Patents by Inventor Martin Sellen
Martin Sellen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8198888Abstract: In one embodiment, a method for determining the distance of a conducting surface profiled in a direction of distance determination from a functional surface moving relative to the profiled surface is disclosed. The method includes connecting inputs of a sensor to an oscillator arrangement. The sensor includes a first and a second measuring coil. The method includes further connecting outputs of the sensor to an analog-to-digital converter via a demodulator unit to obtain first and second digital measured values. The first and second digital measured values correspond to the distance between the profiled surface and the first and second measuring coil of the sensor, respectively. The method further includes connecting an arithmetic unit to the analog converter unit. The second measurement coil is arranged at a known distance from the first measuring coil on the side of the first measuring coil that faces away from the profiled surface.Type: GrantFiled: September 29, 2005Date of Patent: June 12, 2012Assignees: Siemens Aktiengesellschaft, Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Werner Grömmer, Felix Mednikov, Robert Schmid, Martin Sellen, Benno Weis
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Patent number: 7602175Abstract: A non-contacting position measuring system comprising a sensor that includes a measuring coil which can be energized with alternating current, where the measuring coil comprises at least two voltage taps, an electrically or magnetically conductive object to be measured which is assigned to the sensor, and an evaluation circuit, where the sensor and the object to be measured can be displaced relative to one another in a longitudinal direction of the measuring coil. The position-measuring system presented is formed in such a manner that the object to be measured comprises at least one marking affecting the impedance of the measuring coil between two voltage taps so that the evaluation circuit provides an output signal correlating with the position of the object to be measured in relation to the voltage taps.Type: GrantFiled: May 18, 2006Date of Patent: October 13, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Martin Sellen, Eduard Huber
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Publication number: 20090072820Abstract: A method and a system are disclosed for determining the distance between a conducting surface which is profiled in the direction of distance determination and a functional surface moving in relation to the surface by using a measuring system. Two exploring coils are applied to an oscillator system and are connected on the output end to an analog-to-digital converter via a demodulator, the analog-to-digital converter being connected to an arithmetic module. In at least one embodiment of the invention, a method and a system are provided which allow to effect a distance measurement substantially uninfluenced by the profile of the conducting surface and by variations in ambient temperature. For this purpose, a sensor is used whose second exploring coil is mounted on the first exploring coil facing away from the surface at a defined, known distance.Type: ApplicationFiled: September 29, 2005Publication date: March 19, 2009Inventors: Werner Grommer, Felix Mednikov, Robert Schmid, Martin Sellen, Benno Weis
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Patent number: 7345471Abstract: A device and method for detecting the position and velocity of a test object relative to a sensor, the sensor and the test object being arranged such that they can be displaced relative to one another. In one embodiment, the sensor has a measuring coil with one or more voltage tap(s) and has a target that is placed on the test object while being electromagnetically coupled to the measuring coil. An electronic component for adding the voltages tapped on the sensor is assigned to the sensor.Type: GrantFiled: March 21, 2007Date of Patent: March 18, 2008Assignee: Micro-Epsilon Messtechnik GmbH & Co.Inventors: Martin Sellen, Felix Mednikov, Mark Nechaewskij
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Publication number: 20080039867Abstract: The invention relates to a universal actuator platform for guiding end effectors, for example, cameras, surgical, or medical tools, or instruments etc. in minimally invasive interventions, in which each end effector is introduced into a body cavity at an entrance point with at least one interface, for connecting at least one kinematic device, with an end effector, to at least one drive mechanism for the kinematic device and to a drive controller.Type: ApplicationFiled: November 5, 2004Publication date: February 14, 2008Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO. KGInventors: Hubertus Feussner, Eduard Sammereier, Martin Sellen, Jürgen Michael Knapp, Robert Geiger, Ludwig Kirschenhofer
