Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.

Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.

Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.

Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.

Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.

Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.

Abstract: A three-dimensional curved surface shape measuring apparatus of the slit light rotating type. In accordance with a composite image .theta.(x', y') produced when a slit light is rotationally scanned with respect to a picture of an object to be measured and horizontal displacements x.sub.o and vertical displacement z.sub.o of an axis of rotation of the slit light with respect to an origin of a reference plane, a necessary computational processing is performed to determine a three-dimensional shape f(x, y) of the object surface which is free of distortion due to a perspective effect of a television camera.

Abstract: A three-dimensional curved surface shape measuring apparatus of the slit light linear scanning type. In accordance with a composite image u(x', y') produced by image composing means when a slit light is scanned over a surface of an object to be measured, a measured value or computed value u.sub.o (x', y') of a composite image with respect to a reference plane, a light projecting angle .theta. to the reference plane and a reference plane-television camera distance a, a necessary computational processing is performed to determine a three-dimensional curved surface shape f(x, y) of the surface of the object which is free of any distortions due to a perspective effect of the television camera.

Abstract: A method and apparatus for measuring a three-dimensional curved surface shape based on a new measuring principle that a surface of an object to be measured is coded with information relating to a slit light which is used as a medium and moved or rotated at a constant speed. The manner in which a linear reflected pattern of the slit light is moved over the surface of the object to be measured is picked up by a television camera to form a composite image in which a value of each of picture elements in the image is represented by information relating to the slit light, e.g., a position, time or projection angle of the slit light at an instant that the slit light passes through one of positions on the object surface corresponding to that picture element.

Abstract: An image composing apparatus adapted to produce a composite image in which a value of each of picture elements is represented by a maximum value or minimum value of the brightness of a video signal as well as a corresponding other signal at the instant of the maximum or minimum value. A composite image is formed in which a value of each of picture elements is represented by a count of synchronizing signals or an externally applied timing, position or angle indicative external input signal at an instant that the video signal attains the maximum value or the minimum value for each picture element.

Abstract: A method and apparatus adapted to measure a three-dimensional curved surface shape quantitatively with high speed. A pattern of interference fringes on a surface of an object to be measured is picked up so that while moving a reference plane (or the object to be measured) in the direction of an optical axis, the resulting video signal is processed to form a composite image in which a value of each of picture elements is represented by a position of the reference plane (or a position of the object to be measured) at an instant that one of positions on the object surface corresponding to that picture element in the image attains a maximum brightness. Then, a three-dimensional curved surface shape of the object to be measured is measured on the basis of the composite image.

Abstract: A distance between a distal end of a crack formed in a fatigue test piece on which a reference line is scribed, and the reference line, is monitored. The reference line and the crack are scanned with an ITV camera to prepare the fatigue test piece having the crack of a predetermined length. Luminance levels are integrated from a video signal obtained by scanning each raster in the same direction as that of the reference line to obtain a maximum luminance level, and the reference line position is detected from the maximum luminance level. At the same time, continuity of a high-level value is discriminated from the video signal, and a crack distal end position is detected from the discrimination result. A difference between both the detected positions is calculated, and the test piece is machined so that the difference corresponds to the predetermined length.