Patents by Inventor Martijn Goosens

Martijn Goosens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120091546
    Abstract: A microphone comprises a substrate (20), a microphone membrane (10) defining an acoustic input surface and a backplate (11) supported with respect to the membrane with a fixed spacing between the backplate (11) and the membrane (10). A microphone periphery area comprises parallel corrugations (24) in the membrane (10) and backplate (11). By using the same corrugated suspension for both the membrane and the backplate, the sensitivity to body noise is optimally suppressed.
    Type: Application
    Filed: April 20, 2010
    Publication date: April 19, 2012
    Applicant: KNOWLES ELECTRONICS ASIA PTE. LTD.
    Inventors: Geert Langereis, Twan Van Lippen, Freddy Roozeboom, Hilco Suy, Klaus Reimann, Jozef Thomas Martinus Van Beek, Casper Van Der Avoort, Johannes Van Wingerden, Kim Phan Le, Martijn Goosens, Peter Gerard Steeneken
  • Publication number: 20080304054
    Abstract: A method for analyzing an integrated circuit (IC) comprising a plurality of semiconductor devices is disclosed. The method comprises the steps of forming a diffraction lens (100) comprising a plurality of concentric diffraction zones (110) in a first area of a further surface opposite to the first surface of the substrate (10), and a further step of optically accessing a subset (30) of the plurality of semiconductor devices (20) through the diffraction lens (100). Due to the fact that a diffraction lens (100) can be implemented at submicron sizes, the lens (100) can be formed more cheaply than a refraction lens, which usually is several microns deep. Moreover, the lens (100) can be easily polished off the substrate (10), which facilitates repeated relocation of the lens (100) on the substrate (10), thus improving the chance of optically detecting a fault inside the IC.
    Type: Application
    Filed: May 4, 2006
    Publication date: December 11, 2008
    Applicant: NXP B.V.
    Inventors: Martijn Goosens, Frank Zachariasse