Abstract: A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.

Abstract: A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.

Abstract: A method of inspecting a component using an image inspection controller that includes a processor communicatively coupled to a memory includes classifying each sample image in a first database as a first sample or a second sample using a classification module, extracting at least one class generic feature from each first sample to generate a plurality of class generic features, and extracting at least one class specific feature from each second sample to generate a plurality of class specific features. The method further includes combining the class generic features and the class specific features to generate a plurality of supplemental images. The method further includes storing the sample images and the supplemental images in a second database, classifying each sample image and each supplemental image, capturing at least one image of the component using a camera, and identifying at least one feature of the component in the at least one image of the component using the classification module.

Abstract: A method of inspecting a component using an image inspection controller that includes a processor communicatively coupled to a memory includes classifying each sample image in a first database as a first sample or a second sample using a classification module, extracting at least one class generic feature from each first sample to generate a plurality of class generic features, and extracting at least one class specific feature from each second sample to generate a plurality of class specific features. The method further includes combining the class generic features and the class specific features to generate a plurality of supplemental images. The method further includes storing the sample images and the supplemental images in a second database, classifying each sample image and each supplemental image, capturing at least one image of the component using a camera, and identifying at least one feature of the component in the at least one image of the component using the classification module.

Abstract: A cyber-security improvement platform database may store electronic records including information, received from remote submitting devices, associated with vulnerability data for computing elements. Information associated with first vulnerability data for a first computing element may be retrieved from the database and verified. Information about the first vulnerability data may then be recorded in a secure, distributed transaction ledger, and a crypto-currency payment may be transferred in connection with the recorded information. Similarly, the electronic records may further include fix data for computing elements. In this case, first fix data associated with the first vulnerability data may be retrieved, verified, and applied in connection with the first computing element. Additional information, about the first fix data, may then be recorded in the transaction ledger and an additional crypto-currency payment may be transferred in connection with the recorded additional information.

Abstract: A system for detecting an array of samples having detectable samples and at least one reference sample is provided. The system comprises an electromagnetic radiation source, a sensing surface comprising a plurality of sample fields, wherein the plurality of sample fields comprise at least one reference field, a phase difference generator configured to introduce differences in pathlengths of one or more samples in the array of samples, and an imaging spectrometer configured to image one or more samples in the array of samples.

Abstract: A modular method of manufacturing a waveguide is disclosed. The method includes positioning a mold insert including a plurality of mold prototypes, along at least one side wall of a molding equipment such that micro-optic structures of each mold prototype in the plurality of mold prototypes, faces a mold cavity. Each mold prototype extends along a length of the mold insert and the plurality of mold prototypes is disposed adjacent one another along a height of the mold insert. The method further includes feeding a material into the mold cavity for molding the material in the mold cavity to generate waveguide including a major surface having an optical pattern, where the optical pattern includes a plurality of elongated facets. Each of the plurality of elongated facets extends into the major surface and along a length of the waveguide. Further, the optical pattern extends along a height of the waveguide.

Abstract: Waveguides having improved illumination distribution and output luminance variation and lighting systems utilizing such waveguides are disclosed. The lighting systems generally include a light source which is optically coupled to a waveguide to distribute the light. The waveguides include one or more headlighting reduction regions and one or more output intensity shaping regions that work together to improve the distribution of light and reduce the effects of headlighting. The headlighting reduction regions may be integrated with the output intensity shaping region or may be an independent section.

Abstract: When a direction command signal indicates a first direction, a signal for causing the other end of the induction load to be connected to a second power supply unit is output as a second control signal. In addition, after a passage of a first predetermined delay time after a first current detection value becomes less than a reference value of a conducting current, a signal for causing the one end of the induction load 5 to be connected to a first power supply unit is output as a first control signal. And, after a passage of a second predetermined delay time after the first current detection value becomes equal to or greater than the reference value of the conducting current, a signal for causing the one end of the induction load to be connected to the second power supply unit is output as the first control signal.

