Abstract: A method for inspecting an object made of plastic material and including at least one layer to be inspected, comprises the following steps: positioning the object in an inspection zone (Z); irradiating the inspection zone (Z) with electromagnetic radiation emitted by an emitter (2); detecting, with a 5 sensor (3), an absorption of the electromagnetic radiation by the layer to be inspected and accordingly generating an absorption signal (301) representing the absorption of the electromagnetic radiation by the layer to be inspected; processing the absorption signal (301) in a control unit (6) and generating inspection data accordingly. The electromagnetic radiation 10 includes X-rays.

Abstract: A method for inspecting an incision made on a lateral surface of a plastic cap includes the following steps: conveying the plastic cap along an inspection path through an inspection zone in which the cap is inspected; emitting a polarized light collimated along a light orientation towards the inspection zone; capturing image data representing at least one image of the lateral surface of the cap through an optical sensor; receiving the image data in a control unit; processing the image data to derive information about the incision.

Abstract: A compression moulding machine comprises: an extrusion unit configured to extrude a rod of pasty polymeric material; a cutting element, configured to portion the rod into individual charges; a rotary carousel, including a plurality of moulds, each mould being configured to receive a respective charge and to form a corresponding object from the charge; a feeder, configured to convey each charge to a respective mould at a feed position; an inspecting device, configured to capture inspection data, representing a composition of the rod or of the charges.

Abstract: An apparatus (1) for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall (A) and a side wall (B) which is inclined relative to the base wall (A), comprises: an inspection zone (10) in which the object can be placed for inspection; a conveyor (12) for feeding the object to the inspection zone (10) along a feed plane (P); an imaging device (14) configured to view the object positioned in the inspection zone (10) and to generate an image (143) of the object; a processor (151), configured to process the image (143), to inspect the second layer. The conveyor (12) is configured to dispose the object in the inspection zone (10) with the base wall (A) positioned according to a predetermined orientation relative to the feed plane (P).

Abstract: An apparatus (1) for optical inspection of objects (2), in particular metal lids, comprises: a camera (6) oriented according to a vertical viewing axis (7) to see the object (2) to be inspected positioned in an inspection station (4) and to capture an image of the object (2); a first illuminator (10) irradiating grazing light at a first frequency a second illuminator (11) irradiating top-down light at a second frequency different from the first frequency; a third illuminator (12) irradiating diffused light at a third frequency different from the first and second frequencies; a processor connected to the camera (6) for processing the captured image and deriving a first, a second and a third filtered image corresponding to the illumination contributions of the first, second and third illuminators (10, 11, 12), respectively and separately.

Abstract: An apparatus (1) for optical inspection of objects (2), in particular metal lids, comprises: a camera (6) oriented according to a vertical viewing axis (7) to see the object (2) to be inspected positioned in an inspection station (4) and to capture an image of the object (2); a first illuminator (10) irradiating grazing light at a first frequency a second illuminator (11) irradiating top-down light at a second frequency different from the first frequency; a third illuminator (12) irradiating diffused light at a third frequency different from the first and second frequencies; a processor connected to the camera (6) for processing the captured image and deriving a first, a second and a third filtered image corresponding to the illumination contributions of the first, second and third illuminators (10, 11, 12), respectively and separately.

Abstract: An apparatus for detecting defects of elements to be subjected to examination, particularly metallic lids, with means for lighting an element to be subjected to examination, an image acquisition unit, and a unit for processing images acquired by said image acquisition unit is described.

Abstract: The present invention relates to an Apparatus for inspection of concave elements, for detection of contaminations and/or defects, comprising means for lighting a concave element to be subjected to inspection, an image detection unit, such as a camera or like, an optic group and means for processing images acquired by said image detection unit, in order to individuate said contaminations and/or said defects of said concave element, characterized in that said lighting means comprise a first light source, suitable to generate a diffused lighting direct on the concave surface, and a second light source, suitable to generate a grazing lighting directed on the outer lateral surface of said concave element, and in that said optic group is placed so as to detect light emitted by concave surface and transmitting the same to said image detection unit.

Abstract: An apparatus for detecting defects of elements to be subjected to examination, particularly metallic lids, with means for lighting an element to be subjected to examination, an image acquisition unit, and a unit for processing images acquired by said image acquisition unit is described.

Abstract: The present invention relates to an Apparatus for inspection of concave elements, for detection of contaminations and/or defects, comprising means for lighting a concave element to be subjected to inspection, an image detection unit, such as a camera or like, an optic group and means for processing images acquired by said image detection unit, in order to individuate said contaminations and/or said defects of said concave element, characterized in that said lighting means comprise a first light source, suitable to generate a diffused lighting direct on the concave surface, and a second light source, suitable to generate a grazing lighting directed on the outer lateral surface of said concave element, and in that said optic group is placed so as to detect light emitted by concave surface and transmitting the same to said image detection unit.