Abstract: Systems and methods for use in tri-spot point spread function imaging are provided that include a phase mask. The phase mask includes three partitions that each include a subset of the total area that is asymmetrical to other partitions. Each partition includes a phase delay ramp aligned along a phase delay axis, and includes a gradient of phase delays. Each phase delay axis is oriented in a different direction with respect to each other. Included is a source that outputs an excitation beam into a sample containing at least one light emitter that emits a radiation pattern when illuminated. Included is at least one sensor arranged to capture at least one image of the radiation pattern and a phase mask positioned between the at least one emitter and the at least one sensor. The phase mask is configured to produce a tri-spot point spread function.

Abstract: Systems and methods for use in tri-spot point spread function imaging are provided that include a phase mask. The phase mask includes three partitions that each include a subset of the total area that is asymmetrical to other partitions. Each partition includes a phase delay ramp aligned along a phase delay axis, and includes a gradient of phase delays. Each phase delay axis is oriented in a different direction with respect to each other. Included is a source that outputs an excitation beam into a sample containing at least one light emitter that emits a radiation pattern when illuminated. Included is at least one sensor arranged to capture at least one image of the radiation pattern and a phase mask positioned between the at least one emitter and the at least one sensor. The phase mask is configured to produce a tri-spot point spread function.

Abstract: An apparatus includes a light splitter to receive a light beam and direct a first portion of the light beam to a reference arm and a second portion of the light beam to a sample arm. The sample arm includes a phase scrambler, in a path of the second portion of the light beam, to cause local-random-time varying phase modulation to the second portion of the light beam. The sample arm also includes a controller to change the local phase of the second portion of the light. The apparatus further includes a detector, in optical communication with the reference arm and the sample arm, to detect an interference pattern produced by the first portion of the light beam propagated through the reference arm and the second portion of the light beam scattered from the sample via the sample arm.

Abstract: Various aspects of the present disclosure are directed toward methods, systems, and apparatus that include an optical detection node to pass light through the optical pathway to the optical detection node where the light is detectable. At least one focusing element is provided to pass the light along the optical pathway, and at least one optical mask is used to provide spatially-varying modulation on the light passing along the optical pathway. The light passing along the optical pathway is redirected and modified to create a spiral point spread function at the optical detection node for estimating a distance to an object that is characterized at least in part by the light passing along the optical pathway.