Abstract: A method of manufacturing a bonded substrate includes: preparing one or plurality of products to be bonded, each including a brazing material layer and a copper plate laminated on both main surfaces of a ceramic substrate, laminating, one or a plurality of products bonded and a pair of clamping members that clamp them while providing a mold releasing layer between each thereof, heating the one or the plurality of products while pressing the one or the plurality of products in the pair of clamping members to obtain the one or the plurality of bonded substrates in which the ceramic substrate and the copper plate are bonded with a bonding layer, and removing the mold releasing layer from the bonded substrate by dissolving a portion in contact with the mold releasing layer of the copper plate included in the bonded substrate by wet etching.

Abstract: In an apparatus, a gas containing CH4 and CO2 is supplied from a first supply unit to a synthetic gas production unit which generates a synthetic gas containing CO and H2 while heating a first catalytic structure; the synthetic gas is supplied to a gas production unit which generates a lower olefin-containing gas including propylene while heating a second catalytic structure; and a detection unit detects propylene discharged from the gas production unit. The first catalytic structure includes first supports having a porous structure and a first metal fine particle that is present in first channels of the first supports. The second catalyst structure includes second supports having a porous structure and a second metal fine particle in the second supports. The second supports have a second channels, a portion of which have an average inner diameter of 0.95 nm or less.

Abstract: A power supply control device is to be installed in a vehicle. The power supply control device controls power supply via a semiconductor switch and a fuse by turning the semiconductor switch ON or OFF. The semiconductor switch and the fuse are mounted on a circuit board. In the fuse, two long plate-shaped terminals are arranged in a row. The fusing portion and a part of the two terminals are covered with a housing having heat resistance. The two terminals are disposed in a current path of a current flowing through the semiconductor switch. The current flows through the fusing portion. If the temperature of the fusing portion exceeds a predetermined temperature, the fusing portion is fused.

Abstract: An X-ray inspecting apparatus capable of high-speed inspection of a prescribed inspection area of an object of inspection is provided. The X-ray inspecting apparatus includes: a scanning X-ray source for outputting X-ray; an X-ray detector driving unit on which a plurality of X-ray detectors are mounted, and capable of driving the plurality of X-ray detectors independently; and an image acquisition control mechanism controlling acquisition of image data by X-ray detector driving unit and X-ray detectors. A scanning X-ray source emits X-ray while moving the X-ray focal point of the X-ray source to each of X-ray emission originating positions set for each X-ray detector such that the X-ray passes through a prescribed inspection area of an object of inspection and enters each X-ray detector. Image pick-up by some of the X-ray detectors and movement of other X-ray detectors to an image pick-up position are executed in parallel and alternately.

Abstract: An X-ray inspection apparatus includes a scanning X-ray source for emitting an X-ray, an X-ray detector drive unit having a plurality of X-ray detectors mounted thereon and being capable of independently driving the plurality of X-ray detectors, and an image acquisition control mechanism for controlling the X-ray detector drive unit and acquisition of image data from the X-ray detectors. The scanning X-ray source emits an X-ray by moving an X-ray focal point position of the X-ray source to each of originating point positions of X-ray emission, which are set for the X-ray detectors such that X-rays are transmitted through a plurality of prescribed inspection areas of an inspection object and enter the X-ray detectors. Image pickup by the X-ray detector and movement of another X-ray detector are concurrently performed in an alternate manner. The image acquisition control mechanism acquires image data, and an operation unit reconstructs an image.

Abstract: An X-ray inspection apparatus includes an X-ray source, an X-ray detector, an X-ray detector drive unit, an image acquisition control mechanism for controlling driving of the X-ray detector by the X-ray detector drive unit and acquisition of image data from the X-ray detector, an inspection object drive mechanism for moving an inspection object, an X-ray source control mechanism, and an operation unit. The X-ray source control mechanism causes the X-ray source to output an X-ray based on an instruction from the operation unit. The image acquisition control mechanism moves the X-ray detector to a plurality of image pickup positions aligned in the Y direction based on an instruction from the operation unit. The inspection object drive mechanism moves the inspection object in the Y direction such that the X-ray detector can detect an X-ray transmitted through the inspection object at each image pickup position based on an instruction from the operation unit.

