Abstract: A radiation image reading device includes: a light scanning unit; a light detection unit. Each of a transmittance when the excitation light reflected from the surface of the recording medium is transmitted through the optical filter and a transmittance when the signal light emitted from the surface of the recording medium at an angle larger than a predetermined angle with respect to a direction perpendicular to the scan line within the detection surface is transmitted through the optical filter is smaller than a transmittance when the signal light emitted from the surface of the recording medium at an angle smaller than the predetermined angle with respect to a direction perpendicular to the scan line within the detection surface is transmitted through the optical filter.

Abstract: A radiation image reading device includes: a light scanning unit; a light detection unit. Each of a transmittance when the excitation light reflected from the surface of the recording medium is transmitted through the optical filter and a transmittance when the signal light emitted from the surface of the recording medium at an angle larger than a predetermined angle with respect to a direction perpendicular to the scan line within the detection surface is transmitted through the optical filter is smaller than a transmittance when the signal light emitted from the surface of the recording medium at an angle smaller than the predetermined angle with respect to a direction perpendicular to the scan line within the detection surface is transmitted through the optical filter.

Abstract: A radiation image reading device includes: a light scanning unit; a light detection unit. Each of a transmittance when the excitation light reflected from the surface of the recording medium is transmitted through the optical filter and a transmittance when the signal light emitted from the surface of the recording medium at an angle larger than a predetermined angle with respect to a direction perpendicular to the scan line within the detection surface is transmitted through the optical filter is smaller than a transmittance when the signal light emitted from the surface of the recording medium at an angle smaller than the predetermined angle with respect to a direction perpendicular to the scan line within the detection surface is transmitted through the optical filter.

Abstract: An optical sensor includes: a light emitting element 40; a lower substrate 20 on which the light emitting element 40 is provided; an upper substrate 10 provided so that the light emitting element 40 is positioned between the upper substrate 10 and the lower substrate 20; and an optical block 30 provided on the upper substrate 10. The upper substrate 10 includes a division-type photodiode SD. The optical block 30 is configured to reflect light emitted from the light emitting element 40 toward a measurement target R, and light reflected by the measurement target R is incident onto the division-type photodiode SD.

Abstract: An optical element includes an optical block through which object light is transmitted along a light transmission axis direction, a first wavelength selection filter provided on a first filter surface set such that a normal line forms an angle ? with the light transmission axis, and a second wavelength selection filter located on a rear side with respect to the first wavelength selection filter, and provided on a second filter surface set such that a normal line forms an angle ? with the light transmission axis, the second filter surface being in non-parallel, having an opposite inclination direction, and forming an angle 2? with the first filter surface. The optical block is constituted by combining an incidence-side block, a first filter block, a second filter block, and an emission-side block, formed of the same material and in the same shape.

Abstract: An optical element includes an optical block through which object light is transmitted along a light transmission axis direction, a first wavelength selection filter provided on a first filter surface set such that a normal line forms an angle ? with the light transmission axis, and a second wavelength selection filter located on a rear side with respect to the first wavelength selection filter, and provided on a second filter surface set such that a normal line forms an angle ? with the light transmission axis, the second filter surface being in non-parallel, having an opposite inclination direction, and forming an angle 2? with the first filter surface. The optical block is constituted by combining an incidence-side block, a first filter block, a second filter block, and an emission-side block, formed of the same material and in the same shape.

Abstract: An optical sensor includes: a light emitting element 40; a lower substrate 20 on which the light emitting element 40 is provided; an upper substrate 10 provided so that the light emitting element 40 is positioned between the upper substrate 10 and the lower substrate 20; and an optical block 30 provided on the upper substrate 10. The upper substrate 10 includes a division-type photodiode SD. The optical block 30 is configured to reflect light emitted from the light emitting element 40 toward a measurement target R, and light reflected by the measurement target R is incident onto the division-type photodiode SD.

Abstract: A spectroscopic sensor 1 comprises a plurality of interference filter units 20A, 20B, 20C, having a cavity layer 21 and first and second mirror layers 22, 23 opposing each other through the layer 21, for selectively transmitting therethrough light in a predetermined wavelength range according to an incident position thereof; a light-transmitting substrate 3, arranged on the first mirror layer 22 side, for transmitting therethrough the light incident on the units 20A, 20B, 20C; and a light detection substrate 4, arranged on the second mirror layer 23 side, for detecting the light transmitted through the units 20A, 20B, 20C. The second mirror layers 23 are separated for the respective units 20A, 20B, 20C. The cavity layer 21 is formed integrally over the units 20A, 20B, 20C, while a part of the layer 21 enters a region between the second mirror layers 23, 23 adjacent to each other.

Abstract: A method of manufacturing a spectroscopic sensor 1 comprises a first step of forming a cavity layer 21 by nanoimprinting on a handle substrate; a second step of forming a first mirror layer 22 on the cavity layer 21 after the first step; a third step of joining a light-transmitting substrate 3 onto the first mirror layer 22 after the second step; a fourth step of removing the handle substrate from the cavity layer 21 after the third step; a fifth step of forming a second mirror layer 23 on the cavity layer 21 without the handle substrate after the fourth step; and a sixth step of joining the light detection substrate 4 onto the second mirror layer 23 after the fifth step.

Abstract: A method of manufacturing a spectroscopic sensor 1 comprises a first step of forming a cavity layer 21 by nanoimprinting on a handle substrate; a second step of forming a first mirror layer 22 on the cavity layer 21 after the first step; a third step of joining a light-transmitting substrate 3 onto the first mirror layer 22 after the second step; a fourth step of removing the handle substrate from the cavity layer 21 after the third step; a fifth step of forming a second mirror layer 23 on the cavity layer 21 without the handle substrate after the fourth step; and a sixth step of joining the light detection substrate 4 onto the second mirror layer 23 after the fifth step.

Abstract: A spectroscopic sensor 1 comprises a plurality of interference filter units 20A, 20B, 20C, having a cavity layer 21 and first and second mirror layers 22, 23 opposing each other through the layer 21, for selectively transmitting therethrough light in a predetermined wavelength range according to an incident position thereof; a light-transmitting substrate 3, arranged on the first mirror layer 22 side, for transmitting therethrough the light incident on the units 20A, 20B, 20C; and a light detection substrate 4, arranged on the second mirror layer 23 side, for detecting the light transmitted through the units 20A, 20B, 20C. The second mirror layers 23 are separated for the respective units 20A, 20B, 20C. The cavity layer 21 is formed integrally over the units 20A, 20B, 20C, while a part of the layer 21 enters a region between the second mirror layers 23, 23 adjacent to each other.

Abstract: A fiber coupling device comprises fixing parts 1V, to which the respective ends of two optical fibers 5 and 6 are fixed, photonic crystal 2, disposed inside the light path of light that propagates across the abovementioned ends, and external force application means 3, which applies an external force to photonic crystal 2. When an external force is applied by external force application means 3 to photonic crystal 2 while light is being propagated inside one optical fiber 5, the photonic band gap of photonic crystal 2 changes and light of a wavelength that is in accordance with this photonic band gap is output from the other optical fiber 5.

Abstract: A fiber coupling device comprises fixing parts 1V, to which the respective ends of two optical fibers 5 and 6 are fixed, photonic crystal 2, disposed inside the light path of light that propagates across the abovementioned ends, and external force application means 3, which applies an external force to photonic crystal 2. When an external force is applied by external force application means 3 to photonic crystal 2 while light is being propagated inside one optical fiber 5, the photonic band gap-of photonic crystal 2 changes and light of a wavelength that is in accordance with this photonic band gap is output from the other optical fiber 5.