Abstract: A semiconductor integrated circuit device includes: first and second transistors provided between a first power source and an output terminal; a step-down circuit that generates a second power source from the first power source; a power source switch circuit that outputs, as a fourth power source, a higher one of potentials of the second power source and a third power source; and a level shifter circuit that transits between the first power source and a fourth power source. The first transistor has a gate connected to an output of the level shifter circuit; the second transistor has a gate connected to the fourth power source.

Abstract: A level shift circuit includes first to fourth n-type transistors, first and second p-type transistors, and first and second inverters. The first n-type transistor receives an input signal at its gate and has a drain connected to an inverted output node. The first p-type transistor is placed between a third power supply and the inverted output node. The second n-type transistor receives an inverted input signal at its gate and has a drain connected to an output node. The second p-type transistor is placed between the third power supply and the output node. The third n-type transistor is between the inverted output node and an inverted input node, and the first inverter between the drain and gate of the third n-type transistor. The fourth n-type transistor is between the output node and an input node, and the second inverter between the drain and gate of the fourth n-type transistor.

Abstract: A semiconductor integrated circuit device includes: first and second transistors provided between a first power source and an output terminal; a step-down circuit that generates a second power source from the first power source; a power source switch circuit that outputs, as a fourth power source, a higher one of potentials of the second power source and a third power source; and a level shifter circuit that transits between the first power source and a fourth power source. The first transistor has a gate connected to an output of the level shifter circuit; the second transistor has a gate connected to the fourth power source.

Abstract: A level shift circuit includes first to fourth n-type transistors, first and second p-type transistors, and first and second inverters. The first n-type transistor receives an input signal at its gate and has a drain connected to an inverted output node. The first p-type transistor is placed between a third power supply and the inverted output node. The second n-type transistor receives an inverted input signal at its gate and has a drain connected to an output node. The second p-type transistor is placed between the third power supply and the output node. The third n-type transistor is between the inverted output node and an inverted input node, and the first inverter between the drain and gate of the third n-type transistor. The fourth n-type transistor is between the output node and an input node, and the second inverter between the drain and gate of the fourth n-type transistor.

Abstract: A semiconductor integrated circuit device includes: first and second transistors provided between a first power source and an output terminal; a step-down circuit that generates a second power source from the first power source; a power source switch circuit that outputs, as a fourth power source, a higher one of potentials of the second power source and a third power source; and a level shifter circuit that transits between the first power source and a fourth power source. The first transistor has a gate connected to an output of the level shifter circuit; the second transistor has a gate connected to the fourth power source.

Abstract: A semiconductor integrated circuit device includes: first and second transistors provided between a first power source and an output terminal; a step-down circuit that generates a second power source from the first power source; a power source switch circuit that outputs, as a fourth power source, a higher one of potentials of the second power source and a third power source; and a level shifter circuit that transits between the first power source and a fourth power source. The first transistor has a gate connected to an output of the level shifter circuit; the second transistor has a gate connected to the fourth power source.

Abstract: An output transistor (2) has a source connected to a VDD1 and a drain connected to an output terminal (1). A pre-driver (3) receives a signal varying in accordance with a data input signal (DIN), and provides a gate signal (SG1) to a gate of the output transistor (2), the gate signal (SG1) transiting between the VDD1 and a potential (VP) at a power source end (4). When a VDD2 is output from an output node (N1) and an assist signal (SA) makes a first transition corresponding to the transition of the gate signal (SG1) from HIGH to LOW, the drive assist circuit (20) performs an assist operation in which a potential of the output node (N1) is temporarily brought down from VDD2.

Abstract: An output transistor (2) has a source connected to a VDD1 and a drain connected to an output terminal (1). A pre-driver (3) receives a signal varying in accordance with a data input signal (DIN), and provides a gate signal (SG1) to a gate of the output transistor (2), the gate signal (SG1) transiting between the VDD1 and a potential (VP) at a power source end (4). When a VDD2 is output from an output node (N1) and an assist signal (SA) makes a first transition corresponding to the transition of the gate signal (SG1) from HIGH to LOW, the drive assist circuit (20) performs an assist operation in which a potential of the output node (N1) is temporarily brought down from VDD2.

