Patents by Inventor Martin Philip Gouch

Martin Philip Gouch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10241310
    Abstract: A method of forming an imaging calibration device for a biological material imaging system, the method comprises: providing one or more discrete regions upon or within a retaining member, each region for the receipt of a selected predetermined biological stain material; selecting one or more predetermined biological stain materials, wherein each of the selected predetermined biological stain materials has a predetermined optical response, and providing one or more of the selected predetermined biological stain materials to the said one or more discrete regions such that the said material is localised in the said region.
    Type: Grant
    Filed: June 3, 2013
    Date of Patent: March 26, 2019
    Assignee: FFEI Limited
    Inventors: Martin Philip Gouch, Craig Revie, Peter Walsh, Jacqueline Margaret Deane
  • Publication number: 20180295254
    Abstract: Image scanning apparatus and method of operating an image scanning apparatus, the image scanning apparatus including a line scan detector and being configured to image a surface of an object mounted in the image scanning apparatus in a plurality of swathes, wherein each swathe is formed by a group of scan lines, each scan line being acquired using the scan line detector from a respective elongate region of the surface of the object extending in a scan width direction, wherein each group of scan lines is acquired whilst the object is moved relative to the scan line detector in a scan length direction.
    Type: Application
    Filed: June 8, 2018
    Publication date: October 11, 2018
    Inventors: Martin Philip Gouch, William Roland Hawes, Joachim Helmut Schmid
  • Patent number: 9903785
    Abstract: A method of estimating an in-focus level of a target in an image scanning apparatus is provided, wherein the image scanning apparatus comprises a first line scan detector configured to obtain one or more image scan lines of the target and a second line scan detector configured to obtain one or more focus scan lines of the target. The method comprises obtaining at least one image scan line of the target using the first line scan detector, each at least one image scan line being obtained at a respective focus level; obtaining at least one focus scan line of the target using the second line scan detector, each at least one focus scan line being obtained at a respective focus level; calculating at least one focus parameter using at least the at least one focus scan line; and estimating a nominal in-focus level of the target using the calculated focus parameter(s).
    Type: Grant
    Filed: December 27, 2016
    Date of Patent: February 27, 2018
    Assignee: FFEI Limited
    Inventor: Martin Philip Gouch
  • Patent number: 9835837
    Abstract: A method for estimating an in-focus position of a target using an image scanning apparatus is provided. The in-focus position is monitored at a seed location and an end location on the target and a pre-scan path is calculated between these locations. A pre-scan is then performed and a focus parameter is monitored for a plurality of locations along the pre-scan path. An imaging scan is next performed wherein the target is imaged along an image scan path and a focus parameter is monitored for a plurality of locations along said path. The focal height of the apparatus is adjusted during the imaging scan by comparing the focal parameter monitored for a current location on the image scan path with the focal parameter monitored for a similar location on the pre-scan path. The focal parameter monitored for different locations on the image scan path may also be compared.
    Type: Grant
    Filed: December 15, 2014
    Date of Patent: December 5, 2017
    Assignee: FFEI Limited
    Inventor: Martin Philip Gouch
  • Publication number: 20170167948
    Abstract: A method of estimating an in-focus level of a target in an image scanning apparatus is provided, wherein the image scanning apparatus comprises a first line scan detector configured to obtain one or more image scan lines of the target and a second line scan detector configured to obtain one or more focus scan lines of the target. The method comprises obtaining at least one image scan line of the target using the first line scan detector, each at least one image scan line being obtained at a respective focus level; obtaining at least one focus scan line of the target using the second line scan detector, each at least one focus scan line being obtained at a respective focus level; calculating at least one focus parameter using at least the at least one focus scan line; and estimating a nominal in-focus level of the target using the calculated focus parameter(s).
    Type: Application
    Filed: December 27, 2016
    Publication date: June 15, 2017
    Applicant: FFEI Limited
    Inventor: Martin Philip GOUCH
  • Patent number: 9638573
    Abstract: A method of estimating an in-focus level of a target in an image scanning apparatus is provided, wherein the image scanning apparatus comprises a first line scan detector configured to obtain one or more image scan lines of the target and a second line scan detector configured to obtain one or more focus scan lines of the target. The method comprises obtaining at least one image scan line of the target using the first line scan detector, each at least one image scan line being obtained at a respective focus level; obtaining at least one focus scan line of the target using the second line scan detector, each at least one focus scan line being obtained at a respective focus level; calculating at least one focus parameter using at least one focus scan line; and estimating a nominal in-focus level of the target using the calculated focus parameter(s).
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: May 2, 2017
    Assignee: FFEI Limited
    Inventor: Martin Philip Gouch
  • Publication number: 20170075101
    Abstract: A microscope scanning apparatus is provided comprising a detector array for obtaining an image from a sample and a sample holder adapted to hold the sample when in use and to move relative to the detector array along a scan path. A controller is further provided to monitor the position of the sample holder relative to the detector array and to trigger image capture by the detector array in accordance with said monitored position.
