Patents by Inventor Mario René Berg

Mario René Berg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems
    Patent number: 11047795
    Abstract: Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems. The calibration chucks include a calibration chuck body that defines a calibration chuck support surface. The calibration chucks also include at least one optical calibration structure that is supported by the calibration chuck body. The at least one optical calibration structure includes a horizontal viewing structure. The horizontal viewing structure is configured to facilitate viewing of a horizontally viewed region from a horizontal viewing direction that is at least substantially parallel to the calibration chuck support surface. The horizontal viewing structure also is configured to facilitate viewing of the horizontally viewed region via an imaging device of the optical probe system that is positioned vertically above the calibration chuck support surface.
    Type: Grant
    Filed: May 27, 2020
    Date of Patent: June 29, 2021
    Assignee: FormFactor, Inc.
    Inventors: Kazuki Negishi, Michael E. Simmons, Christopher Anthony Storm, Joseph George Frankel, Eric Robert Christenson, Mario René Berg
  • CALIBRATION CHUCKS FOR OPTICAL PROBE SYSTEMS, OPTICAL PROBE SYSTEMS INCLUDING THE CALIBRATION CHUCKS, AND METHODS OF UTILIZING THE OPTICAL PROBE SYSTEMS
    Publication number: 20200378888
    Abstract: Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems. The calibration chucks include a calibration chuck body that defines a calibration chuck support surface. The calibration chucks also include at least one optical calibration structure that is supported by the calibration chuck body. The at least one optical calibration structure includes a horizontal viewing structure. The horizontal viewing structure is configured to facilitate viewing of a horizontally viewed region from a horizontal viewing direction that is at least substantially parallel to the calibration chuck support surface. The horizontal viewing structure also is configured to facilitate viewing of the horizontally viewed region via an imaging device of the optical probe system that is positioned vertically above the calibration chuck support surface.
    Type: Application
    Filed: May 27, 2020
    Publication date: December 3, 2020
    Inventors: Kazuki Negishi, Michael E. Simmons, Christopher Anthony Storm, Joseph George Frankel, Eric Robert Christenson, Mario René Berg