Abstract: A semiconductor integrated circuit includes a power supply switch circuit which uses a PMOS transistor and an NMOS transistor to select a first power supply voltage applied to a first power supply input terminal or a second power supply voltage applied to a second power supply input terminal, and output the selected voltage as a power supply voltage to a third power supply output terminal, a first switch control circuit connected to the gate of the PMOS transistor, and a second switch control circuit connected to the gate of the NMOS transistor.

Abstract: A semiconductor integrated circuit includes a power supply switch circuit which uses a PMOS transistor and an NMOS transistor to select a first power supply voltage applied to a first power supply input terminal or a second power supply voltage applied to a second power supply input terminal, and output the selected voltage as a power supply voltage to a third power supply output terminal, a first switch control circuit connected to the gate of the PMOS transistor, and a second switch control circuit connected to the gate of the NMOS transistor.

Abstract: In a level shift circuit allows satisfactory operation with short delay time in the case of low-voltage setting of a low-voltage source, for example, when a state of an input signal IN transitions from a H (VDD) level to a L level, a node W2 precharged to a H (VDD3) level is discharged to ground (VSS) by a discharge circuit N2, and decreases in potential. The decrease in potential propagates to a latch circuit LA, and an output of the latch circuit LA propagates to an output circuit OC. Further, an inversion signal of the node W2 is input to the output circuit OC by bypassing the latch circuit LA. Thus, the output circuit OC starts operating prior to operation based on an output of the latch circuit LA.

Abstract: A semiconductor integrated circuit includes a level shift circuit which is located so that a second IO cell region is interposed between the level shift circuit and a first IO cell region, and converts a signal output from an IO cell of the first IO cell region into a signal having an amplitude of a second voltage and outputs the resultant signal, and an internal circuit which is operated using the signal having the amplitude of the second voltage output from the level shift circuit. A signal interconnect via which the signal output from the IO cell of the first IO cell region is input to the level shift circuit is provided between the IO cell of the first IO cell region and the level shift circuit, extending over or in an IO cell of the second IO cell region.

Abstract: A semiconductor integrated circuit includes a level shift circuit which is located so that a second IO cell region is interposed between the level shift circuit and a first IO cell region, and converts a signal output from an IO cell of the first IO cell region into a signal having an amplitude of a second voltage and outputs the resultant signal, and an internal circuit which is operated using the signal having the amplitude of the second voltage output from the level shift circuit. A signal interconnect via which the signal output from the IO cell of the first IO cell region is input to the level shift circuit is provided between the IO cell of the first IO cell region and the level shift circuit, extending over or in an IO cell of the second IO cell region.

Abstract: In a level shift circuit, the threshold voltage of N-type high-voltage transistors, to whose gates the voltage of a low-voltage supply VDD is applied, is set low. An input signal IN powered by the low-voltage supply VDD is input to the gate of an N-type transistor by way of an inverter. Therefore, even if the potentials at nodes W3 and W4 exceed the voltage of the low-voltage supply VDD, reverse current flow from the nodes W3 and W4 via parasitic diodes within the inverters into the low-voltage supply VDD is prevented. A protection circuit, composed of N-type transistor whose respective gates are fixed to the low-voltage supply VDD, is disposed between the two N-type high-voltage transistors N5, N6 and two N-type low-voltage transistors N1, N2 for receiving the complementary signals IN and XIN, thereby preventing the breakdown of those N-type complementary-signal-receiving transistors.

Abstract: In a level shift circuit, the threshold voltage of N-type high-voltage transistors, to whose gates the voltage of a low-voltage supply VDD is applied, is set low. An input signal IN powered by the low-voltage supply VDD is input to the gate of an N-type transistor by way of an inverter. Therefore, even if the potentials at nodes W3 and W4 exceed the voltage of the low-voltage supply VDD, reverse current flow from the nodes W3 and W4 via parasitic diodes within the inverters into the low-voltage supply VDD is prevented. A protection circuit, composed of N-type transistor whose respective gates are fixed to the low-voltage supply VDD, is disposed between the two N-type high-voltage transistors N5, N6 and two N-type low-voltage transistors N1, N2 for receiving the complementary signals IN and XIN, thereby preventing the breakdown of those N-type complementary-signal-receiving transistors.