    Type: Application
    Filed: November 22, 2016
    Publication date: March 16, 2017
    Inventors: William Roland Hawes, Martin Philip Gouch
  • Publication number: 20170078589
    Abstract: A microscope scanner is provided comprising a detector array for obtaining an image from a sample and a sample holder configured to move relative to the detector array. The sample holder can be configured to move to a plurality of target positions relative to the detector array in accordance with position control signals issued by a controller and the detector array is configured to capture images during an imaging scan based on the position control signals.
    Type: Application
    Filed: November 22, 2016
    Publication date: March 16, 2017
    Inventors: William Roland Hawes, Martin Philip Gouch
  • Patent number: 9454691
    Abstract: A method is provided of forming an imaging reference device for a biological material imaging system. A first region is provided in a substrate formed from an optically transmissive material which is an analogue of biological tissue. This first region is stained using a first biological tissue stain. A second region is provided in second substrate which is optically transmissive and an analogue of biological tissue. The second region is stained with a second biological tissue stain. The first and second regions are overlapped as a pair, such that light incident upon the pair is modulated by the respective first and second biological tissue stains of the respective regions. Multiple regions of the first and second type may be provided, stained to different degrees.
    Type: Grant
    Filed: March 9, 2015
    Date of Patent: September 27, 2016
    Assignee: FFEI Limited
    Inventors: William Craig Revie, Martin Philip Gouch
  • Publication number: 20160004900
    Abstract: A method is provided of forming an imaging reference device for a biological material imaging system. A first region is provided in a substrate formed from an optically transmissive material which is an analogue of biological tissue. This first region is stained using a first biological tissue stain. A second region is provided in second substrate which is optically transmissive and an analogue of biological tissue. The second region is stained with a second biological tissue stain. The first and second regions are overlapped as a pair, such that light incident upon the pair is modulated by the respective first and second biological tissue stains of the respective regions. Multiple regions of the first and second type may be provided, stained to different degrees.
    Type: Application
    Filed: March 9, 2015
    Publication date: January 7, 2016
    Applicant: FFEI LIMITED
    Inventors: William Craig REVIE, Martin Philip GOUCH
  • Patent number: 9116035
    Abstract: A method of estimating an in-focus level of a target in an image scanning apparatus, wherein the image scanning apparatus comprises a first line scan detector configured to obtain one or more image scan lines of the target and a second line scan detector configured to obtain one or more focus scan lines of the target, the second line scan detector comprising at least one focus shifting element such that each focus scan line is obtained at respective first and second focus levels, wherein the first focus level is different from the second focus level, the method comprising: obtaining at least one focus scan line of the target using the second line scan detector; obtaining at least one image scan line of the target using the first line scan detector, the image scan line being obtained at a respective third focus level; calculating at least one focus parameter using the at least one focus scan line; and estimating a nominal in-focus level of the target using the at least one focus parameter.
    Type: Grant
    Filed: September 6, 2013
    Date of Patent: August 25, 2015
    Assignee: FFEI Limited
    Inventors: Martin Philip Gouch, William Roland Hawes
  • Publication number: 20150192765
    Abstract: A method of forming an imaging calibration device for a biological material imaging system, the method comprises: providing one or more discrete regions upon or within a retaining member, each region for the receipt of a selected predetermined biological stain material; selecting one or more predetermined biological stain materials, wherein each of the selected predetermined biological stain materials has a predetermined optical response, and providing one or more of the selected predetermined biological stain materials to the said one or more discrete regions such that the said material is localised in the said region.
    Type: Application
    Filed: June 3, 2013
    Publication date: July 9, 2015
    Inventors: Martin Philip Gouch, Craig Revie, Peter Walsh, Jacqueline Margaret Deane
  • Publication number: 20150168701
    Abstract: A method for estimating an in-focus position of a target using an image scanning apparatus is provided. The in-focus position is monitored at a seed location and an end location on the target and a pre-scan path is calculated between these locations. A pre-scan is then performed and a focus parameter is monitored for a plurality of locations along the pre-scan path. An imaging scan is next performed wherein the target is imaged along an image scan path and a focus parameter is monitored for a plurality of locations along said path. The focal height of the apparatus is adjusted during the imaging scan by comparing the focal parameter monitored for a current location on the image scan path with the focal parameter monitored for a similar location on the pre-scan path. The focal parameter monitored for different locations on the image scan path may also be compared.
    Type: Application
    Filed: December 15, 2014
    Publication date: June 18, 2015
    Applicant: FFEI LIMITED
    Inventor: Martin Philip GOUCH
  • Publication number: 20140168640
    Abstract: A method of estimating an in-focus level of a target in an image scanning apparatus is provided, wherein the image scanning apparatus comprises a first line scan detector configured to obtain one or more image scan lines of the target and a second line scan detector configured to obtain one or more focus scan lines of the target. The method comprises obtaining at least one image scan line of the target using the first line scan detector, each at least one image scan line being obtained at a respective focus level; obtaining at least one focus scan line of the target using the second line scan detector, each at least one focus scan line being obtained at a respective focus level; calculating at least one focus parameter using at least one focus scan line; and estimating a nominal in-focus level of the target using the calculated focus parameter(s).
