Abstract: An electronic camera includes an imager. An imager repeatedly outputs a scene image generated on an imaging surface capturing a scene. A searcher repeatedly executes a process of searching for a specific object image from the scene image outputted from the imager by using a plurality of reference-use specific object images each of which has a posture different from others. A detector detects the number of specific objects existing in the object scene based on a searched result of the searcher. A determiner repeatedly determines based on the searched result of the searcher whether or not all of the specific objects equivalent to the number detected by the detector satisfy a posture condition. A recorder records the scene image outputted from the imager when a determined result of the determiner is updated from a negative result to a positive result.

Abstract: To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films formed by stacking a rhodium film and a nickel film successively. Via through-holes are formed in a polyimide film between interconnects and the metal films, and the interconnects are electrically connected to the metal films. A plane pattern of one of the metal films equipped with one probe and through-hole is obtained by turning a plane pattern of the other metal film equipped with the other probe and through-hole through a predetermined angle.

Abstract: An electronic camera includes an imager, having an imaging surface capturing a scene, which repeatedly outputs a scene image. An extractor extracts a specific reference image coincident with a partial image outputted from the imager corresponding to a predetermined area allocated to the imaging surface, from among a plurality of reference images. An adjuster executes a process of adjusting an exposure amount by emphasizing the predetermined area in parallel with the extraction process. An identifier identifies a color of an object equivalent to the partial image, corresponding to extracting the specific reference image. A corrector executes a process of correcting a tonality of the scene image with reference to the identified result, in place of the extraction process. A searcher searches for a partial image coincident with the specific reference image from the scene image having the corrected tonality.

Abstract: An electronic camera includes an imager. An imager, having an imaging surface capturing a scene through a focus lens, repeatedly outputs a scene image. An extractor checks the scene image outputted from the imager with each of a plurality of characteristic patterns so as to extract a specific characteristic pattern satisfying a predetermined condition. A restrictor restricts behavior of adjusting a distance from the focus lens to the imaging surface in association with an extraction process of the extractor. A creator creates a reference image based on the scene image outputted from the imager corresponding to the extraction of the specific characteristic pattern. A register registers the specific characteristic pattern as a characteristic pattern used for searching for an image coincident with the reference image created by the creator.

Abstract: An electronic camera includes an imager. An imager, having an imaging surface capturing a scene, repeatedly outputs a scene image. An extractor checks the scene image outputted from the imager with each of a plurality of characteristic patterns so as to extract one or at least two characteristic patterns in each of which a checking degree exceeds a reference. A creator creates a reference image based on the scene image outputted from the imager corresponding to the first extraction by the extractor. A selector selects a characteristic pattern used for searching for an image coincident with the reference image created by the creator, from among one or at least two characteristic patterns extracted by the extractor.

Abstract: To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films formed by stacking a rhodium film and a nickel film successively. Via through-holes are formed in a polyimide film between interconnects and the metal films, and the interconnects are electrically connected to the metal films. A plane pattern of one of the metal films equipped with one probe and through-hole is obtained by turning a plane pattern of the other metal film equipped with the other probe and through-hole through a predetermined angle.

Abstract: An electronic camera includes an imager. An imager, having an imaging surface capturing a scene, repeatedly generates a scene image. A first searcher searches for a partial image having a specific pattern from the scene image generated by the imager. An adjuster adjusts an imaging condition by noticing an object which is equivalent to the partial image discovered by the first searcher. A second searcher searches for the partial image having the specific pattern from the scene image generated by the imager after an adjusting process of the adjuster is completed. A first recorder records the scene image corresponding to the partial image discovered by the second searcher out of the scene image generated by the imager.

Abstract: An image processing apparatus includes a fetcher. A fetcher fetches an object scene image. A first adjuster adjusts a tonality of the object scene image fetched by the fetcher, corresponding to a property of a display device. An object scene image outputter outputs the object scene image having the tonality adjusted by the first adjuster, toward the display device. A second adjuster adjusts the tonality of the object scene image fetched by the fetcher, in parallel with the adjusting process of the first adjuster. A first searcher searches for an object image that coincides with a registered object image from the object scene image having the tonality adjusted by the second adjuster.

Abstract: To allow inspecting whether a security check of a planned outgoing email is finished in an outgoing email check system, a check data providing apparatus 2 of an outgoing email check system 100 stores check information distributed from a check information management apparatus 1, appends check data generated based on the check information to a header of a checked planned outgoing email, and transmits the email to an email transmitting apparatus 9. A check data inspecting apparatus 3 stores the check information distributed from the check information management apparatus 1, inspects the check data extracted from the planned outgoing email received from the email transmitting apparatus 9 based on the check information, determines that the transmission is permitted when the check data of the planned outgoing email matches the check information, and determines that the transmission is rejected when the check data does not match the check information.

Abstract: An object-image searching apparatus includes a fetcher. A fetcher repeatedly fetches an object scene image. A first searcher searches an object image that matches a registered object image from the object scene image fetched by the fetcher. An acceptor accepts a designating manipulation for designating the object image on the object scene image fetched by the fetcher. A second searcher searches a predetermined object image that matches the object image designated by the designating manipulation from among a plurality of predetermined object images. A definer defines, as the registered object image, the predetermined object image discovered by the second searcher.

