Abstract: A CT scanner is employed having a first coordinate system called the CT coordinate system related to the CT scanner for determining an actual position of a structure of an object to be examined. A coordinate measuring instrument (MI) is employed which is either a tactile or an optical or multisensor or an ultrasonic coordinate measuring instrument and which has a second coordinate system, the MI coordinate system, related to said coordinate measuring instrument. According to a variant, a) the coordinates of the object are determined in the MI coordinate system, b) the target position of the structure is predefined, c) after steps a) and b) the target position is determined in the MI coordinate system, d) and, the object is positioned in such a way that the target position of the structure comes to lie within a volume detected by the CT scanner using the result of step c).

Abstract: The invention relates to processes and to a device for determining the actual position of a structure of an object to be examined in a coordinate system.

Abstract: A CT scanner is employed having a first coordinate system called the CT coordinate system related to the CT scanner for determining an actual position of a structure of an object to be examined. A coordinate measuring instrument (MI) is employed which is either a tactile or an optical or multisensor or an ultrasonic coordinate measuring instrument and which has a second coordinate system, the MI coordinate system, related to said coordinate measuring instrument. According to a variant, a) the coordinates of the object are determined in the MI coordinate system, b) the target position of the structure is predefined, c) after steps a) and b) the target position is determined in the MI coordinate system, d) and, the object is positioned in such a way that the target position of the structure comes to lie within a volume detected by the CT scanner using the result of step c).

Abstract: The invention relates to processes and to a device for determining the actual position of a structure of an object to be examined in a coordinate system.

Abstract: A coordinate measuring machine including a support platform for supporting an object. Scanning means is supported by the support platform. The scanning means includes a probe assembly and a non-contact scanner. Drive means is connected to at least one of the probe assembly and the non-contact scanner for moving the probe assembly and non-contact scanner relative to each other. The probe assembly includes a probe movably disposed in a guide tube. The probe includes a shaft and a tip integrally formed from either a fiber-optic or non-fiber-optic material. The tip extends from the guide tube so as to be detectable by the non-contact scanner. The tip may include one or more stylus. During operation the tip contacts the object and the non-contact scanner detects the tip to determine the corresponding coordinates of the object. A light source illuminates the tip for improved detection of the tip. When the probe is formed of a fiber-optic material, light is emitted through the probe.

Abstract: A coordinate measuring machine including a support platform for supporting an object. Scanning means is supported by the support platform. The scanning means includes a probe assembly and a non-contact scanner. Drive means is connected to at least one of the probe assembly and the non-contact scanner for moving the probe assembly and non-contact scanner relative to each other. The probe assembly includes a probe movably disposed in a guide tube. The probe includes a shaft and a tip integrally formed from either a fiber-optic or non-fiber-optic material. The tip extends from the guide tube so as to be detectable by the non-contact scanner. The tip may include one or more stylus. During operation the tip contacts the object and the non-contact scanner detects the tip to determine the corresponding coordinates of the object. A light source illuminates the tip for improved detection of the tip. When the probe is formed of a fiber-optic material, light is emitted through the probe.

Abstract: A coordinate measuring machine including a support platform for supporting an object. Scanning means is supported by the support platform. The scanning means includes a probe assembly and a non-contact scanner. Drive means is connected to at least one of the probe assembly and the non-contact scanner for moving the probe assembly and non-contact scanner relative to each other. The probe assembly includes a probe movably disposed in a guide tube. The probe includes a shaft and a tip integrally formed from either a fiber-optic or non-fiber-optic material. The tip extends from the guide tube so as to be detectable by the non-contact scanner. The tip may include one or more stylus. During operation the tip contacts the object and the non-contact scanner detects the tip to determine the corresponding coordinates of the object. A light source illuminates the tip for improved detection of the tip. When the probe is formed of a fiber-optic material, light is emitted through the probe.