Abstract: A testing device control system capable of automatically detecting failures in the pallets for carrying products to be tested as well as failures in automatic testing devices along with the cables for connecting the pallets to the devices. A host computer is connected to a disc unit that contains for each testing device a plurality of testing item files, a detected testing device failure file, a detected pallet failure file and a testing device failure control file. For each testing device, a first defect item writing device writes to the disc unit the defect items of the product measured by a plurality of automatic testing devices. In addition, the number of the same defect items counted by the same automatic testing device is written to the disc unit. If the defect item count exceeds a predetermined value, failure information is written to the testing device failure control file and is displayed on a display unit.

Abstract: An automatic conveyance system comprises a buffer storage for storing a plurality of unit racks containing units; a plurality of test cells for testing the units contained in the unit racks; and a plurality of test cell controllers, each being provided in one of the test cells and each accepting an operator's requirement to take out a unit rack from the buffer storage, to store a unit rack into the buffer storage, or to convey a unit rack from one of the test cells to another one of the test cells. The system is provided with a plurality of automatic guided vehicles for conveying unit racks. A computer is connected to the test cell controllers by a single bus and has information on the unit racks stored in the buffer storage.