Patents by Inventor Marcus Dyba
Marcus Dyba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20120236398Abstract: The aim of the invention is an optical device for a scanning microscope, said device enabling the focusing of a light beam largely independent of wavelengths; and thus high-resolution microscopy, in particular STED microscopy, in a wider wavelength spectrum is facilitated. At least two phase filters lie on a support. Advantageously, the support is a filter wheel or a filter slider which can be introduced into the beam path of the light beam, said beam path preferably being the beam path of the stimulating light beam in an STED microscope. Several phase filters preferablylie on the support in the shape of a matrix. The support is designed as a glass substrate on which each phase filter is applied. To achieve said aim, another position is additionally found on the support for adjustment purposes, wherein the wavefront of the light is not influenced when it passes through said position, that is, the position is an empty position on which no phase filter is found.Type: ApplicationFiled: June 1, 2012Publication date: September 20, 2012Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Hilmar GUGEL, Arnold GISKE, Marcus DYBA, Roland SEIFERT, Bernd WIDZGOWSKI
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Patent number: 7999935Abstract: The invention proposes a method for imaging at least one microscopic property of a sample and an apparatus with which the proposed method can be carried out. In the method, at least one coherent illumination light with at least one illumination wavelength is produced by means of at least one light source. The illumination light is imaged onto at least one region on or within the sample. Detection light emitted by the sample is split at least partially into incoherent detection light and into coherent detection light by means of at least on physically separating beam splitter. The coherent detection light is at least partially separated from the coherent illumination light by at least one beam-splitter element. The coherent detection light is detected. The proposed method can be used in particular for investigating the sample by means of coherent anti-Stokes-Raman scattering.Type: GrantFiled: August 31, 2007Date of Patent: August 16, 2011Assignee: Leica Microsystems CMS GmbHInventor: Marcus Dyba
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Patent number: 7903247Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.Type: GrantFiled: August 19, 2009Date of Patent: March 8, 2011Assignee: Leica Microsystems CMS GmbHInventors: Marcus Dyba, Hilmar Gugel
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Patent number: 7830506Abstract: A method for high spatial resolution examination of a sample, the sample to be examined including a substance that can be repeatedly converted from a first state into a second state, the first and the second states differing from one another in at least one optical property. The method includes: a) bringing the substance into the first state by means of a switching signal in a sample region to be recorded, b)inducing the second state by means of an optical signal, spatially delimited subregions being specifically excluded within the sample region to be recorded, c) reading out the remaining first states, and d) steps a) to c) are repeated, the optical signal being displaced upon each repetition in order to scan the sample, wherein the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.Type: GrantFiled: January 16, 2007Date of Patent: November 9, 2010Assignee: Leica Microsystems CMS GmbHInventors: Hilmar Gugel, Marcus Dyba, Volker Seyfried
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Publication number: 20100122588Abstract: A method and a device for providing a predeterminable concentration of at least one component in a microscopic sample liquid medium are described. The device includes a feeding device for the at least one component. Measurement data are determined, measuring a predeterminable parameter using a microscopic method. The concentration of the at least one component is adjusted or controlled via the feeding device based on the basis of measurement data.Type: ApplicationFiled: November 12, 2009Publication date: May 20, 2010Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Jochen Sieber, Marcus Dyba, Volker Seyfried
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Patent number: 7679741Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).Type: GrantFiled: January 16, 2007Date of Patent: March 16, 2010Assignee: Leica Microsystems CMS GmbHInventors: Marcus Dyba, Hilmar Gugel
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Patent number: 7646481Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.Type: GrantFiled: January 16, 2007Date of Patent: January 12, 2010Assignee: Leica Microsystems CMS GmbHInventors: Marcus Dyba, Hilmar Gugel
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Publication number: 20090323058Abstract: The invention proposes a method for imaging at least one microscopic property of a sample and an apparatus with which the proposed method can be carried out. In the method, at least one coherent illumination light with at least one illumination wavelength is produced by means of at least one light source. The illumination light is imaged onto at least one region on or within the sampled. Detection light emitted by the sample is split at least partially into incoherent detection light and into coherent detection light by means of at least on physically separating beam splitter. The coherent detection light is at least partially separated from the coherent illumination light by at least one beam-splitter element. The coherent detection light is detected. The proposed method can be used in particular for investigating the sample by means of coherent anti-Stokes-Raman scattering.Type: ApplicationFiled: August 31, 2007Publication date: December 31, 2009Applicant: Leica Microsystems CMS GmbHInventor: Marcus Dyba