Abstract: A semiconductor integrated circuit, including an input/output cell including signal terminals, wherein the signal terminal of the input/output cell is connected to an internal circuit via an interconnect wiring. The signal terminal of the I/O cell includes a plurality of (e.g., four) conductive layers. Each pair of adjacent ones of the plurality of conductive layers are connected together by a via. One of the plurality of conductive layers to which a via of the largest diameter is connected (e.g., the fourth conductive layer) is formed with a width such that only one of the largest-diameter via can be accommodated. Therefore, it is possible to suppress the migration of atoms from the interconnect wiring to the input terminal of the I/O cell, and to suppress the open failure of the via formed on the interconnect wiring.

Abstract: There is provided a power switching circuit capable of completely breaking a current in an OFF state of a switch connecting power sources even when a voltage difference is generated between the power sources of a plurality of functional blocks separated from each other on an LSI chip. A gate control circuit 1a has a control signal terminal INCNT, a first power imputer terminal IG11, and a second power supply terminal IG12 as input terminals and has a first output terminal OG11 and a second output terminal OG12 as output terminals. The gate of a second P-type transistor P2 is connected to the first output terminal OG11 of the gate control circuit 1a and the gate of a second P-type transistor P2 is connected to the second output terminal OG12 of the gate control circuit 1a, wherein the first P-type transistor P1 and the second P-type transistor P2 are connected in series between a first power source VDD1 and a second power source VDD2 to form a switch section.

Abstract: In a level shift circuit, the threshold voltage of N-type high-voltage transistors, to whose gates the voltage of a low-voltage supply VDD is applied, is set low. An input signal IN powered by the low-voltage supply VDD is input to the gate of an N-type transistor by way of an inverter. Therefore, even if the potentials at nodes W3 and W4 exceed the voltage of the low-voltage supply VDD, reverse current flow from the nodes W3 and W4 via parasitic diodes within the inverters into the low-voltage supply VDD is prevented. A protection circuit, composed of N-type transistor whose respective gates are fixed to the low-voltage supply VDD, is disposed between the two N-type high-voltage transistors N5, N6 and two N-type low-voltage transistors N1, N2 for receiving the complementary signals IN and XIN, thereby preventing the breakdown of those N-type complementary-signal-receiving transistors.

Abstract: There is provided a power switching circuit capable of completely breaking a current in an OFF state of a switch connecting power sources even when a voltage difference is generated between the power sources of a plurality of functional blocks separated from each other on an LSI chip. A gate control circuit 1a has a control signal terminal INCNT, a first power imputer terminal IG11, and a second power supply terminal IG12 as input terminals and has a first output terminal OG11 and a second output terminal OG12 as output terminals. The gate of a second P-type transistor P2 is connected to the first output terminal OG11 of the gate control circuit 1a and the gate of a second P-type transistor P2 is connected to the second output terminal OG12 of the gate control circuit 1a, wherein the first P-type transistor P1 and the second P-type transistor P2 are connected in series between a first power source VDD1 and a second power source VDD2 to form a switch section.

Abstract: In a level shift circuit, the threshold voltage of N-type high-voltage transistors, to whose gates the voltage of a low-voltage supply VDD is applied, is set low. An input signal IN powered by the low-voltage supply VDD is input to the gate of an N-type transistor by way of an inverter. Therefore, even if the potentials at nodes W3 and W4 exceed the voltage of the low-voltage supply VDD, reverse current flow from the nodes W3 and W4 via parasitic diodes within the inverters into the low-voltage supply VDD is prevented. A protection circuit, composed of N-type transistor whose respective gates are fixed to the low-voltage supply VDD, is disposed between the two N-type high-voltage transistors N5, N6 and two N-type low-voltage transistors N1, N2 for receiving the complementary signals IN and XIN, thereby preventing the breakdown of those N-type complementary-signal-receiving transistors.