Abstract: An X-ray inspection apparatus includes an X-ray source, an X-ray detector, an image acquisition control mechanism for controlling acquisition of image data from the X-ray detector, an inspection object drive mechanism for moving an inspection object, an X-ray source control mechanism, and an operation unit. The X-ray source control mechanism causes the X-ray source to output X-rays from focal point positions aligned in the X direction, based on an instruction from the operation unit. The inspection object is divided into a plurality of partial areas. The image acquisition control mechanism acquires a partial image which is an image of an X-ray output from each focal point position and transmitted through each partial area. When acquisition of partial images for all the focal point positions is finished, the inspection object drive mechanism moves the inspection object in the Y direction based on an instruction from the operation unit.

Abstract: An X-ray inspection apparatus includes a scanning X-ray source for emitting an X-ray, an X-ray detector drive unit having a plurality of X-ray detectors mounted thereon and being capable of independently driving the plurality of X-ray detectors, and an image acquisition control mechanism for controlling the X-ray detector drive unit and acquisition of image data from the X-ray detectors. The scanning X-ray source emits an X-ray by moving an X-ray focal point position of the X-ray source to each of originating point positions of X-ray emission, which are set for the X-ray detectors such that X-rays are transmitted through a plurality of prescribed inspection areas of an inspection object and enter the X-ray detectors. Image pickup by the X-ray detector and movement of another X-ray detector are concurrently performed in an alternate manner. The image acquisition control mechanism acquires image data, and an operation unit reconstructs an image.

Abstract: The X-ray inspection apparatus and method realize high-speed defect analysis inspection. The processing executed by the X-ray inspection apparatus includes executing high-speed imaging, creating an inspection image by executing reconstruction processing, and performing automatic inspection. If the object has passed automatic inspection, the processing executed by the X-ray inspection apparatus includes displaying inspection results. If the object has failed automatic inspection, the processing executed by the X-ray inspection apparatus includes switching the imaging conditions and performing imaging for defect analysis, creating an image by executing reconstruction processing for defect analysis, and outputting the image for defect analysis.

Abstract: An X-ray inspecting apparatus capable of high-speed inspection of a prescribed inspection area of an object of inspection is provided. The X-ray inspecting apparatus includes: a scanning X-ray source for outputting X-ray; an X-ray detector driving unit on which a plurality of X-ray detectors are mounted, and capable of driving the plurality of X-ray detectors independently; and an image acquisition control mechanism controlling acquisition of image data by X-ray detector driving unit and X-ray detectors. A scanning X-ray source emits X-ray while moving the X-ray focal point of the X-ray source to each of X-ray emission originating positions set for each X-ray detector such that the X-ray passes through a prescribed inspection area of an object of inspection and enters each X-ray detector. Image pick-up by some of the X-ray detectors and movement of other X-ray detectors to an image pick-up position are executed in parallel and alternately.

Abstract: An X-ray examination apparatus includes a scanning X-ray source for outputting X-rays, a sensor base which is attached with a plurality of X-ray sensors and which rotates about a rotation axis, and an image acquiring control mechanism for controlling rotation angle of the sensor base and acquisition of image data from the X-ray sensors. With respect to each X-ray sensor, the scanning X-ray source moves the X-ray focal position of the X-ray source to each starting position of the X-ray emission set so that the X-ray transmits through a predetermined examination area of an examination target and enters each X-ray sensor, and emits the X-rays. The image control acquiring control mechanism acquires image data detected by the X-ray sensors, and a calculation unit reconstructs an image of the examination area based on the image data.

Abstract: An X-ray examination apparatus changes a position of each X-ray sensor by rotating a sensor base, and resets a starting position of X-ray emission that becomes a X-ray focal position so that the X-ray enters each X-ray sensor after the position thereof is changed. A scanning X-ray source deflects an electron beam to easily change the position where the electron beam impinges a target of the X-ray source to an arbitrary location. The irradiating position of the electron beam then can be easily moved according to an accumulated irradiation time on the target. Therefore, maintenance can be performed without interrupting the X-ray examination.

