Abstract: There is provided a touch sensitive display comprising a passive substrate, an active substrate, and a display material disposed between the passive and active substrates, wherein driving circuitry for driving a pixel of the display and touch sensing circuitry are arranged on the active substrate. The touch sensing circuitry comprises at least one component with a first and a second electrode, wherein the electrodes are arranged to displace with respect to each other in response to a touch input.

Abstract: A mirror device (1) which can be simultaneously used for display purposes based on e.g. an LCD display (5) with a polarizing mirror (2) placed in front of it. The orientation direction of a retardation layer (31, 32) is aligned with respect to the polarization direction of the polarizing mirror to give optimal optical performance.

Abstract: TFTs (10) within a display device (1) are intentionally made sensitive to radiation from an external light source (12), for example by making a pin-hole (34) in the socalled black-matrix layer (33). The voltage across the pixel (8) or sensing this voltage drop just before refreshing the pixel content during 5 the next refresh cycle, it is possible to distinguish between an intentionally illuminated pixel (8) or pixel patterns (37, 38) and a non-illuminated pixel (8).

Abstract: The invention provides a tool to select reliable organic LED devices, where the risk for failure before the end of its lifetime is low. This tool comprises the steps of: i) subjecting the device to a high electric field over the electroluminescent layer. This leads to a division of the devices into two, clearly separated, populations, namely one population with a low leakage current (current through the electroluminescent layer in reverse voltage operation) and one population with a high leakage current. In this step, the first population is selected in accordance with a current criterion. ii) detecting instabilities in the leakage current, referred to as noise. It has been established that these instabilities arise in particular at reverse driving voltages between 1 and 10 Volts. These instabilities are a measure of the occurrence of early failures during operation. In this step, the devices are selected in accordance with a noise criterion.