Patents by Inventor Martin Zwicklowsky

Martin Zwicklowsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Display of a system state of a treatment device for microscopic samples
    Patent number: 8890709
    Abstract: The invention relates to a method of displaying a system state of an automatic treatment device, a corresponding display system which is configured for carrying out the method, and a treatment device equipped with the display system. At least one system parameter (121, 122, 123) is determined, the at least one determined (120) system parameter (121, 122, 123) is evaluated on the basis of evaluation criteria, the system state is evaluated on the basis of the at least one evaluated (130) system parameter (121, 122, 123), and the evaluated (140) system state is displayed by a traffic light function (175).
    Type: Grant
    Filed: November 15, 2010
    Date of Patent: November 18, 2014
    Assignee: Leica Instruments (Singapore) Pte. Ltd.
    Inventors: Michael Thiel, Hermann Ulbrich, Martin Zwicklowsky, Michael Erben, Michael Rapp, Stefan Künkel, Udo Herrmann
  • Display Of A System State Of A Treatment Device For Microscopic Samples
    Publication number: 20130141246
    Abstract: The invention relates to a method of displaying a system state of an automatic treatment device, a corresponding display system which is configured for carrying out the method, and a treatment device equipped with the display system. At least one system parameter (121, 122, 123) is determined, the at least one determined (120) system parameter (121, 122, 123) is evaluated on the basis of evaluation criteria, the system state is evaluated on the basis of the at least one evaluated (130) system parameter (121, 122, 123), and the evaluated (140) system state is displayed by a traffic light function (175).
    Type: Application
    Filed: November 15, 2010
    Publication date: June 6, 2013
    Applicant: Leica Instruments (Singapore) Pte. Ltd.
    Inventors: Michael Thiel, Hermann Ulbrich, Martin Zwicklowsky, Michael Erben, Michael Rapp, Stefan Künkel, Udo Herrmann