Abstract: A system for detecting an array of samples having detectable samples and at least one reference sample is provided. The system comprises an electromagnetic radiation source, a sensing surface comprising a plurality of sample fields, wherein the plurality of sample fields comprise at least one reference field, a phase difference generator configured to introduce differences in pathlengths of one or more samples in the array of samples, and an imaging spectrometer configured to image one or more samples in the array of samples.

Abstract: In a stepping motor drive unit which drives a stepping motor including coils having a plurality of phases, and has functions of causing both ends of one of the coils having one of the plurality of phases to have high impedance to detect an inductive voltage in the coil, and determining a rotation/stop state of the stepping motor based on a result of the detection, the stepping motor drive unit has a function of temporarily stopping, while causing the both ends of the coil having the one of the plurality of phases to have high impedance, PWM driving of at least one of the other coils to fix an energized state of the coil.

Abstract: An optical sensing device is provided. The device comprises a cavity defined by at least an anomalous reflective element having an anomalous reflection surface, and a non-absorptive element having a non-absorptive reflection surface disposed in a direction away from the anomalous reflection surface.

Abstract: An optical detection system for sensing one or more samples is provided. The optical detection system comprises a broadband light source that emits a beam comprising a continuous spectrum over a range of wavelengths; a fluidic cell comprising one or more channels that positions the sample so that at least a portion of the beam is directed on the sample to produce a back reflected beam; and a spectrometer that analyzes an interference spectrum of the beam back reflected from the sample.

Abstract: A light collimating and diffusing film and a method for making the film are provided. The film includes a plastic layer having a first side and a second side opposite the first side and at least a first peripheral edge. The first side has a first textured surface, wherein between 7 to 20 percent of slope angles on the first textured surface proximate a first axis has a value between zero and five degrees. The first axis is substantially parallel to the first peripheral edge. The plastic layer collimates light propagating therethrough.

Abstract: In one embodiment a film can comprises a surface comprising a plurality of prism structures. Each prism structure has a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures. The plurality of prism structures can have a variation in the w direction of prism peak height that is discrete and/or continuous. In one embodiment, a method for making a film can comprise forming a plurality of prism structures on a surface. The plurality of prism structures can have a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures, and wherein the plurality of prism structures have a variation in the w direction of prism peak height that is discrete and/or continuous.

Abstract: In one embodiment a film can comprises a surface comprising a plurality of prism structures. Each prism structure has a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures. The plurality of prism structures can have a variation in the w direction of prism peak height that is discrete and/or continuous. In one embodiment, a method for making a film can comprise forming a plurality of prism structures on a surface. The plurality of prism structures can have a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures, and wherein the plurality of prism structures have a variation in the w direction of prism peak height that is discrete and/or continuous.

Abstract: In one embodiment a film can comprises a surface comprising a plurality of prism structures. Each prism structure has a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures. The plurality of prism structures can have a variation in the w direction of prism peak height that is discrete and/or continuous. In one embodiment, a method for making a film can comprise forming a plurality of prism structures on a surface. The plurality of prism structures can have a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures, and wherein the plurality of prism structures have a variation in the w direction of prism peak height that is discrete and/or continuous.

Abstract: There is provided an optical plate. The optical plate includes a supporting substrate and an optical diffuser film. The optical diffuser film has a density of light scattering particles to provide light diffusion. The optical diffuser film has a surface facing the supporting substrate, wherein a first portion of the surface facing the supporting substrate contacts the supporting substrate. There exists a gap between a second portion of the surface facing the supporting substrate and the supporting substrate, wherein the ratio of the area of the first portion to the second portion is less than 10%.

Abstract: There is provided an optical diffuser sheet. The optical diffuser sheet has a first surface and a second surface opposite to the first surface. The first surface has a plurality of optical structures arranged to diffuse and direct light illuminated onto the first surface. The optical diffuser sheet when illuminated is characterized by an absorption of less than 10% and an absolute hiding power of less than 10%.

Abstract: A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.