Patents by Inventor Masami Motoyama

Masami Motoyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ultraviolet light permeable filter for flaw detection light and method for detection of flaws
    Patent number: 6563126
    Abstract: An ultraviolet light permeable filter for an ultraviolet detection light is equipped on a filter glass surface with a dielectric multi-film layer which allows a visible radiation of wave length from 694 nm to 780 nm to reflect on the layer. The 694 nm to 780 nm wave length does not penetrate through the multi-film layer. When placed in an ultraviolet detection system, this filter prevents the occurrence of a reddish halation during inspection and display of a flaw detection light.
    Type: Grant
    Filed: January 18, 2002
    Date of Patent: May 13, 2003
    Assignee: Marktec Corporation
    Inventor: Masami Motoyama
  • Ultraviolet light permeable filter for flaw detection light and method for detection of flaws
    Publication number: 20030075694
    Abstract: An ultraviolet light permeable filter for an ultraviolet detection light is equipped on a filter glass surface with a dielectric multi-film layer which allows a visible radiation of wave length from 694 nm to 780 nm to reflect on the layer. The wave length also does not penetrate through the multi-flim layer. This filter prevents a reddish halation occurrence during an inspection display of a flaw detection light, which is the main cause of overlooking a scratch or flaw pattern.
    Type: Application
    Filed: January 18, 2002
    Publication date: April 24, 2003
    Applicant: Marktec Corporation
    Inventor: Masami Motoyama
  • Ultraviolet light permeable filter for flaw detection light, and method for detection of flaws
    Patent number: 6525315
    Abstract: An ultraviolet light permeable filter for an ultraviolet detection light is equipped on a filter glass surface with a dielectric multi-film layer which allows a visible radiation of wave length from 694 nm to 780 nm to reflect on the layer. The wave length also does not penetrate through the multi-flim layer. This filter prevents a reddish halation occurrence during an inspection display of a flaw detection light, which is the main cause of overlooking a scratch or flaw pattern.
    Type: Grant
    Filed: June 14, 2000
    Date of Patent: February 25, 2003
    Assignee: Marktec Corporation
    Inventor: Masami Motoyama