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Publication number: 20090303474Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.Type: ApplicationFiled: August 19, 2009Publication date: December 10, 2009Inventors: Marcus Dyba, Hilmar Gugel
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Patent number: 7619732Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined with regard to increasing resolution in any desired direction and with regard to an increased imaging rate by the fact that the optical signal (4) is simultaneously concentrated at a number of focal points, and the focal points are focused into various sites of the sample (1).Type: GrantFiled: January 16, 2007Date of Patent: November 17, 2009Assignee: Leica Microsystems CMS GmbHInventors: Hilmar Gugel, Marcus Dyba
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Publication number: 20080316469Abstract: A device for beam adjustment in an optical beam path, having at least two mutually independent light sources (1, 2), in particular in a beam path (8, 9) of a preferably high or extremely high resolution microscope, the beams of the light sources (1, 2) requiring to be superposed in a common illumination beam path (10), is characterized in that a calibration sample (22) with the aid of which the pupil position and/or focal position of the beams can be checked can be brought into and taken out of the illumination beam path (10).Type: ApplicationFiled: March 4, 2008Publication date: December 25, 2008Inventors: Holger Birk, Marcus Dyba, Hilmar Gugel, Volker Seyfried
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Publication number: 20070268583Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.Type: ApplicationFiled: January 16, 2007Publication date: November 22, 2007Inventors: Marcus Dyba, Hilmar Gugel
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Publication number: 20070206278Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).Type: ApplicationFiled: January 16, 2007Publication date: September 6, 2007Inventors: Marcus Dyba, Hilmar Gugel
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Publication number: 20070206277Abstract: A method for high spatial resolution examination of samples, preferably by using a laser scanning fluorescence microscope, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the following steps: a) the substance is brought into the first state (Z1, A) by means of a switching signal (2) in a sample region (P) to be recorded, b) the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, c) the remaining first states (Z1, A1, A2, A3) are read out by means of a test signal (7), and d) steps a) to c) are repeated, the optical signal (4) being displaced upon each repetition in order to scan the sample (1), is defined in that the individual steps a) to d) are carried out in a sequence adaptedType: ApplicationFiled: January 16, 2007Publication date: September 6, 2007Inventors: Hilmar Gugel, Marcus Dyba, Volker Seyfried
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Publication number: 20070206276Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined with regard to increasing resolution in any desired direction and with regard to an increased imaging rate by the fact that the optical signal (4) is simultaneously concentrated at a number of focal points, and the focal points are focused into various sites of the sample (1).Type: ApplicationFiled: January 16, 2007Publication date: September 6, 2007Inventors: Hilmar GUGEL, Marcus DYBA
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Patent number: 7253893Abstract: A method of exciting an optical transition in a narrowly limited area of a material comprising the steps of focusing an excitation light beam whose wavelength is tuned to the optical transition to be excited into a focal area extending beyond a focal point; splitting up a de-excitation light beam which is at least somehow influencing the optical transition into at least two partial beams; focusing the at least two partial beams of the de-excitation light beam out of different directions onto the focal point to form a spatially extending interference pattern in the focal area; adjusting a relative phase of the at least two partial beams of the de-excitation light beam so that the interference pattern has an intensity minimum at the focal point and a plurality of intensity maxima on different sides of the focal point; and aberrating the wave fronts of the at least two partial beams of the de-excitation light beam so that the intensity maxima of the interference pattern on different sides of the focal point areType: GrantFiled: May 7, 2004Date of Patent: August 7, 2007Assignee: Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.Inventors: Stefan Hell, Marcus Dyba
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Publication number: 20040207854Abstract: A method of exciting an optical transition in a narrowly limited area of a material comprising the steps of focusing an excitation light beam whose wavelength is tuned to the optical transition to be excited into a focal area extending beyond a focal point; splitting up a de-excitation light beam which is at least somehow influencing the optical transition into at least two partial beams; focusing the at least two partial beams of the de-excitation light beam out of different directions onto the focal point to form a spatially extending interference pattern in the focal area; adjusting a relative phase of the at least two partial beams of the de-excitation light beam so that the interference pattern has an intensity minimum at the focal point and a plurality of intensity maxima on different sides of the focal point; and aberrating the wave fronts of the at least two partial beams of the de-excitation light beam so that the intensity maxima of the interference pattern on different sides of the focal point areType: ApplicationFiled: May 7, 2004Publication date: October 21, 2004Inventors: Stefan Hell, Marcus Dyba