Patents by Inventor Masato Yoshizaki

Masato Yoshizaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9551691
    Abstract: An L-mode guided wave sensor 10 for inspecting an inspection target by using an L-mode guided wave. The L-mode guided wave sensor 10 is provided with a vibrator 3 which is attached to an inspection target 1, and a coil 5 which is wound around the vibrator 3 and to which an AC voltage is applied. The vibrator 3 is made of a ferromagnetic material.
    Type: Grant
    Filed: May 11, 2010
    Date of Patent: January 24, 2017
    Assignee: IHI INSPECTION AND INSTRUMENTATION CO., LTD.
    Inventors: Koki Daikoku, Masato Yoshizaki, Shuichi Sato
  • Patent number: 9068938
    Abstract: (A) first data for defect amount estimation for the guided wave of a first frequency is obtained, the data indicating a relationship among amplitude of the reflected wave, a defect cross-sectional area and a defect width. (B) second data for defect amount estimation for the guided wave of a second frequency is obtained, the data indicating a relationship among amplitude of the reflected wave, a defect cross-sectional area and a defect width. (C) a guided wave of the first frequency is generated, and amplitude of a reflected wave is detected as first amplitude. (D) a guided wave of the second frequency is generated, and amplitude of a reflected wave is detected as second amplitude. (E) on a basis of the first and second data and the first and second amplitude, a defect cross-sectional area and a defect width of the defect part are estimated.
    Type: Grant
    Filed: February 12, 2010
    Date of Patent: June 30, 2015
    Assignee: IHI Inspection and Instrumentation Co., Ltd.
    Inventors: Koki Daikoku, Masato Yoshizaki, Shuichi Sato
  • Patent number: 9038472
    Abstract: A testing method using a guided wave generates a guided wave to propagate through a subject as a testing target in a longitudinal direction of the subject, detects a reflected wave of the guided wave and examines the subject on the basis of the reflected wave. The testing method includes the steps of (A) obtaining data for defect amount estimation beforehand indicating a relationship between a defect amount of the subject and a magnitude of a reflected wave, (B) generating a guided wave so as to propagate through the subject, and detecting a reflected wave of the guided wave, and (C) estimating a defect amount of the subject on the basis of the data for defect amount estimation obtained at (A) and the magnitude of the guided wave detected at (B).
    Type: Grant
    Filed: February 12, 2010
    Date of Patent: May 26, 2015
    Assignee: IHI Inspection and Instrumentation Co., Ltd.
    Inventors: Koki Daikoku, Masato Yoshizaki, Shuichi Sato
  • Publication number: 20130036822
    Abstract: An L-mode guided wave sensor 10 for inspecting an inspection target by using an L-mode guided wave. The L-mode guided wave sensor 10 is provided with a vibrator 3 which is attached to an inspection target 1, and a coil 5 which is wound around the vibrator 3 and to which an AC voltage is applied. The vibrator 3 is made of a ferromagnetic material.
    Type: Application
    Filed: May 11, 2010
    Publication date: February 14, 2013
    Applicant: IHI INSPECTION AND INSTRUMENTATION CO., LTD.
    Inventors: Koki Daikoku, Masato Yoshizaki, Shuichi Sato
  • Publication number: 20120291552
    Abstract: (A) first data for defect amount estimation for the guided wave of a first frequency is obtained, the data indicating a relationship among amplitude of the reflected wave, a defect cross-sectional area and a defect width. (B) second data for defect amount estimation for the guided wave of a second frequency is obtained, the data indicating a relationship among amplitude of the reflected wave, a defect cross-sectional area and a defect width. (C) a guided wave of the first frequency is generated, and amplitude of a reflected wave is detected as first amplitude. (D) a guided wave of the second frequency is generated, and amplitude of a reflected wave is detected as second amplitude. (E) on a basis of the first and second data and the first and second amplitude, a defect cross-sectional area and a defect width of the defect part are estimated.
    Type: Application
    Filed: February 12, 2010
    Publication date: November 22, 2012
    Applicant: IHI INSPECTION AND INSTRUMENTATION CO., LTD.
    Inventors: Koki Daikoku, Masato Yoshizaki, Shuichi Sato
  • Publication number: 20120285247
    Abstract: A testing method using a guided wave generates a guided wave to propagate through a subject as a testing target in a longitudinal direction of the subject, detects a reflected wave of the guided wave and examines the subject on the basis of the reflected wave. The testing method includes the steps of (A) obtaining data for defect amount estimation beforehand indicating a relationship between a defect amount of the subject and a magnitude of a reflected wave, (B) generating a guided wave so as to propagate through the subject, and detecting a reflected wave of the guided wave, and (C) estimating a defect amount of the subject on the basis of the data for defect amount estimation obtained at (A) and the magnitude of the guided wave detected at (B).
    Type: Application
    Filed: February 12, 2010
    Publication date: November 15, 2012
    Applicant: IHI INSPECTION AND INSTRUMENTATION CO., LTD.
    Inventors: Koki Daikoku, Masato Yoshizaki, Shuichi Sato
  • Publication number: 20090105724
    Abstract: A medical apparatus for insertion into a body cavity which comprises an elastic linear body and delivers the distal tip to the predesignated object portion in a living organ, wherein the elastic linear body comprises a plurality of curved portions between the proximal end and the distal end, and at least one pair of adjacent curved portions are present on different planes which intersect each other. The apparatus can spontaneously control the direction thereof, and the distal tip can be delivered to the predesignated object portion in a living organ accurately and easily by pushing the apparatus into a body cavity.
    Type: Application
    Filed: August 14, 2006
    Publication date: April 23, 2009
    Inventors: Masato Yoshizaki, Takashi Kawabata