Abstract: To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films formed by stacking a rhodium film and a nickel film successively. Via through-holes are formed in a polyimide film between interconnects and the metal films, and the interconnects are electrically connected to the metal films. A plane pattern of one of the metal films equipped with one probe and through-hole is obtained by turning a plane pattern of the other metal film equipped with the other probe and through-hole through a predetermined angle.

Abstract: To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films formed by stacking a rhodium film and a nickel film successively. Via through-holes are formed in a polyimide film between interconnects and the metal films, and the interconnects are electrically connected to the metal films. A plane pattern of one of the metal films equipped with one probe and through-hole is obtained by turning a plane pattern of the other metal film equipped with the other probe and through-hole through a predetermined angle.

Abstract: A probe is contacted to a test pad, without destroying the circuit formed in the chip at the time of a probe test. Therefore, a load jig, a pressing tool, an elastomer, an adhesion ring, and a plunger are made into one by fixation with a nut and a bolt. The elastic force of the spring installed between the spring retaining jig and the load jig acts so that the member used as these one may be depressed toward pad PD. The thrust transmitted from the spring in a plunger to a thin films sheet is used only for the extension of a thin films sheet.

Abstract: An email wrong transmission preventing apparatus calculates memory ratios of addresses of emails in a transmission log by a model expression in which the memory ratios decline over time, compiles the memory ratios of the emails for each destination to set weights, and records the weights in a user weight list. When receiving a planned outgoing email, the apparatus compares the weight of the destination of the planned outgoing email obtained by referring to the user weight list with a predetermined threshold and determines that the destination is “reliable” only if the weight is over the threshold. If even one of the destinations of the planned outgoing email is not “reliable”, the apparatus causes a sender terminal to display an address check screen to prompt address checking. When “checked” is inputted, the apparatus transfers the planned outgoing email to an email transmission server.

Abstract: A probe is contacted to a test pad, without destroying the circuit formed in the chip at the time of a probe test. Therefore, a load jig, a pressing tool, an elastomer, an adhesion ring, and a plunger are made into one by fixation with a nut and a bolt. The elastic force of the spring installed between the spring retaining jig and the load jig acts so that the member used as these one may be depressed toward pad PD. The thrust transmitted from the spring in a plunger to a thin films sheet is used only for the extension of a thin films sheet.

Abstract: As the thickness of the card holder for preventing warping of a multilayered wiring substrate 1 is increased, there occurs a problem that a thin film sheet 2 is buried in a card holder and secure contact between probes 7 and test pads cannot be realized. For its prevention, the thin film sheet 2 and a bonding ring 6 are bonded in a state where a tensile force is applied only to the central region IA of the thin film sheet 2, and a tensile force is not applied to an outer peripheral region OA. Then, the height of the bonding ring 6 defining the height up to the probe surface of the thin film sheet 2 is increased, thereby increasing the height up to the probe surface of the thin film sheet 2.

Abstract: An electronic camera includes an imaging device. The imaging device has an imaging surface capturing an object scene and repeatedly outputs an object scene image. An orientation of the imaging surface is repeatedly changed by a CPU corresponding to a group photograph mode under which a group of a plurality of faces is captured. The CPU detects a face image from the object scene image outputted from the imaging device in association with a changing process of the orientation of the imaging surface. Furthermore, the CPU decides an angle range within which the group of a plurality of faces is contained based on a detection result of the face image. In addition, the CPU combines the plurality of object scene images outputted from the imaging device so as to create a combined image corresponding to the decided angle range. The created combined image is recorded in a recording medium.

Abstract: As the thickness of the card holder for preventing warping of a multilayered wiring substrate 1 is increased, there occurs a problem that a thin film sheet 2 is buried in a card holder and secure contact between probes 7 and test pads cannot be realized. For its prevention, the thin film sheet 2 and a bonding ring 6 are bonded in a state where a tensile force is applied only to the central region IA of the thin film sheet 2, and a tensile force is not applied to an outer peripheral region OA. Then, the height of the bonding ring 6 defining the height up to the probe surface of the thin film sheet 2 is increased, thereby increasing the height up to the probe surface of the thin film sheet 2.

Abstract: By using a membrane probe formed by using a manufacturing technique for semiconductor integrated circuit devices, the yield of probing collectively performed on a plurality of chips is to be enhanced. A probe card is formed by using a plurality of pushers, each pusher being formed of a POGO pin insulator, POGO pins, an FPC connector, a membrane probe HMS, an impact easing sheet, an impact easing plate, a chip condenser YRS and so on, wherein one or two POGO pins press a plurality of metal films arranged like islands. One or more cuts are made into what matches the chip to be tested in the area of the membrane probe in a direction substantially parallel to the extending direction of wiring electrically connected to probes formed in the membrane probe.

Abstract: Electrical testing is to be performed on a semiconductor integrated circuit device which the test pads formed. To facilitate such testing, the method of manufacture of the semiconductor integrated circuit device employs a probe card which has two or more contact terminals which can contact two or more electrodes. This probe card includes, in opposition to a wiring substrate of the semiconductor integrated circuit device in which a first wiring is formed, a first sheet having two or more contact terminals to contact the two or more electrodes; a second wiring electrically connected to the two or more contact terminals and the first wiring; and first dummy wirings which are near the region of formation of the two or more contact terminals, are arranged to a non-forming region of the second wiring, and do not participate in signal transfer.