Abstract: A semiconductor element carrying apparatus for surely recovering semiconductor elements dropped in the environs of an electric driver. A lower base member is disposed under a carrying inlet, an inspecting part and a carrying outlet for semiconductor elements, such as semiconductor integrated circuit devices. On the lower base member, an electric driver cover covering an electric driver and a collector is disposed for collecting the semiconductor elements dropped. The semiconductor elements dropped on the electric driver cover are guided to the collector. The collector is equipped with a collector outlet, and a semiconductor collecting vessel is arranged under the collector outlet. Furthermore, an air blower blows compressed air along a slope from a nozzle to move dropped semiconductor devices.

Abstract: An SRAM disclosed herein includes 64 memory cell array blocks and a redundant memory cell array block. The redundant memory cell array includes a total of 16 redundant memory cell columns. A defect address indicating a location of a defective memory column is programmed in an address programming circuit, and the specific defecting column in the defect address is programmed in an I/O programming circuit. Although each memory cell does not include a spare memory cell column or row for redundancy, the defect can be repaired by using a redundant memory cell array, so that the high integration of the SRAM can be accomplished.