Patents by Inventor Masaki Hashimura

Masaki Hashimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7183136
    Abstract: A plurality of Group III nitride compound semiconductor layers are formed on a substrate for performing the formation of elements and the formation of electrodes. The Group III nitride compound semiconductor layers on parting lines are removed by etching or dicing due to a dicer so that only an electrode-forming layer on a side near the substrate remains or no Group III nitride compound semiconductor layer remains on the parting lines. A protective film is formed on the whole front surface. Separation grooves are formed in the front surface of the substrate by laser beam irradiation. The protective film is removed together with reaction products produced by the laser beam irradiation. The rear surface of the substrate 1s is polished to reduce the thickness of the substrate. Then, rear grooves corresponding to the latticed frame-shaped parting lines are formed in the rear surface of the substrate. The substrate is divided into individual elements along the parting lines.
    Type: Grant
    Filed: June 23, 2003
    Date of Patent: February 27, 2007
    Assignee: Toyoda Gosei Co., Ltd.
    Inventors: Masaki Hashimura, Shigeki Konishi, Naohisa Nagasaka
  • Patent number: 7157294
    Abstract: In a flip chip type Group III nitride compound semiconductor light-emitting element, a surface of a substrate serving as a light-emitting surface is formed as a rough surface so that radiated light is scattered by the surface.
    Type: Grant
    Filed: June 5, 2002
    Date of Patent: January 2, 2007
    Assignee: Toyoda Gosei Co., Ltd.
    Inventors: Toshiya Uemura, Masaki Hashimura
  • Patent number: 7121925
    Abstract: A method for dividing a semiconductor wafer into chips according to the present invention is a method for dividing a semiconductor wafer into a large number of semiconductor chips, the semiconductor wafer having a semiconductor layer formed on a substrate. A first method includes the step of forming a blast-resistant mask on a surface of the semiconductor wafer, the blast-resistant mask having a pattern for leaving a grid-like exposed portion as it is and the step of blasting a fine particular blast material to thereby form dividing grooves reaching a predetermined depth of the substrate in the grid-like exposed portion.
    Type: Grant
    Filed: March 14, 2001
    Date of Patent: October 17, 2006
    Assignee: Toyoda Gosei Co., Ltd.
    Inventors: Masaki Hashimura, Takao Sato, Koichi Ota
  • Patent number: 6960485
    Abstract: A process of forming separation grooves for separating a semiconductor wafer into individual light-emitting devices, a process for thinning the substrate, process for adhering the wafer to the adhesive sheet to expose a substrate surface on the reverse or backside of the wafer, a scribing process for forming split lines in the substrate for dividing the wafer into light-emitting devices, and a process of forming a mirror structure comprising a light transmission layer, a reflective layer, and a corrosion-resistant layer, which are laminated in sequence using sputtering or deposition processes. Because the light transmission layer is laminated on the adhesive sheet, gases normally volatilized from the adhesion materials are sealed and do not chemically combine with the metal being deposited as the reflective layer. As a result, reflectivity of the reflective layer can be maintained.
    Type: Grant
    Filed: February 28, 2003
    Date of Patent: November 1, 2005
    Assignee: Toyoda Gosei Co., Ltd.
    Inventors: Toshiya Uemura, Naohisa Nagasaka, Masaki Hashimura, Atsuo Hirano, Hiroshi Tadano, Tetsu Kachi, Hideki Hosokawa
  • Patent number: 6956245
    Abstract: A Group III nitride compound semiconductor light-emitting element has a reflecting surface on a side opposite to a main light-emitting surface of the element viewed from a light-emitting layer. The reflecting surface is inclined to surfaces of growth of semiconductor layers. Light emitted from the light-emitting layer is reflected by the reflecting surface, so that the reflected light emerges from side surfaces of the light-emitting element to the outside without passing through the semiconductor layers (particularly, the light-emitting layer).
    Type: Grant
    Filed: May 30, 2003
    Date of Patent: October 18, 2005
    Assignee: Toyoda Gosei Co., Ltd.
    Inventors: Masanobu Senda, Toshiya Uemura, Hideki Omoya, Masaki Hashimura
  • Publication number: 20050186760
    Abstract: A plurality of Group III nitride compound semiconductor layers are formed on a substrate for performing the formation of elements and the formation of electrodes. The Group III nitride compound semiconductor layers on parting lines are removed by etching or dicing due to a dicer so that only an electrode-forming layer on a side near the substrate remains or no Group III nitride compound semiconductor layer remains on the parting lines. A protective film is formed on the whole front surface. Separation grooves are formed in the front surface of the substrate by laser beam irradiation. The protective film is removed together with reaction products produced by the laser beam irradiation. The rear surface of the substrate 1s is polished to reduce the thickness of the substrate. Then, rear grooves corresponding to the latticed frame-shaped parting lines are formed in the rear surface of the substrate. The substrate is divided into individual elements along the parting lines.
    Type: Application
    Filed: June 23, 2003
    Publication date: August 25, 2005
    Applicant: Toyoda Gosei Co., Ltd.
