Patents by Inventor Mathias Wurzinger

Mathias Wurzinger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Filter arrangement
    Patent number: 10404040
    Abstract: The invention relates to a filter arrangement having a first busbar, a second busbar and a carrier element, on which at least one electrical filter component is arranged, which is electrically connected to the busbars, wherein the electrical connection of the at least one electrical filter component to at least one of these busbars is realized by mechanical clamping of the carrier element between the first and second busbar.
    Type: Grant
    Filed: December 14, 2017
    Date of Patent: September 3, 2019
    Assignee: InTiCa Systems AG
    Inventor: Mathias Wurzinger
  • Filter Arrangement
    Publication number: 20180198261
    Abstract: The invention relates to a filter arrangement having a first busbar, a second busbar and a carrier element, on which at least one electrical filter component is arranged, which is electrically connected to the busbars, wherein the electrical connection of the at least one electrical filter component to at least one of these busbars is realized by mechanical clamping of the carrier element between the first and second busbar.
    Type: Application
    Filed: December 14, 2017
    Publication date: July 12, 2018
    Inventor: Mathias Wurzinger
  • Testing device with a contact for connecting to a contact of a semiconductor component
    Patent number: 6995582
    Abstract: A testing device for a semiconductor component including at least one first contact. The testing device contains at least one second contact for producing an electrical connection to the first contact. The second contact is immobile relative to the testing device.
    Type: Grant
    Filed: July 15, 2002
    Date of Patent: February 7, 2006
    Assignee: Infineon Technologies AG
    Inventors: Dieter Schweiger, Mathias Würzinger
  • Testing device for a semiconductor component
    Publication number: 20030006797
    Abstract: A testing device for a semiconductor component including at least one first contact. The testing device contains at least one second contact for producing an electrical connection to the first contact. The second contact is immobile relative to the testing device.
    Type: Application
    Filed: July 15, 2002
    Publication date: January 9, 2003
    Inventors: Dieter Schweiger, Mathias Wurzinger