Abstract: A test element support comprises a heating element for heating a test element for analytical examination of a sample. The heating element comprises a substrate, which is made of at least one substrate material. The substrate comprises at least one active area configured for being heated and at least one non-active area outside the active area. The active and the non-active areas are separated by at least one thermal insulation element. The thermal insulation element has a lower thermal conductivity than the substrate material. The thermal insulation element is fully or partially embedded into the substrate. The test element support further comprises at least one heater. The heater comprises at least one heater substrate and the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate. The back face opposes a front face of the substrate contacting the test element.

Abstract: A test element support comprises a heating element for heating a test element for analytical examination of a sample. The heating element comprises a substrate, which is made of at least one substrate material. The substrate comprises at least one active area configured for being heated and at least one non-active area outside the active area. The active and the non-active areas are separated by at least one thermal insulation element. The thermal insulation element has a lower thermal conductivity than the substrate material. The thermal insulation element is fully or partially embedded into the substrate. The test element support further comprises at least one heater. The heater comprises at least one heater substrate and the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate. The back face opposes a front face of the substrate contacting the test element.

Abstract: A test element analysis system for the analytical examination of a sample, a method for positioning a test element in a measuring device and a method for an analytical examination of a sample are disclosed. The test element analysis system comprises: a measurement device comprising a test element receptacle for receiving a test element at least partially, wherein the receptacle comprises a first part and a second part, the first part comprises a support surface for placement of the test element, the second part comprises an alignment pin for engagement with an alignment hole of the test element, the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, the receptacle is configured to position the second part in at least three distinct positions relative to the first part comprising an intermediate position, a closed position, and an open position.

Abstract: A test element analysis system for the analytical examination of a sample, a method for positioning a test element in a measuring device and a method for an analytical examination of a sample are disclosed. The test element analysis system comprises: a measurement device comprising a test element receptacle for receiving a test element at least partially, wherein the receptacle comprises a first part and a second part, the first part comprises a support surface for placement of the test element, the second part comprises an alignment pin for engagement with an alignment hole of the test element, the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, the receptacle is configured to position the second part in at least three distinct positions relative to the first part comprising an intermediate position, a closed position, and an open position.

Abstract: A transporting apparatus for transporting flat, sheet-like material through one or more processing stations of a sheet-processing machine includes at least one upper conveying apparatus and at least one lower conveying apparatus with conveying devices which are in contact with one another. The upper and lower conveying apparatuses are fastened in such a way that they can be altered freely in length. A sheet-processing machine with a transporting apparatus is also provided.

Abstract: A device for holding tools for processing flat, sheet-like material includes top and bottom tool holding devices which have respective top and bottom tool units that are driven by drive shafts through servomotors and are laterally displaceable by tool guide elements which are supported on cross members. The top and bottom cross members have a rectangular construction and are fitted perpendicularly in the device. A sheet-processing machine and a folding carton gluer having the device, are also provided.

Abstract: A device for holding tools for processing flat, sheet-like material includes top and bottom tool holding devices which have respective top and bottom tool units that are driven by drive shafts through servomotors and are laterally displaceable by tool guide elements which are supported on cross members. The top and bottom cross members have a rectangular construction and are fitted perpendicularly in the device. A sheet-processing machine and a folding carton gluer having the device, are also provided.

Abstract: A transporting apparatus for transporting flat, sheet-like material through one or more processing stations of a sheet-processing machine includes at least one upper conveying apparatus and at least one lower conveying apparatus with conveying devices which are in contact with one another. The upper and lower conveying apparatuses are fastened in such a way that they can be altered freely in length. A sheet-processing machine with a transporting apparatus is also provided.

Abstract: A tool is provided for a rotary embossing device for embossing flat, sheet-shaped material. The device includes two rotating embossing tools in the form of a male tool and a female tool for creating an embossing. At least the male tool has a roller body to which a seamless annular tool sleeve is attached. The tool sleeve of the male tool has raised embossing dots on its outer circumferential surface. These dots interact with corresponding recesses in the outer circumferential surface of the female tool.