimum at the focal point and a plurality of intensity maxima on different sides of the focal point; and aberrating the wave fronts of the at least two partial beams of the de-excitation light beam so that the intensity maxima of the interference pattern on different sides of the focal point are
    Type: Application
    Filed: May 7, 2004
    Publication date: October 21, 2004
    Inventors: Stefan Hell, Marcus Dyba