Patents by Inventor Martin Kefer

Martin Kefer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tilt detection apparatus and method thereof
    Patent number: 11493338
    Abstract: An apparatus for detecting tilt of a fixture and method thereof.
    Type: Grant
    Filed: October 16, 2018
    Date of Patent: November 8, 2022
    Assignee: ABB SCHWEIZ AG
    Inventors: Hao Gu, Jihuan Tian, Cheng Li, Martin Kefer
  • Object multi-perspective inspection apparatus and method therefor
    Patent number: 10788429
    Abstract: It is therefore an objective to provide an object multi-perspective inspection apparatus and a method therefor. The apparatus includes an image capture device; an inspection site and at least two reflection devices, being arranged for reflecting simultaneously to the image capture device at least two different side views of the object located in the inspection site; wherein: the image capture device has a field of view including the at least two different side views of the reflection. By introducing reflection devices into the inspection apparatus to enable the image capture device to “see” the part from multiple views at once, multiple surfaces can be inspected at once, in one image frame, without having the need to reposition the reflection device, the camera and/or the object for every single surface. There are more than one reflection devices placed in the camera's field of view to assist the inspection process by exploiting otherwise hidden surfaces of any given solid object.
    Type: Grant
    Filed: November 5, 2019
    Date of Patent: September 29, 2020
    Assignee: ABB Schweiz AG
    Inventors: Martin Kefer, Jiafan Zhang
  • OBJECT MULTI-PERSPECTIVE INSPECTION APPARATUS AND METHOD THEREFOR
    Publication number: 20200132609
    Abstract: It is therefore an objective to provide an object multi-perspective inspection apparatus and a method therefor. The apparatus includes an image capture device; an inspection site and at least two reflection devices, being arranged for reflecting simultaneously to the image capture device at least two different side views of the object located in the inspection site; wherein: the image capture device has a field of view including the at least two different side views of the reflection. By introducing reflection devices into the inspection apparatus to enable the image capture device to “see” the part from multiple views at once, multiple surfaces can be inspected at once, in one image frame, without having the need to reposition the reflection device, the camera and/or the object for every single surface. There are more than one reflection devices placed in the camera's field of view to assist the inspection process by exploiting otherwise hidden surfaces of any given solid object.
    Type: Application
    Filed: November 5, 2019
    Publication date: April 30, 2020
    Inventors: Martin Kefer, Jiafan Zhang
  • Object multi-perspective inspection apparatus and method therefor
    Patent number: 10488346
    Abstract: It is therefore an objective to provide an object multi-perspective inspection apparatus and a method therefor. The apparatus includes an image capture device; an inspection site and at least two reflection devices, being arranged for reflecting simultaneously to the image capture device at least two different side views of the object located in the inspection site; wherein: the image capture device has a field of view including the at least two different side views of the reflection. By introducing reflection devices into the inspection apparatus to enable the image capture device to “see” the part from multiple views at once, multiple surfaces can be inspected at once, in one image frame, without having the need to reposition the reflection device, the camera and/or the object for every single surface. There are more than one reflection devices placed in the camera's field of view to assist the inspection process by exploiting otherwise hidden surfaces of any given solid object.
    Type: Grant
    Filed: February 26, 2018
    Date of Patent: November 26, 2019
    Assignee: ABB Schweiz AG
    Inventors: Martin Kefer, Jiafan Zhang
  • TILT DETECTION APPARATUS AND METHOD THEREOF
    Publication number: 20190049244
    Abstract: An apparatus for detecting tilt of a fixture and method thereof.
    Type: Application
    Filed: October 16, 2018
    Publication date: February 14, 2019
    Inventors: Hao Gu, Jihuan Tian, Cheng Li, Martin Kefer
  • OBJECT MULTI-PERSPECTIVE INSPECTION APPARATUS AND METHOD THEREFOR
    Publication number: 20180188184
    Abstract: It is therefore an objective to provide an object multi-perspective inspection apparatus and a method therefor. The apparatus includes an image capture device; an inspection site and at least two reflection devices, being arranged for reflecting simultaneously to the image capture device at least two different side views of the object located in the inspection site; wherein: the image capture device has a field of view including the at least two different side views of the reflection. By introducing reflection devices into the inspection apparatus to enable the image capture device to “see” the part from multiple views at once, multiple surfaces can be inspected at once, in one image frame, without having the need to reposition the reflection device, the camera and/or the object for every single surface. There are more than one reflection devices placed in the camera's field of view to assist the inspection process by exploiting otherwise hidden surfaces of any given solid object.
    Type: Application
    Filed: February 26, 2018
    Publication date: July 5, 2018
    Inventors: Martin Kefer, Jiafan Zhang