Patents by Inventor Masahiro Yaguchi

Masahiro Yaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110003805
    Abstract: Provided is a combination drug. The present invention provides a pharmaceutical agent comprising (1) a HER2 inhibitor having a pyrrolopyrimidine skeleton or pyrazolopyrimidine skeleton, and (2) not less than one pharmaceutical agent selected from an mTOR inhibitor, a PI3 kinase inhibitor and a cMet inhibitor in combination.
    Type: Application
    Filed: March 2, 2009
    Publication date: January 6, 2011
    Applicant: TAKEDA PHARMACEUTICAL COMPANY LIMITED
    Inventors: Yoshikazu Ohta, Shinji Takagi, Masahiro Yaguchi
  • Patent number: 7692778
    Abstract: The invention is to provide a transfer/inspection apparatus capable of inspecting any defect even during transferring and to provide a transfer/inspection apparatus capable of inspecting any defect in a non-contact state during transferring, even if the an object to be transferred is a transparent material. The transfer/inspection apparatus includes a transfer apparatus 2, and a defect inspector 3. The transfer apparatus 2 transfers a thin member 5 in a non-contacted state under control of voltage to be applied to an electrode face, and the defect inspector inspects any defect of the thin member during transferring the thin member. The transfer apparatus 2 is preferably provided with a light beam-transmitting portion (omitted portion 15) at a part of the electrode face for allowing the light beam therethrough.
    Type: Grant
    Filed: August 27, 2004
    Date of Patent: April 6, 2010
    Assignee: Tsukuba Seiko Ltd.
    Inventors: Tamaya Ubukata, Fow-lai Poh, Masahiro Yaguchi
  • Publication number: 20070273875
    Abstract: The invention is to provide a transfer/inspection apparatus capable of inspecting any defect even during transferring and to provide a transfer/inspection apparatus capable of inspecting any defect in a non-contact state during transferring, even if the an object to be transferred is a transparent material. The transfer/inspection apparatus includes a transfer apparatus 2, and a defect inspector 3. The transfer apparatus 2 transfers a thin member 5 in a non-contacted state under control of voltage to be applied to an electrode face, and the defect inspector inspects any defect of the thin member during transferring the thin member. The transfer apparatus 2 is preferably provided with a light beam-transmitting portion (omitted portion 15) at a part of the electrode face for allowing the light beam therethrough.
    Type: Application
    Filed: August 27, 2004
    Publication date: November 29, 2007
    Applicant: TSUKUBA SEIKO LTD.
    Inventors: Tamaya Ubukata, Fow-lai Poh, Masahiro Yaguchi