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Patent number: 7275015Abstract: A method and a device for determining motion parameters of a conductive, profiled surface (22) relative to a sensor (3), with the sensor (3) comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface (22) and the sensor (3), to a variation, which is determined by means of the coil (16). The position change is derived from the coupling impedance (Zc) of the coil (16), and the real component (Rc) and the imaginary component (Xc) of the complex coupling impedance (Zc) of the coil (16) are determined, with a distance d between the sensor (3) and the surface (22) being computed based on the determined values while using an algorithm as a basis.Type: GrantFiled: October 25, 2005Date of Patent: September 25, 2007Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Stanislav Medinkov, Mark Netchaewskij, Felix Mednikov, Werner Grömmer, Martin Sellen
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Publication number: 20070200558Abstract: A device and method for detecting the position and velocity of a test object relative to a sensor, the sensor and the test object being arranged such that they can be displaced relative to one another. In one embodiment, the sensor has a measuring coil with one or more voltage tap(s) and has a target that is placed on the test object while being electromagnetically coupled to the measuring coil. An electronic component for adding the voltages tapped on the sensor is assigned to the sensor.Type: ApplicationFiled: March 21, 2007Publication date: August 30, 2007Inventors: Martin Sellen, Felix Mednikov, Mark Nechaewskij
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Publication number: 20060202682Abstract: A non-contacting position measuring system comprising a sensor that includes a measuring coil which can be energized with alternating current, where the measuring coil comprises at least two voltage taps, an electrically or magnetically conductive object to be measured which is assigned to the sensor, and an evaluation circuit, where the sensor and the object to be measured can be displaced relative to one another in a longitudinal direction of the measuring coil. The position-measuring system presented is formed in such a manner that the object to be measured comprises at least one marking affecting the impedance of the measuring coil between two voltage taps so that the evaluation circuit provides an output signal correlating with the position of the object to be measured in relation to the voltage taps.Type: ApplicationFiled: May 18, 2006Publication date: September 14, 2006Inventors: Felix Mednikov, Martin Sellen, Eduard Huber
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Patent number: 7061230Abstract: A circuit for measuring distances and which has at least two inputs (1, 2), at least one measuring coil (3), and at least one signal source, wherein at least two input signals (epos, eneg) are generated by means of the signal source, and the inputs (1, 2) are activatable by means of the input signals (epos, eneg). The input signals (epos, eneg) are applied, preferably preprocessed, to the inputs of the measuring coil (3). The circuit is designed for use where little space is available for the circuit, with the input signals (epos, eneg) being applied to a preferably timed SC network, which generates a measuring output signal that is dependent on temperature. A corresponding method is also described.Type: GrantFiled: March 18, 2004Date of Patent: June 13, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Ulrich Kleine, Falk Roewer, Klaus Salzwedel, Felix Mednikov, Martin Sellen
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Publication number: 20060071658Abstract: A method and a device for determining motion parameters of a conductive, profiled surface (22) relative to a sensor (3), with the sensor (3) comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface (22) and the sensor (3), to a variation, which is determined by means of the coil (16). The position change is derived from the coupling impedance (Zc) of the coil (16), and the real component (Rc) and the imaginary component (Xc) of the complex coupling impedance (Zc) of the coil (16) are determined, with a distance d between the sensor (3) and the surface (22) being computed based on the determined values while using an algorithm as a basis.Type: ApplicationFiled: October 25, 2005Publication date: April 6, 2006Inventors: Stanislav Mednikov, Mark Netchaewskij, Felix Mednikov, Werner Grommer, Martin Sellen
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Patent number: 7012462Abstract: A circuit and method for demodulating at least one modulated signal (e), such as a measuring signal of a sensor. The circuit comprises at least one input (1), with the signal (e) being applied to the input (1), and the input is connected to at least one switched-capacitor network which is configured to demodulate the signal. The circuit permits use even in a small available space.Type: GrantFiled: August 27, 2003Date of Patent: March 14, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Ulrich Kleine, Falk Roewer, Klaus Salzwedel, Felix Mednikov, Martin Sellen
