Abstract: There is provided a method of measuring a pupil distance, which includes locating an imaging device at a position a predetermined distance away from a member attached to eyeglasses worn by a subject. The member has two indicators. The method further includes photographing the subject while the subject observes an observing point in the vicinity of the imaging device, measuring an apparent distance E between left and right pupils on a photographed image, and obtaining an interpupillary distance PD in accordance with PD=[(A+B)×C×E]/(A×D) where “A” represents a distance between the member and the imaging device, “B” represents a distance between a center of rotation and the member, “C” represents an actual distance between the indicators, and “D” represents an apparent distance between the indicators.

Abstract: Magnifying binoculars configured for observing a magnified image of an object, includes a frame configured to be worn by a user, a pair of magnifying optical system units provided for left and right eyes of the user, respectively, each of the magnifying optical system units including a magnifying optical system for observing the magnified image of the object, and an optical path switching unit provided on an object side of each of the magnifying optical system units, the optical path switching unit including a movable mirror and a fixed mirror. The movable mirror is configured to be moved between an operating position on an optical path on the object side of the magnifying optical system unit and an evacuated position off the optical path. The fixed mirror is configured to deflect the optical path deflected by the movable mirror when the movable mirror is located on the operating position.

Abstract: Magnifying binoculars configured for observing a magnified image of an object, includes a frame configured to be worn by a user, a pair of magnifying optical system units provided for left and right eyes of the user, respectively, each of the magnifying optical system units including a magnifying optical system for observing the magnified image of the object, and an optical path switching unit provided on an object side of each of the magnifying optical system units, the optical path switching unit including a movable mirror and a fixed mirror. The movable mirror is configured to be moved between an operating position on an optical path on the object side of the magnifying optical system unit and an evacuated position off the optical path. The fixed mirror is configured to deflect the optical path deflected by the movable mirror when the movable mirror is located on the operating position.

Abstract: There is provided a method of measuring a pupil distance, which includes locating an imaging device at a position a predetermined distance away from a member attached to eyeglasses worn by a subject. The member has two indicators. The method further includes photographing the subject while the subject observes an observing point in the vicinity of the imaging device, measuring an apparent distance E between left and right pupils on a photographed image, and obtaining an interpupillary distance PD in accordance with PD=[(A+B)×C×E]/(A×D) where “A” represents a distance between the member and the imaging device, “B” represents a distance between a center of rotation and the member, “C” represents an actual distance between the indicators, and “D” represents an apparent distance between the indicators.

Abstract: In a semiconductor device, a plurality of linear semiconductors of a predetermined length, on which electronic element are formed, are aligned laterally and in parallel. A semiconductor assembly apparatus for assembling the semiconductor device, aligns the linear semiconductors in parallel via an arranging member. The linear semiconductors are interconnected by a connecting member in the semiconductor assembly apparatus.

Abstract: Magnification viewer includes a conventional glasses and a pair of magnifying lens units. The magnifying lens units are fixed to respective eyeglasses of the conventional glasses so that a wearer of the glasses can observe a magnified image of an object through the magnifying lens units. The magnifying lens unit includes an ocular and an objective lens that constitute a Galilean telescope. A prism is disposed between the ocular and the objective lens for deflecting the optical axis of the magnifying lens unit towards an object placed below the head of a wearer.

Abstract: Magnification viewer includes a conventional glasses and a pair of magnifying lens units. The magnifying lens units are fixed to respective eyeglasses of the conventional glasses so that a wearer of the glasses can observe a magnified image of an object through the magnifying lens units. The magnifying lens unit includes an ocular and an objective lens that constitute a Galilean telescope. A prism is disposed between the ocular and the objective lens for deflecting the optical axis of the magnifying lens unit towards an object placed below the head of a wearer.

Abstract: In a semiconductor device, a plurality of linear semiconductors of a predetermined length, on which electronic element are formed, are aligned laterally and in parallel. A semiconductor assembly apparatus for assembling the semiconductor device, aligns the linear semiconductors in parallel via an arranging member. The linear semiconductors are interconnected by a connecting member in the semiconductor assembly apparatus.

Abstract: In a semiconductor device, a plurality of linear semiconductors of a predetermined length, on which electronic element are formed, are aligned laterally and in parallel. A semiconductor assembly apparatus for assembling the semiconductor device, aligns the linear semiconductors in parallel via an arranging member. The linear semiconductors are interconnected by a connecting member in the semiconductor assembly apparatus.

Abstract: In a semiconductor device, a plurality of linear semiconductors of a predetermined length, on which electronic element are formed, are aligned laterally and in parallel. A semiconductor assembly apparatus for assembling the semiconductor device, aligns the linear semiconductors in parallel via an arranging member. The linear semiconductors are interconnected by a connecting member in the semiconductor assembly apparatus.

Abstract: A linear semiconductor material having a thin metal-oxide layer and a resist layer is conveyed at a constant speed by rotating rollers. An electron-beam drawing apparatus, in which micro-electron-guns are aligned circumferentially, is disposed between the rollers. The linear semiconductor material passes through a cylindrical hole of the electron-beam drawing apparatus such that a circuit pattern is formed on a surface of the linear semiconductor material by an electron beam. The linear semiconductor material is developed and etched, and divided into predetermined lengths. Thus a linear semiconductor is completed. A semiconductor device is manufactured by bundling a plurality of the linear semiconductors of predetermined length.

Abstract: In a semiconductor device, a plurality of linear semiconductors of a predetermined length, on which electronic element are formed, are aligned laterally and in parallel. A semiconductor assembly apparatus for assembling the semiconductor device, aligns the linear semiconductors in parallel via an arranging member. The linear semiconductors are interconnected by a connecting member in the semiconductor assembly apparatus.