Patents by Inventor Masashi TATEDOKO

Masashi TATEDOKO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240095557
    Abstract: A data analysis apparatus (100) includes a group extracting unit (123) and an analysis executing unit (124). When a parameter is changed, by using summary information (121A), the group extracting unit (123) extracts a facility requiring recalculation of a degradation level from respective facilities corresponding to a plurality of degradation levels included in the summary information (121A). The analysis executing unit (124) recalculates a degradation level of the facility extracted by the group extracting unit (123) by using raw data of the extracted facility and the parameter after change.
    Type: Application
    Filed: November 29, 2023
    Publication date: March 21, 2024
    Applicant: Mitsubishi Electric Corporation
    Inventors: Yuki FUJII, Masashi TATEDOKO
  • Patent number: 11467565
    Abstract: An attack/abnormality detection device includes: a command extraction unit configured to extract elements having the same command destination as a command destination of an additionally received actual manufacturing command from among each of a set of normal manufacturing commands and a set of actual manufacturing commands, which contain information on a command destination and an arrival order, and are stored in a command storage region; and a detection unit configured to detect an attack or an abnormality by comparing details of the commands with each other for each arrival order of both extracted elements.
    Type: Grant
    Filed: January 25, 2017
    Date of Patent: October 11, 2022
    Assignee: Mitsubishi Electric Corporation
    Inventors: Masashi Tatedoko, Tsuyoshi Higuchi, Kiyoto Kawauchi, Takeshi Yoneda
  • Patent number: 11215975
    Abstract: An apparatus for identifying a path pattern of devices that produces a defective product in a production line where a product is produced via a plurality of device is provided. The device is configured to estimate a path pattern quality indicating a quality of a group of products produced through a production path included in a path pattern, based on a production path quality and an association relationship between a path pattern and a production path indicating devices via which the product is produced and an order of passing through the devices; and to identify a path pattern suspected to be defective based on the estimated path pattern quality.
    Type: Grant
    Filed: September 3, 2020
    Date of Patent: January 4, 2022
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Masashi Tatedoko, Tsuyoshi Higuchi, Kiyoto Kawauchi, Takeshi Yoneda
  • Publication number: 20210232686
    Abstract: Provided is an attack detection device including: an abnormality detection unit configured to detect, by acquiring an abnormality detection result which includes a facility ID, occurrence of an abnormality in a facility associated with the facility ID; a storage unit configured to store, as adjustment history data, data that associates the facility ID and an adjustment time; and an attack determination unit configured to determine that there is an attack on the facility associated with the facility ID, by obtaining an adjustment frequency of the facility from the adjustment history data which is stored in the storage unit, based on a result of detection by the abnormality detection unit, when the adjustment frequency exceeds an allowable number of times set in advance for the facility.
    Type: Application
    Filed: April 12, 2021
    Publication date: July 29, 2021
    Applicant: Mitsubishi Electric Corporation
    Inventors: Masashi TATEDOKO, Tsuyoshi HIGUCHI, Kiyoto KAWAUCHI, Takeshi YONEDA
  • Publication number: 20200401117
    Abstract: An apparatus for identifying a path pattern of devices that produces a defective product in a production line where a product is produced via a plurality of device is provided. The device is configured to estimate a path pattern quality indicating a quality of a group of products produced through a production path included in a path pattern, based on a production path quality and an association relationship between a path pattern and a production path indicating devices via which the product is produced and an order of passing through the devices; and to identify a path pattern suspected to be defective based on the estimated path pattern quality.
    Type: Application
    Filed: September 3, 2020
    Publication date: December 24, 2020
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Masashi TATEDOKO, Tsuyoshi HIGUCHI, Kiyoto KAWAUCHI, Takeshi YONEDA
  • Patent number: 10644986
    Abstract: A delegation state management unit makes a gateway device perform a verification test to verify whether a correct execution result is obtained in a case wherein a process being a delegation candidate is delegated to the gateway device and the process is executed by the gateway device. Further, the delegation state management unit obtains a result of the verification test from the gateway device, and decides whether to delegate execution of the process to the gateway device, based on the result of the verification test obtained.
    Type: Grant
    Filed: February 4, 2016
    Date of Patent: May 5, 2020
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventor: Masashi Tatedoko
  • Publication number: 20200073369
    Abstract: An attack/abnormality detection device includes: a command extraction unit configured to extract elements having the same command destination as a command destination of an additionally received actual manufacturing command from among each of a set of normal manufacturing commands and a set of actual manufacturing commands, which contain information on a command destination and an arrival order, and are stored in a command storage region; and a detection unit configured to detect an attack or an abnormality by comparing details of the commands with each other for each arrival order of both extracted elements.
    Type: Application
    Filed: January 25, 2017
    Publication date: March 5, 2020
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Masashi TATEDOKO, Tsuyoshi HIGUCHI, Kiyoto KAWAUCHI, Takeshi YONEDA
  • Publication number: 20180367437
    Abstract: A delegation state management unit makes a gateway device perform a verification test to verify whether a correct execution result is obtained in a case wherein a process being a delegation candidate is delegated to the gateway device and the process is executed by the gateway device. Further, the delegation state management unit obtains a result of the verification test from the gateway device, and decides whether to delegate execution of the process to the gateway device, based on the result of the verification test obtained.
    Type: Application
    Filed: February 4, 2016
    Publication date: December 20, 2018
    Applicant: Mitsubishi Electric Corporation
    Inventor: Masashi TATEDOKO