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Patent number: 6999892Abstract: A circuit arrangement (10) for activating a sensor and evaluating its signals, in particular for parametric sensors with complex impedances. The circuit arrangement comprises at least one sensor (2) for acquiring mechanical data. In order to minimize or largely prevent temperature caused disturbances in a constructionally simple layout, the measuring signal, the absolute temperature, and the gradient temperature of the sensor (2) are acquired simultaneously, preferably by means of a microprocessor or microcomputer (3). A corresponding method for activating sensors and evaluating their signals is also described.Type: GrantFiled: December 17, 2002Date of Patent: February 14, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Martin Sellen, Karl Wisspeintner
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Publication number: 20040201376Abstract: A circuit for measuring distances comprising at least two inputs (1, 2), at least one measuring coil (3), and at least one signal source, wherein at least two input signals (epos, eneg) are generated by means of the signal source, and the inputs (1, 2) are activatable by means of the input signals (epos, eneg) The input signals (epos, eneg) are applied, preferably preprocessed, to the inputs of the measuring coil (3). The circuit is designed for use where little space is available for the circuit, with the input signals (epos, eneg) being applied to a preferably timed SC network, which generates a measuring signal and/or an output signal that is dependent on temperature. A corresponding method is also described.Type: ApplicationFiled: March 18, 2004Publication date: October 14, 2004Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Ulrich Kleine, Falk Roewer, Klaus Salzwedel, Felix Mednikov, Martin Sellen
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Publication number: 20040071245Abstract: A circuit and method for demodulating at least one modulated signal (e), such as a measuring signal of a sensor. The circuit comprises at least one input (1), with the signal (e) being applied to the input (1), and the input is connected to at least one switched-capacitor network which is configured to demodulate the signal. The circuit permits use even in a small available space.Type: ApplicationFiled: August 27, 2003Publication date: April 15, 2004Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Ulrich Kleine, Falk Roewer, Klaus Salzwedel, Felix Mednikov, Martin Sellen
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Publication number: 20030130814Abstract: A circuit arrangement (10) for activating a sensor and evaluating its signals, in particular for parametric sensors with complex impedances. The circuit arrangement comprises at least one sensor (2) for acquiring mechanical data. In order to minimize or largely prevent temperature caused disturbances in a constructionally simple layout, the measuring signal, the absolute temperature, and the gradient temperature of the sensor (2) are acquired simultaneously, preferably by means of a microprocessor or microcomputer (3). A corresponding method for activating sensors and evaluating their signals is also described.Type: ApplicationFiled: December 17, 2002Publication date: July 10, 2003Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO. KGInventors: Felix Mednikov, Martin Sellen, Karl Wisspeintner
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Patent number: 6318153Abstract: A sensor (1) is proposed for noncontacting thickness gauging on films (2), in particular blown films, with a sensor head (3) and a mount (4) for the sensor head (3), which provides reliable measuring results despite transportation-caused movements of the film (2), and which is particularly suitable for a continuous quality control during the production process. In accordance with the invention, the sensor head (3) comprises at least one noncontacting sensor element for gauging the thickness in accordance with the physical properties of the film (2). Furthermore, the position of the sensor head (3) is adjustable such that the sensor head (3) is held during the entire measuring process at a predeterminable, at least largely constant distance from the film (2).Type: GrantFiled: March 26, 1999Date of Patent: November 20, 2001Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Martin Dumberger, Axel Seikowsky, Martin Sellen, Karl Wisspeintner
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Patent number: 5559431Abstract: To suppress and compensate influences of disturbance variables, a method of calibrating a sensor is disclosed, in which at most as many so-called influence variables influencing the measuring result are considered as measurable quantities are detected by the sensor, the set of the influence variables being composed of at least one disturbance variable influencing the measurement and at least one target quantity to be determined from the measurable quantities.Type: GrantFiled: October 7, 1994Date of Patent: September 24, 1996Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Martin Sellen