Abstract: A memory device may include an array of addressable three-level cells, a coding circuit being input with three-bit strings and generating corresponding ternary strings based upon a code, and a program circuit being input with the ternary strings and storing them in respective pairs of three-level cells. The memory device also may include a read circuit reading stored ternary strings in the respective pairs of three-level cells, and a decoding circuit being input with the stored ternary strings and generating corresponding strings of three bits based upon the code.

Abstract: A memory device may include an array of addressable three-level cells, a coding circuit being input with three-bit strings and generating corresponding ternary strings based upon a code, and a program circuit being input with the ternary strings and storing them in respective pairs of three-level cells. The memory device also may include a read circuit reading stored ternary strings in the respective pairs of three-level cells, and a decoding circuit being input with the stored ternary strings and generating corresponding strings of three bits based upon the code.

Abstract: A memory device has an array of memory cells. A column decoder is configured to address the memory cells. A charge-pump supply circuit generates a boosted supply voltage for the column decoder. A connecting stage is arranged between the supply circuit and the column decoder. The connecting stage switches between a high-impedance state and a low-impedance state, and is configured to switch into the high-impedance state in given operating conditions of the memory device, in particular during a reading step.

Abstract: A memory device has an array of memory cells. A column decoder is configured to address the memory cells. A charge-pump supply circuit generates a boosted supply voltage for the column decoder. A connecting stage is arranged between the supply circuit and the column decoder. The connecting stage switches between a high-impedance state and a low-impedance state, and is configured to switch into the high-impedance state in given operating conditions of the memory device, in particular during a reading step.

Abstract: A device for timing random reading of a memory device with a data access time, in which reading is performed by a succession of consecutive operations, the timing device being designed to generate, for each operation, a corresponding timing signal such as to cause, whatever the operating condition of the memory device, the corresponding operation to last for a time equal to a respective fixed duration, which is determined so as to guarantee completion of the operation in the worst operating condition of the memory device within the fixed duration; the sum of the fixed durations being equal to the data access time of the memory device.

Abstract: A non-volatile memory device suitable to be programmed in a sequential mode. The device includes a plurality of blocks of memory cells each one for storing a word, each block being identified by an address. An input circuit for loading an input address at the beginning of a programming procedure and an internal circuit for setting an internal address to the input address. The device further includes a data input circuit for loading a predetermined number of input words in succession, and a latch circuit for latching a page consisting of the predetermined number of input words. The memory then executes a programming operation including writing the page in the blocks identified by consecutive addresses starting from the internal address, and increments the internal address of the predetermined number in response to the completion of the programming operation.

Abstract: A non-volatile memory device suitable to be programmed in a sequential mode. The device includes a plurality of blocks of memory cells each one for storing a word, each block being identified by an address. An input circuit for loading an input address at the beginning of a programming procedure and an internal circuit for setting an internal address to the input address. The device further includes a data input circuit for loading a predetermined number of input words in succession, and a latch circuit for latching a page consisting of the predetermined number of input words. The memory then executes a programming operation including writing the page in the blocks identified by consecutive addresses starting from the internal address, and increments the internal address of the predetermined number in response to the completion of the programming operation.

Abstract: A device for timing random reading of a memory device with a data access time, in which reading is performed by a succession of consecutive operations, the timing device being designed to generate, for each operation, a corresponding timing signal such as to cause, whatever the operating condition of the memory device, the corresponding operation to last for a time equal to a respective fixed duration, which is determined so as to guarantee completion of the operation in the worst operating condition of the memory device within the fixed duration; the sum of the fixed durations being equal to the data access time of the memory device.