    Inventors: Masaki Hashimura, Shigeki Konishi, Naohisa Nagasaka
  • Publication number: 20050133799
    Abstract: A process of forming separation grooves for separating a semiconductor wafer into individual light-emitting devices, a process for thinning the substrate, process for adhering the wafer to the adhesive sheet to expose a substrate surface on the reverse or backside of the wafer, a scribing process for forming split lines in the substrate for dividing the wafer into light-emitting devices, and a process of forming a mirror structure comprising a light transmission layer, a reflective layer, and a corrosion-resistant layer, which are laminated in sequence using sputtering or deposition processes. Because the light transmission layer is laminated on the adhesive sheet, gases normally volatilized from the adhesion materials are sealed and do not chemically combine with the metal being deposited as the reflective layer. As a result, reflectivity of the reflective layer can be maintained.
    Type: Application
    Filed: January 13, 2005
    Publication date: June 23, 2005
    Applicant: TOYODA GOSEI CO., LTD.
    Inventors: Toshiya Uemura, Naohisa Nagasaka, Masaki Hashimura, Atsuo Hirano, Hiroshi Tadano, Tetsu Kachi, Hideki Hosokawa
  • Publication number: 20050003632
    Abstract: A method for cutting a sapphire substrate whose A plane functions as a main surface is carried out after forming a semiconductor device or in order to form a device. Here a just A plane of the sapphire substrate is represented by a (11-20) plane, a line of intersection of the main surface and at least one of a (10-12) plane and a (0-112) plane is defined as a base line and a direction which an angle decreases as it reaches the axis c is defined as a positive direction. In that case, a separation line is formed along a first direction which makes an angle of 0 to 4 degrees with the line of intersection and a second direction which is perpendicular to the first direction.
    Type: Application
    Filed: July 12, 2002
    Publication date: January 6, 2005
    Inventors: Masaru Onishi, Masaki Hashimura
  • Publication number: 20030222259
    Abstract: A Group III nitride compound semiconductor light-emitting element has a reflecting surface on a side opposite to a main light-emitting surface of the element viewed from a light-emitting layer. The reflecting surface is inclined to surfaces of growth of semiconductor layers. Light emitted from the light-emitting layer is reflected by the reflecting surface, so that the reflected light emerges from side surfaces of the light-emitting element to the outside without passing through the semiconductor layers (particularly, the light-emitting layer).
    Type: Application
    Filed: May 30, 2003
    Publication date: December 4, 2003
    Applicant: TOYODA GOSEI CO., LTD.
    Inventors: Masanobu Senda, Toshiya Uemura, Hideki Omoya, Masaki Hashimura
  • Publication number: 20030151058
    Abstract: A process of forming separation grooves for separating a semiconductor wafer into individual light-emitting devices, a process for thinning the substrate, process for adhering the wafer to the adhesive sheet to expose a substrate surface on the reverse or backside of the wafer, a scribing process for forming split lines in the substrate for dividing the wafer into light-emitting devices, and a process of forming a mirror structure comprising a light transmission layer, a reflective layer, and a corrosion-resistant layer, which are laminated in sequence using sputtering or deposition processes. Because the light transmission layer is laminated on the adhesive sheet, gases normally volatilized from the adhesion materials are sealed and do not chemically combine with the metal being deposited as the reflective layer. As a result, reflectivity of the reflective layer can be maintained.
    Type: Application
    Filed: February 28, 2003
    Publication date: August 14, 2003
    Inventors: Toshiya Uemura, Naohisa Nagasaka, Masaki Hashimura, Atsuo Hirano, Hiroshi Tadano, Tetsu Kachi, Hideki Hosokawa
  • Publication number: 20030121511
    Abstract: A method for dividing a semiconductor wafer into chips according to the present invention is a method for dividing a semiconductor wafer into a large number of semiconductor chips, the semiconductor wafer having a semiconductor layer formed on a substrate. A first method includes the step of forming a blast-resistant mask on a surface of the semiconductor wafer, the blast-resistant mask having a pattern for leaving a grid-like exposed portion as it is and the step of blasting a fine particular blast material to thereby form dividing grooves reaching a predetermined depth of the substrate in the grid-like exposed portion.
    Type: Application
    Filed: September 30, 2002
    Publication date: July 3, 2003
    Inventors: Masaki Hashimura, Takao Sato, Koichi Ota
  • Publication number: 20020197764
    Abstract: In a flip chip type Group III nitride compound semiconductor light-emitting element, a surface of a substrate serving as a light-emitting surface is formed as a rough surface so that radiated light is scattered by the surface.
    Type: Application
    Filed: June 5, 2002
    Publication date: December 26, 2002
    Inventors: Toshiya Uemura, Masaki Hashimura
  • Publication number: 20010028062
    Abstract: A process of forming separation grooves for separating a semiconductor wafer into individual light-emitting devices, a process for thinning the substrate, process for adhering the wafer to the adhesive sheet to expose a substrate surface on the reverse or backside of the wafer, a scribing process for forming split lines in the substrate for dividing the wafer into light-emitting devices, and a process of forming a mirror structure comprising a light transmission layer, a reflective layer, and a corrosion-resistant layer, which are laminated in sequence using sputtering or deposition processes. Because the light transmission layer is laminated on the adhesive sheet, gases normally volatilized from the adhesion materials are sealed and do not chemically combine with the metal being deposited as the reflective layer. As a result, reflectivity of the reflective layer can be maintained.
    Type: Application
    Filed: March 29, 2001
    Publication date: October 11, 2001
    Inventors: Toshiya Uemura, Naohisa Nagasaka, Masaki Hashimura, Atsuo Hirano, Hiroshi Tadano, Tetsu Kachi, Hideki Hosokawa