Patents by Inventor Matthew O. Williams

Matthew O. Williams has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10928362
    Abstract: A method for nondestructive inspection of a component, the method includes determining a first pulse-echo scan from a first side of a component; determining a second pulse-echo scan from a second side of the component; determining a through-transmission scan based on the first pulse-echo scan, the second pulse-echo scan, and a model of the component, the model comprises a rigid internal structure of the component; and classifying the component based on comparing the through-transmission scan to a “gold” model.
    Type: Grant
    Filed: May 4, 2018
    Date of Patent: February 23, 2021
    Assignee: Raytheon Technologies Corporation
    Inventors: Alan Matthew Finn, Amit Surana, Matthew O. Williams, Edgar A. Bernal, Ozgur Erdinc
  • Patent number: 10488371
    Abstract: A method for nondestructive vibrothermography inspection of a component, the method includes generating ultrasonic excitations in a component over a range of frequencies; determining a thermal signature in the component from the excitations; registering a model with the thermal signature; determining damage based on the thermal signal and model; and classifying the component based on the determining.
    Type: Grant
    Filed: May 4, 2018
    Date of Patent: November 26, 2019
    Assignee: United Technologies Corporation
    Inventors: Alan Matthew Finn, Amit Surana, Matthew O. Williams, Edgar A. Bernal, Ozgur Erdinc
  • Publication number: 20190339235
    Abstract: A method for nondestructive vibrothermography inspection of a component, the method includes generating ultrasonic excitations in a component over a range of frequencies; determining a thermal signature in the component from the excitations; registering a model with the thermal signature; determining damage based on the thermal signal and model; and classifying the component based on the determining.
    Type: Application
    Filed: May 4, 2018
    Publication date: November 7, 2019
    Applicant: United Technologies Corporation
    Inventors: Alan Matthew Finn, Amit Surana, Matthew O. Williams, Edgar A. Bernal, Ozgur Erdinc
  • Publication number: 20190339234
    Abstract: A method for nondestructive inspection of a component, the method includes determining a first pulse-echo scan from a first side of a component; determining a second pulse-echo scan from a second side of the component; determining a through-transmission scan based on the, first pulse-echo scan, the second pulse-echo scan, and a model of the component, the model comprises a rigid internal structure of the component; and classifying the component based on comparing the through-transmission scan to a “gold” model.
    Type: Application
    Filed: May 4, 2018
    Publication date: November 7, 2019
    Applicant: United Technologies Corporation
    Inventors: Alan Matthew Finn, Amit Surana, Matthew O. Williams, Edgar A. Bernal, Ozgur Erdinc