    Type: Application
    Filed: July 27, 2012
    Publication date: June 19, 2014
    Applicant: FFEI Limited
    Inventor: Martin Philip Gouch
  • Patent number: 8712116
    Abstract: A method of generating a digital representation of a portion of an object from sets of digital data defining the color content of individually stored, overlapping swathes of pixels of an image of the object portion. The method comprises: (a) selecting a portion of the object; (b) determining the swathes which contain pixels within the selected portion; (c) correlating adjacent ones of said swathes; (d) if necessary, adjusting the relative positions of the adjacent swathes in accordance with the results of the correlating step (c); and, (e) generating a digital representation of pixels of the selected portion from the correlated swathes.
    Type: Grant
    Filed: October 17, 2007
    Date of Patent: April 29, 2014
    Assignee: FFEI Limited
    Inventor: Martin Philip Gouch
  • Publication number: 20140071438
    Abstract: A method of estimating an in-focus level of a target in an image scanning apparatus, wherein the image scanning apparatus comprises a first line scan detector configured to obtain one or more image scan lines of the target and a second line scan detector configured to obtain one or more focus scan lines of the target, the second line scan detector comprising at least one focus shifting element such that each focus scan line is obtained at respective first and second focus levels, wherein the first focus level is different from the second focus level, the method comprising: obtaining at least one focus scan line of the target using the second line scan detector; obtaining at least one image scan line of the target using the first line scan detector, the image scan line being obtained at a respective third focus level; calculating at least one focus parameter using the at least one focus scan line; and estimating a nominal in-focus level of the target using the at least one focus parameter.
    Type: Application
    Filed: September 6, 2013
    Publication date: March 13, 2014
    Applicant: FFEI Limited
    Inventors: Martin Philip GOUCH, William Roland HAWES
  • Patent number: 8472692
    Abstract: In accordance with the present invention there is provided a method for controlling a microscope to scan a microscope slide. By analyzing an overview image it is determined quantatively which swathe contains the most image detail and an optimum scanning order can subsequently be determined relative to the swathe determined as having the most detail. By scanning the swathe with the most detail first a good focus characteristic can be established for a dynamic focussing system and prediction errors in the dynamic focus system are likely to be low when scanning subsequent swathes.
    Type: Grant
    Filed: January 11, 2010
    Date of Patent: June 25, 2013
    Assignee: FFEI Limited
    Inventors: Daxa Neykumar Rughani, Martin Philip Gouch
  • Patent number: 8297736
    Abstract: An inkjet head support assembly comprises a plurality of spaced apart carrier members mounted for relative movement along an elongate path, each carrier member including laterally offset first and second coupling positions. In use alternate inkjet heads are coupled at each of their ends between first coupling positions or between second coupling positions respectively of successive pairs of carrier members. At least one coupling position of each carrier member includes an adjustment mechanism to enable parts of inkjet heads coupled to the respective coupling positions of the same carrier member to be relatively aligned in the elongate direction.
    Type: Grant
    Filed: August 20, 2010
    Date of Patent: October 30, 2012
    Assignee: FFEI Limited
    Inventors: Martin Philip Gouch, Joseph Lathbury, Jag Pankhania
  • Publication number: 20120044296
    Abstract: An inkjet head support assembly comprises a plurality of spaced apart carrier members mounted for relative movement along an elongate path, each carrier member including laterally offset first and second coupling positions. In use alternate inkjet heads are coupled at each of their ends between first coupling positions or between second coupling positions respectively of successive pairs of carrier members. At least one coupling position of each carrier member includes an adjustment mechanism to enable parts of inkjet heads coupled to the respective coupling positions of the same carrier member to be relatively aligned in the elongate direction.
    Type: Application
    Filed: August 20, 2010
    Publication date: February 23, 2012
    Applicant: FFEI LIMITED
    Inventors: Martin Philip Gouch, Joseph Lathbury, Jag Pankhania
  • Patent number: 7891802
    Abstract: An ink pinning assembly comprises a source of UV radiation suitable for pinning ink on a record medium. A radiation guide device has an inlet facing the source and an outlet through which radiation is emitted towards a record medium, in use, the length of the inlet being greater that the length of the radiation source. The radiation guide device has a substantially rectangular or square wall in plan surrounding a cavity extending between the inlet and outlet, the internal surface of the wall being reflective to the pinning radiation so that pinning radiation with a substantial uniform intensity is emitted from the outlet.
    Type: Grant
    Filed: November 9, 2007
    Date of Patent: February 22, 2011
    Assignee: FFEI Ltd.
    Inventor: Martin Philip Gouch