Abstract: A surface sensing device is mounted on an articulating probe head of a coordinate measuring machine. The device includes an elongate probe holder which is rotatable about an axis. An elongate sensing module includes a surface finish or surface roughness probe with a stylus tip. This is connected to the probe holder via an adjustable knuckle joint. To determine the geometry of the surface sensing device, including the tip normal and drag vector of the stylus tip, the orientations of the probe holder and the sensing module are determined by probing points which are spaced along their lengths, using a separate probe.

Abstract: A surface sensing device is mounted on an articulating probe head of a coordinate measuring machine. The device includes an elongate probe holder which is rotatable about an axis. An elongate sensing module includes a surface finish or surface roughness probe with a stylus tip. This is connected to the probe holder via an adjustable knuckle joint. To determine the geometry of the surface sensing device, including the tip normal and drag vector of the stylus tip, the orientations of the probe holder and the sensing module are determined by probing points which are spaced along their lengths, using a separate probe.

Abstract: A method of calibrating a contact probe having a deflectable stylus and configured to provide at least one signal which is indicative of the extent of deflection of the stylus, the contact probe being mounted on a coordinate positioning machine which facilitates reorientation of the contact probe about at least one axis. The method includes: taking measurement data obtained with the contact probe positioned at a plurality of different orientations about the at least one axis; and determining from the measurement data at least one gain variation model which models any apparent variation in the gain of the at least one probe signal dependent on the orientation of the contact probe about the at least one axis.

Abstract: A surface sensing device is mounted on an articulating probe head of a coordinate measuring machine. The device includes an elongate probe holder which is rotatable about an axis. An elongate sensing module includes a surface finish or surface roughness probe with a stylus tip. This is connected to the probe holder via an adjustable knuckle joint. To determine the geometry of the surface sensing device, including the tip normal and drag vector of the stylus tip, the orientations of the probe holder and the sensing module are determined by probing points which are spaced along their lengths, using a separate probe.

Abstract: A method of determining sub-divisional error of an encoder apparatus, which is configured to measure relative position of relatively moveable parts of an apparatus on which an inspection device for inspecting an artefact is mounted, includes causing the inspection device to inspect a feature so as to obtain measurements of a surface of the feature by relatively moving the relatively moveable parts of the apparatus. The method also includes using the measurements of the surface of the feature obtained by the inspection device during the inspection of the feature to determine the sub-divisional error of the encoder apparatus.

Abstract: A method of calibrating a contact probe having a deflectable stylus and configured to provide at least one signal which is indicative of the extent of deflection of the stylus, the contact probe being mounted on a coordinate positioning machine which facilitates reorientation of the contact probe about at least one axis. The method includes: taking measurement data obtained with the contact probe positioned at a plurality of different orientations about the at least one axis; and determining from the measurement data at least one gain variation model which models any apparent variation in the gain of the at least one probe signal dependent on the orientation of the contact probe about the at least one axis.

Abstract: A method of determining the sub-divisional error of an encoder apparatus that is configured to measure the position of relatively moveable parts of an apparatus on which an inspection device for inspecting an artefact is mounted. The method includes causing the inspection device to obtain measurements which includes relatively moving the relatively moveable parts of the apparatus, and using the measurements to determine the encoder apparatus' sub-divisional error.

Abstract: A method for measuring a surface profile using a surface sensing device mounted on an articulating probe head in which the probe head is moved along a nominal path relative to the surface profile, an at least approximation of the surface normal of the surface profile, the surface profile is sensed with the surface sensing device and the distance or force of the surface sensing device relative to the surface profile substantially in the direction of the surface normal. The surface normal may be determined by approximating at least one section to a curved profile which can be mathematically parameterised.

Abstract: A method for measuring a surface profile using a surface sensing device mounted on an articulating probe head in which the probe head is moved along a nominal path relative to the surface profile, an at least approximation of the surface normal of the surface profile, the surface profile is sensed with the surface sensing device and the distance or force of the surface sensing device relative to the surface profile substantially in the direction of the surface normal. The surface normal may be determined by approximating at least one section to a curved profile which can be mathematically parameterised.