Abstract: In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.

Abstract: An optical system for generating a light beam for treating a substrate arranged in a substrate plane is disclosed. The optical system includes first and second optical arrangements.

Abstract: In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.

Abstract: In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.

Abstract: In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.

Abstract: In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.

Abstract: An illumination system for a microlithography projection exposure installation for illuminating an illumination field (7) with the light of an assigned light source (10) has at least one polarization compensator (11) in a pupil plane (23) of the illumination system. The latter can be used for the at least partial compensation of a polarization change introduced by elements (5) that change polarization as a function of angle. For the purpose of location-dependent polarization change, the polarization compensator (11) has polarization changing means that can be designed as birefringent elements or elements having a birefringent structure. The transmission properties of the microlithography projection exposure installation can be enhanced by such a polarization compensation, particularly when use is made of a subsequent projection objective with a physical beam splitter.

Abstract: An apparatus and method for improving the optical polarisation properties of a microlithographic projection exposure apparatus is disclosed. The method including a first step of providing a mounted optical system of the projection exposure apparatus, which contains a plurality of optical elements; a second step identifying those optical elements that perturb the optical polarisation properties in the mounted optical system to an extent that exceeds a limit value predetermined for the respective optical element; and, a third step implementing measures to improve the optical polarisation properties, which relate to the optical elements identified in the second step.

Abstract: In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.

Abstract: Centimeter thick plates or lenses made from calcium fluoride or barium fluoride with beam propagation in the direction of the <110> crystal direction or of a main axis equivalent thereto are provided as retardation elements for the deep ultraviolet. They can be installed in an unstressed fashion. In a particular embodiment a retardation plate comprises a birefringent crystal plate which has an entry face and an exit face for incident and emerging light, respectively. A form-birefringent dielectric layer structure is applied to the entry and/or exit face. It may, for example, be a periodic sequence of at least two layers with alternating refractive indices. The retardation plate is suitable for ultraviolet light, and permits a large range of angles of incidence. Retardation elements according to the invention are particularly suitable for microlithography at 157 nm.