Abstract: An X-ray examination apparatus changes a position of each X-ray sensor by rotating a sensor base, and resets a starting position of X-ray emission that becomes a X-ray focal position so that the X-ray enters each X-ray sensor after the position thereof is changed. A scanning X-ray source deflects an electron beam to easily change the position where the electron beam impinges a target of the X-ray source to an arbitrary location. The irradiating position of the electron beam then can be easily moved according to an accumulated irradiation time on the target. Therefore, maintenance can be performed without interrupting the X-ray examination.

Abstract: An X-ray examination apparatus includes a scanning X-ray source for outputting X-rays, a sensor base which is attached with a plurality of X-ray sensors and which rotates about a rotation axis, and an image acquiring control mechanism for controlling rotation angle of the sensor base and acquisition of image data from the X-ray sensors. With respect to each X-ray sensor, the scanning X-ray source moves the X-ray focal position of the X-ray source to each starting position of the X-ray emission set so that the X-ray transmits through a predetermined examination area of an examination target and enters each X-ray sensor, and emits the X-rays. The image control acquiring control mechanism acquires image data detected by the X-ray sensors, and a calculation unit reconstructs an image of the examination area based on the image data.

Abstract: A system is formed with a controller that is connected to and is adapted to control devices. A tool is attachable to the controller and functions to create control program for specifying the device by an object name, to create correlation data for correlating the control program with device data on the device, and to download the correlation data to the controller.

Abstract: A neutralizing method and a neutralizing apparatus for effectively neutralizing an insulating member in a simple and efficient way are disclosed. A hard X-ray generating device radiates a hard X-ray on the obverse surface of the insulating member from the direction perpendicular to the obverse surface of the insulating member. The hard X-ray generating apparatus radiates a hard X-ray having the wavelength of not less than 0.05 ? but less than 1 ?. The hard X-ray ionizes the air on the obverse surface of the insulating member and neutralizes the charge on the obverse surface of the insulating member, while at the same time neutralizing the charge on the reverse surface of the insulating member by the X-ray transmitted through the insulating member.

Abstract: A system is formed with a controller connected to devices and a tool. The controller controls the devices by a control program which specifies the devices by their object names. Correlation data correlating their communication addresses, assigned memory address and device names are stored in an object database. Data are transmitted and received by referencing the correlation data to specify an access address from a device name used as a key. In the case of a reuse, only the addresses need to be updated without modifying the control program.

Abstract: A system is formed with a controller connected to devices and a tool. The controller controls the devices by a control program which specifies the devices by their object names. Correlation data correlating their communication addresses, assigned memory address and device names are stored in an object database. Data are transmitted and received by referencing the correlation data to specify an access address from a device name used as a key. In the case of a reuse, only the addresses need to be updated without modifying the control program.

Abstract: A controller contains an I/O memory and uses a device detecting service to detect a device connected to it through a network and to obtain its device identifying data. A memory map setting service sets a device data area on the I/O memory according to the obtained device identifying data for exchanging data with the connected device and produces a memory map correlating the device data area with a variable data area on the I/O memory correlated to the device. The controller also includes a cyclic service and a data transmission service. The cyclic service transmits and receives data to and from the device periodically in the data linking format according to the memory map and by using the device data area on the I/O memory. The data transmission service transmits the data between the variable data area and the device data area.

Abstract: A controller contains an I/O memory and uses a device detecting service to detect a device connected to it through a network and to obtain its device identifying data. A memory map setting service sets a device data area on the I/O memory according to the obtained device identifying data for exchanging data with the connected device and produces a memory map correlating the device data area with a variable data area on the I/O memory correlated to the device. The controller also includes a cyclic service and a data transmission service. The cyclic service transmits and receives data to and from the device periodically in the data linking format according to the memory map and by using the device data area on the I/O memory. The data transmission service transmits the data between the variable data area and the device data area.